Picosecond Electrical Sampling with a Scanning Force Microscope PDF Download
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Author: Bettina Anne Nechay
Publisher:
ISBN:
Category :
Languages : en
Pages : 274
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Author: Bettina Anne Nechay
Publisher:
ISBN:
Category :
Languages : en
Pages : 274
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Book Description
Author: H.-J. Güntherodt
Publisher: Springer Science & Business Media
ISBN: 9401100497
Category : Science
Languages : en
Pages : 639
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Proceedings of the NATO Advanced Study Institute, Schluchsee, Germany, March 7--18, 1994
Author: Burkard Hillebrands
Publisher: Springer Science & Business Media
ISBN: 3540411917
Category : Science
Languages : en
Pages : 363
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Book Description
Introductory chapters help newcomers to understand the basic concepts, and the more advanced chapters give the current state of the art for most spin dynamic issues in the milliseconds to femtoseconds range. Emphasis is placed on both the discussion of the experimental techniques and on the theoretical work. The comprehensive presentation of these developments makes this volume very timely and valuable for every researcher working in the field of magnetism.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 45
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Book Description
A non-contact probe has been invented and developed for time resolved measurement of electrical waveforms with features as fast as one picosecond. The technique is based on atomic force microscopy modified for electrical sampling. Two generations of probe heads were designed, built, and tested. The fundamental limits of the system, including spatial, temporal, and voltage resolution, have been investigated. State of the art integrated circuits from Intel and National Semiconductor were tested with nanosecond resolution to show that the instrument has potential industrial application. U.S. Patents 5,381,101 and 5,488,305 were granted to Stanford University and licensed to industry. A GaAs nonlinear transmission line was monolithically integrated with a specially designed high speed cantilever and used to probe transients less than one picosecond in duration. Harmonic mixing frequencies as high as 333 GHz were measured.
Author:
Publisher:
ISBN:
Category : Probes (Electronic instruments)
Languages : en
Pages : 232
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Author: Mehdi Vaez-Iravani
Publisher:
ISBN:
Category : Probes (Electronic instruments)
Languages : en
Pages : 228
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Author: Selahattin Sayil
Publisher: Springer
ISBN: 3319696734
Category : Technology & Engineering
Languages : en
Pages : 92
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Book Description
This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.
Author: Massachusetts Institute of Technology. Research Laboratory of Electronics
Publisher:
ISBN:
Category : Electronics
Languages : en
Pages : 540
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Author: Abdolreza Karbassi
Publisher:
ISBN:
Category :
Languages : en
Pages : 166
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Author: David Aaron Botkin
Publisher:
ISBN:
Category :
Languages : en
Pages : 320
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Book Description
