Author: Joel P. Dunsmore
Publisher: John Wiley & Sons
ISBN: 111839125X
Category : Technology & Engineering
Languages : en
Pages : 620
Book Description
This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure Offers a detailed explanation of algorithms and mathematics behind measurements and error correction Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.
Handbook of Microwave Component Measurements
Author: Joel P. Dunsmore
Publisher: John Wiley & Sons
ISBN: 111839125X
Category : Technology & Engineering
Languages : en
Pages : 620
Book Description
This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure Offers a detailed explanation of algorithms and mathematics behind measurements and error correction Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.
Publisher: John Wiley & Sons
ISBN: 111839125X
Category : Technology & Engineering
Languages : en
Pages : 620
Book Description
This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure Offers a detailed explanation of algorithms and mathematics behind measurements and error correction Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.
Microwave Measurements
Author: R.J. Collier
Publisher: IET
ISBN: 0863417353
Category : Technology & Engineering
Languages : en
Pages : 506
Book Description
The book covers the following areas: microwave measurement.
Publisher: IET
ISBN: 0863417353
Category : Technology & Engineering
Languages : en
Pages : 506
Book Description
The book covers the following areas: microwave measurement.
Handbook of Microwave Component Measurements
Author: Joel P. Dunsmore
Publisher: John Wiley & Sons
ISBN: 1119477123
Category : Technology & Engineering
Languages : en
Pages : 1128
Book Description
Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.
Publisher: John Wiley & Sons
ISBN: 1119477123
Category : Technology & Engineering
Languages : en
Pages : 1128
Book Description
Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.
On-Wafer Microwave Measurements and De-embedding
Author: Errikos Lourandakis
Publisher: Artech House
ISBN: 1630813710
Category : Technology & Engineering
Languages : en
Pages : 251
Book Description
This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies. Basic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.
Publisher: Artech House
ISBN: 1630813710
Category : Technology & Engineering
Languages : en
Pages : 251
Book Description
This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies. Basic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.
Principles of Microwave Measurements
Author: Geoff H. Bryant
Publisher: IET
ISBN: 9780863412967
Category : Technology & Engineering
Languages : en
Pages : 434
Book Description
Textbook covering a wide range of microwave measurements in the time and frequency domains, including reflectometry, the Smith chart, spectrum analyzers, vector and scalar analyzers, multiports, power, noise, frequency stability, time domain reflectometry, and a comprehensive account of antenna far and near field measurements. For young engineers requiring a good background in microwave measurement principles. Annotation copyrighted by Book News, Inc., Portland, OR
Publisher: IET
ISBN: 9780863412967
Category : Technology & Engineering
Languages : en
Pages : 434
Book Description
Textbook covering a wide range of microwave measurements in the time and frequency domains, including reflectometry, the Smith chart, spectrum analyzers, vector and scalar analyzers, multiports, power, noise, frequency stability, time domain reflectometry, and a comprehensive account of antenna far and near field measurements. For young engineers requiring a good background in microwave measurement principles. Annotation copyrighted by Book News, Inc., Portland, OR
Modern RF and Microwave Measurement Techniques
Author: Valeria Teppati
Publisher: Cambridge University Press
ISBN: 1107036410
Category : Technology & Engineering
Languages : en
Pages : 475
Book Description
A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
Publisher: Cambridge University Press
ISBN: 1107036410
Category : Technology & Engineering
Languages : en
Pages : 475
Book Description
A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
Microwave Measurements
Author: Edward L Ginzton
Publisher:
ISBN: 9781258270728
Category :
Languages : en
Pages : 534
Book Description
Publisher:
ISBN: 9781258270728
Category :
Languages : en
Pages : 534
Book Description
An Introduction to Microwave Measurements
Author: Ananjan Basu
Publisher: CRC Press
ISBN: 1482214369
Category : Technology & Engineering
Languages : en
Pages : 314
Book Description
Go Beyond Basic Distributed Circuit AnalysisAn Introduction to Microwave Measurements has been written in a way that is different from many textbooks. As an instructor teaching a master's-level course on microwave measurements, the author recognized that few of today's graduate electrical engineering students are knowledgeable about microwave measu
Publisher: CRC Press
ISBN: 1482214369
Category : Technology & Engineering
Languages : en
Pages : 314
Book Description
Go Beyond Basic Distributed Circuit AnalysisAn Introduction to Microwave Measurements has been written in a way that is different from many textbooks. As an instructor teaching a master's-level course on microwave measurements, the author recognized that few of today's graduate electrical engineering students are knowledgeable about microwave measu
Microwaves
Author: K. C. Gupta
Publisher: New Age International
ISBN: 9780852263464
Category : Microwave devices
Languages : en
Pages : 258
Book Description
Publisher: New Age International
ISBN: 9780852263464
Category : Microwave devices
Languages : en
Pages : 258
Book Description
Planar Microwave Engineering
Author: Thomas H. Lee
Publisher: Cambridge University Press
ISBN: 1316175774
Category : Technology & Engineering
Languages : en
Pages : 868
Book Description
Modern wireless communications hardware is underpinned by RF and microwave design techniques. This insightful book contains a wealth of circuit layouts, design tips, and practical measurement techniques for building and testing practical gigahertz systems. The book covers everything you need to know to design, build, and test a high-frequency circuit. Microstrip components are discussed, including tricks for extracting good performance from cheap materials. Connectors and cables are also described, as are discrete passive components, antennas, low-noise amplifiers, oscillators, and frequency synthesizers. Practical measurement techniques are presented in detail, including the use of network analyzers, sampling oscilloscopes, spectrum analyzers, and noise figure meters. Throughout the focus is practical, and many worked examples and design projects are included. There is also a CD-ROM that contains a variety of design and analysis programs. The book is packed with indispensable information for students taking courses on RF or microwave circuits and for practising engineers.
Publisher: Cambridge University Press
ISBN: 1316175774
Category : Technology & Engineering
Languages : en
Pages : 868
Book Description
Modern wireless communications hardware is underpinned by RF and microwave design techniques. This insightful book contains a wealth of circuit layouts, design tips, and practical measurement techniques for building and testing practical gigahertz systems. The book covers everything you need to know to design, build, and test a high-frequency circuit. Microstrip components are discussed, including tricks for extracting good performance from cheap materials. Connectors and cables are also described, as are discrete passive components, antennas, low-noise amplifiers, oscillators, and frequency synthesizers. Practical measurement techniques are presented in detail, including the use of network analyzers, sampling oscilloscopes, spectrum analyzers, and noise figure meters. Throughout the focus is practical, and many worked examples and design projects are included. There is also a CD-ROM that contains a variety of design and analysis programs. The book is packed with indispensable information for students taking courses on RF or microwave circuits and for practising engineers.