Microelectronic Manufacturing Yield, Reliability, and Failure Analysis PDF Download
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Author:
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ISBN:
Category : Integrated circuits
Languages : en
Pages : 218
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Author:
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ISBN:
Category : Integrated circuits
Languages : en
Pages : 218
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Author: Hans-Dieter Hartmann
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819426482
Category : Technology & Engineering
Languages : en
Pages : 0
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ISBN:
Category :
Languages : en
Pages :
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Author: Ali Keshavarzi
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819422729
Category : Integrated circuits
Languages : en
Pages : 372
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Author: Sharad Prasad
Publisher: Society of Photo Optical
ISBN: 9780819429698
Category : Technology & Engineering
Languages : en
Pages : 240
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Book Description
A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.
Author:
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ISBN:
Category : Integrated circuits
Languages : en
Pages : 266
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Author: Gudrun Kissinger
Publisher: Society of Photo Optical
ISBN: 9780819441072
Category : Technology & Engineering
Languages : en
Pages : 242
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Author: European Optical Society
Publisher: Society of Photo Optical
ISBN: 9780819432230
Category : Technology & Engineering
Languages : en
Pages : 344
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Author: A. Christou
Publisher: RIAC
ISBN: 1933904151
Category : Microelectronics
Languages : en
Pages : 410
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Author:
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Category :
Languages : en
Pages :
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