Nist Measurement Assurance Program for Capacitance Standards at 1 Khz (Classic Reprint) PDF Download
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Author: Y. May Chang
Publisher: Forgotten Books
ISBN: 9780331384062
Category : Business & Economics
Languages : en
Pages : 30
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Book Description
Excerpt from Nist Measurement Assurance Program for Capacitance Standards at 1 Khz Key Words: assigned values; capacitance standards; coverage factor; error analysis; measurement assurance program; transport standard; uncertainties. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Author: Y. May Chang
Publisher: Forgotten Books
ISBN: 9780331384062
Category : Business & Economics
Languages : en
Pages : 30
Get Book Here
Book Description
Excerpt from Nist Measurement Assurance Program for Capacitance Standards at 1 Khz Key Words: assigned values; capacitance standards; coverage factor; error analysis; measurement assurance program; transport standard; uncertainties. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Author: Y... May Chang
Publisher:
ISBN:
Category : Capacitance meters
Languages : en
Pages : 19
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Book Description
This document describes the capacitance Measurement Assurance Program (MAP) service at the National Institute of Standards and Technology (NIST). This service, which uses a commercial digital capacitance meter as the transport standard, provides calibration for capacitance standards at both the 1000 pF and 100 pF levels, at a frequency of 1 kHz. In contrast to the typical MAP, where the transport standards are measured by the client laboratory, the capacitance MAP involves measurements performed on "dummy" standards by both the Meter (1 kHz digital capacitance meter used as the transport standard) and the laboratory capacitance measuring system. Measurement procedures and requirements for client laboratories are included. Also presented are error analysis, assigned values, and equations to estimate the overall uncertainties of the assigned values.
Author: Ronald F. Dziuba
Publisher: Forgotten Books
ISBN: 9780364934654
Category : Technology & Engineering
Languages : en
Pages : 70
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Book Description
Excerpt from Nist Measurement Service for DC Standard Resistors Nist provides a calibration service for standard resistors with nominal decade values in the range between Q and 1012 Q. In addition to this regular calibration service, nist offers a resistance Measurement Assurance Program (map) service at the 1 Q and 10 kq levels. Other special resistance measurements are undertaken if they require the unique capabilities of nist. The latest issue of the nist Special Publication25'0 entitled nist Calibration Services Users Guide contains detailed descriptions of the currently available nist calibration services It also contains information on the scheduling of these services along with recommended procedures for shipping a standard to nist for calibration. A separate Fee Schedule, nist Special Publication 250 Appendix, lists the costs of services, and it is updated periodically to reflect changes in prices and services. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 400
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Book Description
Author: David R. Lide
Publisher: CRC Press
ISBN: 9780849312472
Category : Science
Languages : en
Pages : 402
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Book Description
Established by Congress in 1901, the National Bureau of Standards (NBS), now the National Institute of Standards and Technology (NIST), has a long and distinguished history as the custodian and disseminator of the United States' standards of physical measurement. Having reached its centennial anniversary, the NBS/NIST reflects on and celebrates its first century with this book describing some of its seminal contributions to science and technology. Within these pages are 102 vignettes that describe some of the Institute's classic publications. Each vignette relates the context in which the publication appeared, its impact on science, technology, and the general public, and brief details about the lives and work of the authors. The groundbreaking works depicted include: A breakthrough paper on laser-cooling of atoms below the Doppler limit, which led to the award of the 1997 Nobel Prize for Physics to William D. Phillips The official report on the development of the radio proximity fuse, one of the most important new weapons of World War II The 1932 paper reporting the discovery of deuterium in experiments that led to Harold Urey's1934 Nobel Prize for Chemistry A review of the development of the SEAC, the first digital computer to employ stored programs and the first to process images in digital form The first paper demonstrating that parity is not conserved in nuclear physics, a result that shattered a fundamental concept of theoretical physics and led to a Nobel Prize for T. D. Lee and C. Y. Yang "Observation of Bose-Einstein Condensation in a Dilute Atomic Vapor," a 1995 paper that has already opened vast new areas of research A landmark contribution to the field of protein crystallography by Wlodawer and coworkers on the use of joint x-ray and neutron diffraction to determine the structure of proteins
Author: Robert B. Northrop
Publisher: CRC Press
ISBN: 1000055132
Category : Technology & Engineering
Languages : en
Pages : 952
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Book Description
Weighing in on the growth of innovative technologies, the adoption of new standards, and the lack of educational development as it relates to current and emerging applications, the third edition of Introduction to Instrumentation and Measurements uses the authors’ 40 years of teaching experience to expound on the theory, science, and art of modern instrumentation and measurements (I&M). What’s New in This Edition: This edition includes material on modern integrated circuit (IC) and photonic sensors, micro-electro-mechanical (MEM) and nano-electro-mechanical (NEM) sensors, chemical and radiation sensors, signal conditioning, noise, data interfaces, and basic digital signal processing (DSP), and upgrades every chapter with the latest advancements. It contains new material on the designs of micro-electro-mechanical (MEMS) sensors, adds two new chapters on wireless instrumentation and microsensors, and incorporates extensive biomedical examples and problems. Containing 13 chapters, this third edition: Describes sensor dynamics, signal conditioning, and data display and storage Focuses on means of conditioning the analog outputs of various sensors Considers noise and coherent interference in measurements in depth Covers the traditional topics of DC null methods of measurement and AC null measurements Examines Wheatstone and Kelvin bridges and potentiometers Explores the major AC bridges used to measure inductance, Q, capacitance, and D Presents a survey of sensor mechanisms Includes a description and analysis of sensors based on the giant magnetoresistive effect (GMR) and the anisotropic magnetoresistive (AMR) effect Provides a detailed analysis of mechanical gyroscopes, clinometers, and accelerometers Contains the classic means of measuring electrical quantities Examines digital interfaces in measurement systems Defines digital signal conditioning in instrumentation Addresses solid-state chemical microsensors and wireless instrumentation Introduces mechanical microsensors (MEMS and NEMS) Details examples of the design of measurement systems Introduction to Instrumentation and Measurements is written with practicing engineers and scientists in mind, and is intended to be used in a classroom course or as a reference. It is assumed that the reader has taken core EE curriculum courses or their equivalents.
Author: Edward B. Magrab
Publisher:
ISBN:
Category : Microphone
Languages : en
Pages : 124
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Book Description
Author: Brian C. Belanger
Publisher:
ISBN:
Category : Calibration
Languages : en
Pages : 76
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Book Description
Author: French College of Metrology
Publisher: John Wiley & Sons
ISBN: 1118614941
Category : Technology & Engineering
Languages : en
Pages : 187
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Book Description
Metrology is an integral part of the structure of today’s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data. Moreover, international trade practices increasingly require institutions to display demonstrated conformity to written standards and specifications. As such, having relevant and reliable results of measurements and tests in compliance with mutually recognised standards can be a technical, commercial and statutory necessity for a company. This book, the results of a working group from the French College of Metrology and featuring chapters written by a range of experts from a variety of European countries, gives a comprehensive and international treatment of the subject. Academics involved in metrology as well as people involved in the metrology capacities of companies and institutions will find this book of great interest.
Author: Byron Emerson Blair
Publisher:
ISBN:
Category : Atomic frequency standards
Languages : en
Pages : 468
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Book Description
The document is a tutorial Monograph describing various aspects of time and frequency (T/F). Included are chapters relating to elemental concepts of precise time and frequency; basic principles of quartz oscillators and atomic frequency standards; historical review, recent progress, and current status of atomic frequency standards; promising areas for developing future primary frequency standards; relevance of frequency standards to other areas of metrology including a unified standard concept; statistics of T/F data analysis coupled with the theory and construction of the NBS atomic time scale; an overview of T/F dissemination techniques; and the standards of T/F in the USA. The Monograph addresses both the specialist in the field as well as those desiring basic information about time and frequency. The authors trace the development and scope of T/F technology, its improvement over periods of decades, its status today, and its possible use, applications, and development in days to come.
