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Author:
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 472
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Book Description
Author:
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 472
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Book Description
Author:
Publisher: IEEE Computer Society Press
ISBN:
Category : Computers
Languages : en
Pages : 464
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Book Description
Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si
Author: Gordon W. Roberts
Publisher:
ISBN: 9780199796212
Category : Integrated circuits
Languages : en
Pages : 0
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Book Description
With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topicswill help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples,exercises and problems.
Author: Hubert Kaeslin
Publisher: Cambridge University Press
ISBN: 0521882672
Category : Technology & Engineering
Languages : en
Pages : 878
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Book Description
This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
Author: M. Bushnell
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690
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Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author: Bapiraju Vinnakota
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 296
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Book Description
More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 504
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Book Description
Author: Stanley Leonard Hurst
Publisher: IET
ISBN: 9780852969014
Category : Computers
Languages : en
Pages : 560
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Book Description
Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
Author: John W. Leis
Publisher: John Wiley & Sons
ISBN: 1118033809
Category : Science
Languages : en
Pages : 352
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Book Description
Quickly Engages in Applying Algorithmic Techniques to Solve Practical Signal Processing Problems With its active, hands-on learning approach, this text enables readers to master the underlying principles of digital signal processing and its many applications in industries such as digital television, mobile and broadband communications, and medical/scientific devices. Carefully developed MATLAB® examples throughout the text illustrate the mathematical concepts and use of digital signal processing algorithms. Readers will develop a deeper understanding of how to apply the algorithms by manipulating the codes in the examples to see their effect. Moreover, plenty of exercises help to put knowledge into practice solving real-world signal processing challenges. Following an introductory chapter, the text explores: Sampled signals and digital processing Random signals Representing signals and systems Temporal and spatial signal processing Frequency analysis of signals Discrete-time filters and recursive filters Each chapter begins with chapter objectives and an introduction. A summary at the end of each chapter ensures that one has mastered all the key concepts and techniques before progressing in the text. Lastly, appendices listing selected web resources, research papers, and related textbooks enable the investigation of individual topics in greater depth. Upon completion of this text, readers will understand how to apply key algorithmic techniques to address practical signal processing problems as well as develop their own signal processing algorithms. Moreover, the text provides a solid foundation for evaluating and applying new digital processing signal techniques as they are developed.
Author: Institute of Electrical and Electronics Engineers
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1414
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Book Description
