Practical Electron Microscopy Of Lattice Defects PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Practical Electron Microscopy Of Lattice Defects PDF full book. Access full book title Practical Electron Microscopy Of Lattice Defects by Hiroyasu Saka. Download full books in PDF and EPUB format.
Author: Hiroyasu Saka
Publisher: World Scientific
ISBN: 981123471X
Category : Science
Languages : en
Pages : 309
Get Book Here
Book Description
'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Author: Hiroyasu Saka
Publisher: World Scientific
ISBN: 981123471X
Category : Science
Languages : en
Pages : 309
Get Book Here
Book Description
'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461344220
Category : Technology & Engineering
Languages : en
Pages : 598
Get Book Here
Book Description
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
Author: Ron H. Vernon
Publisher: Cambridge University Press
ISBN: 9780521891332
Category : Nature
Languages : en
Pages : 610
Get Book Here
Book Description
Rock microstructures provide clues for the interpretation of rock history. A good understanding of the physical or structural relationships of minerals and rocks is essential for making the most of more detailed chemical and isotopic analyses of minerals. Ron Vernon discusses the basic processes responsible for the wide variety of microstructures in igneous, sedimentary, metamorphic and deformed rocks, using high-quality colour illustrations. He discusses potential complications of interpretation, emphasizing pitfalls, and focussing on the latest techniques and approaches. Opaque minerals (sulphides and oxides) are referred to where appropriate. The comprehensive list of relevant references will be useful for advanced students wishing to delve more deeply into problems of rock microstructure. Senior undergraduate and graduate students of mineralogy, petrology and structural geology will find this book essential reading, and it will also be of interest to students of materials science.
Author:
Publisher: ASTM International
ISBN:
Category :
Languages : en
Pages : 242
Get Book Here
Book Description
Author: Audry M. Glauert
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 274
Get Book Here
Book Description
Author: Brent Fultz
Publisher: Springer Science & Business Media
ISBN: 3642297609
Category : Science
Languages : en
Pages : 775
Get Book Here
Book Description
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1216
Get Book Here
Book Description
Author: Alex Hubert
Publisher: Springer Science & Business Media
ISBN: 3540850546
Category : Science
Languages : en
Pages : 707
Get Book Here
Book Description
This book offers systematic and up-to-date treatment of the whole area of magnetic domains. It contains many contributions that have not been published before. The comprehensive survey of this important area gives a good introduction to students and is also interesting to researchers.
Author: National Research Council
Publisher: National Academies Press
ISBN: 0309045843
Category : Science
Languages : en
Pages : 97
Get Book Here
Book Description
The impact of catalysis on the nation's economy is evidenced by the fact that catalytic technologies generate U.S. sales in excess of $400 billion per year and a net positive balance of trade of $16 billion annually. This book outlines recent accomplishments in the science and technology of catalysis and summarizes important likely challenges and opportunities on the near horizon. It also presents recommendations for investment of financial and human resources by industry, academe, national laboratories, and relevant federal agencies if the nation is to maintain continuing leadership in this fieldâ€"one that is critical to the chemical and petroleum processing industries, essential for energy-efficient means for environmental protection, and vital for the production of a broad range of pharmaceuticals.
Author: U Valdre
Publisher: Elsevier
ISBN: 0323142567
Category : Science
Languages : en
Pages : 785
Get Book Here
Book Description
Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said conference is intended to the developments of electron optics and electron microscopy and its applications in material science. The book is divided into four parts. Part I discusses the impact of electron microscopy in the science of materials. Part II covers topics such as electron optics and instrumentation; geometric electron optics and its problems; and special electron microscope specimen stages. Part III explains the theory of electron diffraction image contrast and then elaborates on related areas such as the application of electron diffraction and of electron microscopy to radiation; computing methods; and problems in electron microscopy. Part IV includes topics such as the transfer of image information in the electron microscope; phase contrast microscopy; and the magnetic phase contrast. The text is recommended for electron microscopists who are interested in the application of their field in material science, as well as for experts in the field of material science and would like to know about the importance of electron microscopy.
