Author: A.G. Cullis
Publisher: CRC Press
ISBN: 1000156974
Category : Science
Languages : en
Pages : 552
Book Description
This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.
Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983
Author: A.G. Cullis
Publisher: CRC Press
ISBN: 1000156974
Category : Science
Languages : en
Pages : 552
Book Description
This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.
Publisher: CRC Press
ISBN: 1000156974
Category : Science
Languages : en
Pages : 552
Book Description
This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.
Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983
Author: Cullis
Publisher: CRC Press
ISBN: 9780854981588
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21-23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.
Publisher: CRC Press
ISBN: 9780854981588
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21-23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.
Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983
Author: Cullis
Publisher: CRC Press
ISBN: 9780854981588
Category : Technology & Engineering
Languages : en
Pages : 552
Book Description
Publisher: CRC Press
ISBN: 9780854981588
Category : Technology & Engineering
Languages : en
Pages : 552
Book Description
Microscopy of Semiconducting Materials 1983, Third Oxford Conference on Microscopy of Semiconducting Materials, St Catherines College, March 1983
Author: A.G. Cullis
Publisher: CRC Press
ISBN: 9781000112160
Category : Science
Languages : en
Pages : 300
Book Description
This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.
Publisher: CRC Press
ISBN: 9781000112160
Category : Science
Languages : en
Pages : 300
Book Description
This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.
Microscopy of Semiconducting Materials 1995, Proceedings of the Institute of Physics Conference Held at Oxford University, 20-23 March 1995
Author: A. G. Cullis
Publisher: CRC Press
ISBN:
Category : Art
Languages : en
Pages : 824
Book Description
This volume continues the tradition of previous meetings in the series and provides researchers with an overview of recent developments in the field. Contains invited review papers together with in-depth coverage of the latest research results. Encompassing techniques from transmission and scanning electron microscopy, X-ray topography and diffraction, scanning probe microscopy and atom probe microanalysis, as applied to the whole range of semiconducting materials.
Publisher: CRC Press
ISBN:
Category : Art
Languages : en
Pages : 824
Book Description
This volume continues the tradition of previous meetings in the series and provides researchers with an overview of recent developments in the field. Contains invited review papers together with in-depth coverage of the latest research results. Encompassing techniques from transmission and scanning electron microscopy, X-ray topography and diffraction, scanning probe microscopy and atom probe microanalysis, as applied to the whole range of semiconducting materials.
European Scientific Notes
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 616
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 616
Book Description
Solid State Technology
Author:
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 1318
Book Description
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 1318
Book Description
Bibliographic Guide to Conference Publications
Author: New York Public Library. Research Libraries
Publisher:
ISBN:
Category : Congresses and conventions
Languages : en
Pages : 618
Book Description
Vols. for 1975- include publications cataloged by the Research Libraries of the New York Public Library with additional entries from the Library of Congress MARC tapes.
Publisher:
ISBN:
Category : Congresses and conventions
Languages : en
Pages : 618
Book Description
Vols. for 1975- include publications cataloged by the Research Libraries of the New York Public Library with additional entries from the Library of Congress MARC tapes.
Microscopy of Semiconducting Materials
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Atom Probe Microanalysis
Author: Michael Kenneth Miller
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 304
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 304
Book Description