Author: Paul H. Shelley
Publisher:
ISBN:
Category : Reflectometer
Languages : en
Pages : 410
Book Description
Optical Low Coherence Reflectometry for Process Analysis
Author: Paul H. Shelley
Publisher:
ISBN:
Category : Reflectometer
Languages : en
Pages : 410
Book Description
Publisher:
ISBN:
Category : Reflectometer
Languages : en
Pages : 410
Book Description
Optic Low Coherence Reflectometry as a Non-invasive Imaging Process
Author: David Forrestall
Publisher:
ISBN:
Category : Coherence (Optics)
Languages : en
Pages : 112
Book Description
Publisher:
ISBN:
Category : Coherence (Optics)
Languages : en
Pages : 112
Book Description
Extended-range Optical Low-coherence Reflectometry Using a Recirculating Delay Technique
Author: Douglas M. Baney
Publisher:
ISBN:
Category : Communication
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category : Communication
Languages : en
Pages :
Book Description
Review of Progress in Quantitative Nondestructive Evaluation
Author: Donald O. Thompson
Publisher: AIP Conference Proceedings (Nu
ISBN:
Category : Science
Languages : en
Pages : 1014
Book Description
The papers in this proceedings volume were peer-reviewed before acceptance. The Review of Progress in Quantitative NDE has established itself as the world's leading forum for the presentation of research and early engineering demonstrations in quantitative nondestructive evaluation. It is international in scope and broadly interdisciplinary in content covering recent developments in measuring techniques (ultrasonics, electromagnetics, x-rays, thermal, acoustic emission, etc.) and their applications to materials characterization and structural integrity.
Publisher: AIP Conference Proceedings (Nu
ISBN:
Category : Science
Languages : en
Pages : 1014
Book Description
The papers in this proceedings volume were peer-reviewed before acceptance. The Review of Progress in Quantitative NDE has established itself as the world's leading forum for the presentation of research and early engineering demonstrations in quantitative nondestructive evaluation. It is international in scope and broadly interdisciplinary in content covering recent developments in measuring techniques (ultrasonics, electromagnetics, x-rays, thermal, acoustic emission, etc.) and their applications to materials characterization and structural integrity.
Measurements using Optic and RF Waves
Author: Frédérique de Fornel
Publisher: John Wiley & Sons
ISBN: 1118586344
Category : Science
Languages : en
Pages : 238
Book Description
The scientific and technical basis underpinning modern measurement techniques used for electromagnetic quantities and phenonema is necessarily wide-ranging, as the electromagnetic environment spans all possible frequencies and wavelengths. Measurements must be applicable in fields as varied as nanotechnologies, telecommunications, meteorology, geo-location, radio-astronomy, health, biology, and many others. In order to adequately cover the many different facets of the topic, this book provides examples from the entire range of the electromagnetic spectrum — covering frequencies from several hertz to terahertz, and considering wavelength distances ranging from nanometers to light-years in optics. It then provides coverage of the various measurement techniques using electromagnetic waves for various applications, devoting chapters to each different field of application. This comprehensive book gives detailed information on: the various techniques and methods available to measure the key characteristics of electromagnetic waves, in terms of the local field and phase for a broad field of frequencies; determination of physical quantities such as distance, time, etc., using electromagnetic properties; new approaches to measurements in the field of electromagnetic distribution in complex structures media, such as biological tissues and in the nanosciences.
Publisher: John Wiley & Sons
ISBN: 1118586344
Category : Science
Languages : en
Pages : 238
Book Description
The scientific and technical basis underpinning modern measurement techniques used for electromagnetic quantities and phenonema is necessarily wide-ranging, as the electromagnetic environment spans all possible frequencies and wavelengths. Measurements must be applicable in fields as varied as nanotechnologies, telecommunications, meteorology, geo-location, radio-astronomy, health, biology, and many others. In order to adequately cover the many different facets of the topic, this book provides examples from the entire range of the electromagnetic spectrum — covering frequencies from several hertz to terahertz, and considering wavelength distances ranging from nanometers to light-years in optics. It then provides coverage of the various measurement techniques using electromagnetic waves for various applications, devoting chapters to each different field of application. This comprehensive book gives detailed information on: the various techniques and methods available to measure the key characteristics of electromagnetic waves, in terms of the local field and phase for a broad field of frequencies; determination of physical quantities such as distance, time, etc., using electromagnetic properties; new approaches to measurements in the field of electromagnetic distribution in complex structures media, such as biological tissues and in the nanosciences.
Low coherence optical reflectometry
Author:
Publisher:
ISBN:
Category :
Languages : pt-BR
Pages :
Book Description
Reflectometria óptica de baixa coerência tem se tornado uma importante ferramenta para a caracterização de componentes ópticos e optoeletrônicos integrados, cujas dimensões são micrométricos. Este trabalho inclui os princípios básicos de reflectometria, um estudo aprofundado de reflectometria óptica de baixa coerência, uma revisão das técnicas demonstradas na literatura cientifíca e suas resoluções e, principalmente, uma nova topologia na montagem experimental. Esta nova topologia permite que as mediadas sejam feitas de maneira mais simples e eficaz. A resolução obtida ficou tão boa que permitiu a visualização dos modos de propagação TE E TM na cavidade de um laser semicondutor.
Publisher:
ISBN:
Category :
Languages : pt-BR
Pages :
Book Description
Reflectometria óptica de baixa coerência tem se tornado uma importante ferramenta para a caracterização de componentes ópticos e optoeletrônicos integrados, cujas dimensões são micrométricos. Este trabalho inclui os princípios básicos de reflectometria, um estudo aprofundado de reflectometria óptica de baixa coerência, uma revisão das técnicas demonstradas na literatura cientifíca e suas resoluções e, principalmente, uma nova topologia na montagem experimental. Esta nova topologia permite que as mediadas sejam feitas de maneira mais simples e eficaz. A resolução obtida ficou tão boa que permitiu a visualização dos modos de propagação TE E TM na cavidade de um laser semicondutor.
Simultaneous Thickness and Group Index Measurement Using Optical Low-coherence Reflectometry
Author: D. F. Gray
Publisher:
ISBN:
Category :
Languages : en
Pages : 4
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 4
Book Description
Chemical, Biochemical, and Environmental Fiber Sensors
Author:
Publisher:
ISBN:
Category : Chemical detectors
Languages : en
Pages : 398
Book Description
Publisher:
ISBN:
Category : Chemical detectors
Languages : en
Pages : 398
Book Description
Optical Low Coherence Reflectometry for the Measurement of Collagen Thickness
Author: Jean Carol Merchant
Publisher:
ISBN:
Category :
Languages : en
Pages : 194
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 194
Book Description
Development and Utilization of Optical Low Coherence Reflectometry for the Study of Multiple Scattering in Randomly Distributed Solid-liquid Suspensions
Author: Summer Lockerbie Randall
Publisher:
ISBN:
Category : Reflectometer
Languages : en
Pages : 302
Book Description
Publisher:
ISBN:
Category : Reflectometer
Languages : en
Pages : 302
Book Description