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Author: Christophe Gorecki
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Mathematics
Languages : en
Pages : 608
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Book Description
Author: Christophe Gorecki
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Mathematics
Languages : en
Pages : 608
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Book Description
Author:
Publisher:
ISBN:
Category : Engineering inspection
Languages : en
Pages : 616
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Book Description
Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 1498779506
Category : Science
Languages : en
Pages : 585
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Book Description
Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS
Author: Pramod K. Rastogi
Publisher: Springer Science & Business Media
ISBN: 3540488006
Category : Science
Languages : en
Pages : 485
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Book Description
Presenting the use of photonics techniques for measurement in mechanics, this book provides a state-of-the-art review of this active and rapidly growing field. It serves as an invaluable resource for readers to explore the current status and includes a wealth of information on the essential principles and methods. It provides a substantial background in a concise and simple way to enable physicists and engineers to assess, analyze and implement experimental systems needed to solve their specific measurement problems.
Author: Zinoviy Nazarchuk
Publisher: Springer Nature
ISBN: 9819912261
Category : Science
Languages : en
Pages : 415
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Book Description
This book includes the description, modeling and realization of new optical metrology techniques for technical diagnostics of materials. Special attention is paid to multi-step phase shifting interferometry with arbitrary phase shifts between interferograms, phase shifting and correlation digital speckle pattern interferometry, optical-digital speckle correlation, and digital image correlation, as well as dynamic speckle patterns analysis. Optoacoustic techniques can be treated as a separate branch of optical metrology and can solve many problems of technical diagnostics, including detection and localization of subsurface defects in laminated composite materials. The utility of such techniques can be increased by illumination of the object via acoustic waves at certain frequencies. Hence, an effective theoretical approach to the modeling of an elastic wave field interaction with an interphase defect, and to defect visualization using dynamic speckle patterns, is also included in this book. The experimental proof of the proposed approaches was achieved using a specially created hybrid optical-digital system for detection of different subsurface defects. This book is intended for engineers, researchers and students engaged in the field of nondestructive evaluation of materials and technical diagnostics of structural elements, hybrid optical systems, speckle metrology and optoacoustic imaging techniques.
Author: Pramod Rastogi
Publisher: Artech House
ISBN: 1608078078
Category : Technology & Engineering
Languages : en
Pages : 473
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Book Description
This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.
Author: Toru Yoshizawa
Publisher: CRC Press
ISBN: 1351831844
Category : Technology & Engineering
Languages : en
Pages : 866
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Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 1420019163
Category : Science
Languages : en
Pages : 524
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Book Description
Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing. The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications.
Author:
Publisher:
ISBN:
Category : Optical instruments
Languages : en
Pages : 702
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Book Description
Publishes papers reporting on research and development in optical science and engineering and the practical applications of known optical science, engineering, and technology.
Author: Takuya Funatomi
Publisher: John Wiley & Sons
ISBN: 1789451507
Category : Computers
Languages : en
Pages : 356
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Book Description
Most cameras are inherently designed to mimic what is seen by the human eye: they have three channels of RGB and can achieve up to around 30 frames per second (FPS). However, some cameras are designed to capture other modalities: some may have the ability to capture spectra from near UV to near IR rather than RGB, polarimetry, different times of light travel, etc. Such modalities are as yet unknown, but they can also collect robust data of the scene they are capturing. This book will focus on the emerging computer vision techniques known as computational imaging. These include capturing, processing and analyzing such modalities for various applications of scene understanding.
