National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000

National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 160

Get Book Here

Book Description

National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000

National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 160

Get Book Here

Book Description


National Semiconductor Metrology Program

National Semiconductor Metrology Program PDF Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160

Get Book Here

Book Description


National Semiconductor Metrology Program

National Semiconductor Metrology Program PDF Author: National Semiconductor Metrology Program (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160

Get Book Here

Book Description


National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999

National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 148

Get Book Here

Book Description


Monthly Catalog of United States Government Publications

Monthly Catalog of United States Government Publications PDF Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1328

Get Book Here

Book Description


First Text Retrieval Conference (TREC-1)

First Text Retrieval Conference (TREC-1) PDF Author: D. K. Harman
Publisher: DIANE Publishing
ISBN: 0788125214
Category :
Languages : en
Pages : 527

Get Book Here

Book Description
Held in Gaithersburg, MD, Nov. 4-6, 1992. Evaluates new technologies in information retrieval. Numerous graphs, tables and charts.

Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. )

Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. ) PDF Author: Barry N. Taylor
Publisher: DIANE Publishing
ISBN: 1437915566
Category : Science
Languages : en
Pages : 25

Get Book Here

Book Description
Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.

The Second Text REtrieval Conference (TREC-2)

The Second Text REtrieval Conference (TREC-2) PDF Author: Donna K. Harman
Publisher:
ISBN:
Category : Information storage and retrieval systems
Languages : en
Pages : 506

Get Book Here

Book Description


Guide for the Use of the International System of Units (SI)

Guide for the Use of the International System of Units (SI) PDF Author: Barry Taylor
Publisher: DIANE Publishing
ISBN: 0788125796
Category : Metric system
Languages : en
Pages : 84

Get Book Here

Book Description
A basic introduction to the metric system. Covers: the three classes of SI units & the SI prefixes; units outside the SI; rules & style conventions for printing & using units; rules & style conventions for expressing values of quantities; comments on some quantities & their units; rules & style conventions for spelling unit names; printing & using symbols & numbers in scientific & technical documents; & check list for reviewing manuscripts. Appendix: definitions of SI base units & the radian & Steradian; conversion factors, & comments on the references of the SI for the U.S. Extensive bibliography.

A Century of Excellence in Measurements, Standards, and Technology

A Century of Excellence in Measurements, Standards, and Technology PDF Author: David R. Lide
Publisher: CRC Press
ISBN: 9780849312472
Category : Science
Languages : en
Pages : 402

Get Book Here

Book Description
Established by Congress in 1901, the National Bureau of Standards (NBS), now the National Institute of Standards and Technology (NIST), has a long and distinguished history as the custodian and disseminator of the United States' standards of physical measurement. Having reached its centennial anniversary, the NBS/NIST reflects on and celebrates its first century with this book describing some of its seminal contributions to science and technology. Within these pages are 102 vignettes that describe some of the Institute's classic publications. Each vignette relates the context in which the publication appeared, its impact on science, technology, and the general public, and brief details about the lives and work of the authors. The groundbreaking works depicted include: A breakthrough paper on laser-cooling of atoms below the Doppler limit, which led to the award of the 1997 Nobel Prize for Physics to William D. Phillips The official report on the development of the radio proximity fuse, one of the most important new weapons of World War II The 1932 paper reporting the discovery of deuterium in experiments that led to Harold Urey's1934 Nobel Prize for Chemistry A review of the development of the SEAC, the first digital computer to employ stored programs and the first to process images in digital form The first paper demonstrating that parity is not conserved in nuclear physics, a result that shattered a fundamental concept of theoretical physics and led to a Nobel Prize for T. D. Lee and C. Y. Yang "Observation of Bose-Einstein Condensation in a Dilute Atomic Vapor," a 1995 paper that has already opened vast new areas of research A landmark contribution to the field of protein crystallography by Wlodawer and coworkers on the use of joint x-ray and neutron diffraction to determine the structure of proteins