Microcircuit Device Reliability. Digital Evaluation and Failure Analysis Data. Parts 1 and 2, Summer 1980 PDF Download
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 765
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Book Description
This compendium of digital SSI/MSI microcircuit device reliability is separated into two volumes. Part I deals with general summaries and detailed listings which address the various aspects of burn-in and environmental/ screening tests at the component level. Devices are classified according to test types and are arranged by test source, device function, operational type, device manufacturer, and commercial part number. Part II contains summaries of failure analysis data based upon failure indicators, failure modes, failure defects, failure defect causes, and failure activating stresses, as well as a detailed listing of verified failure events as derived from device- and equipment-level testing.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 765
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Book Description
This compendium of digital SSI/MSI microcircuit device reliability is separated into two volumes. Part I deals with general summaries and detailed listings which address the various aspects of burn-in and environmental/ screening tests at the component level. Devices are classified according to test types and are arranged by test source, device function, operational type, device manufacturer, and commercial part number. Part II contains summaries of failure analysis data based upon failure indicators, failure modes, failure defects, failure defect causes, and failure activating stresses, as well as a detailed listing of verified failure events as derived from device- and equipment-level testing.
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 204
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Book Description
Author: David B. Nicholls
Publisher:
ISBN:
Category : Digital electronics
Languages : en
Pages :
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Book Description
Author: Edward B. Hakim
Publisher: Artech House Publishers
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 400
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Book Description
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Author: David B. Nicholls
Publisher:
ISBN:
Category :
Languages : en
Pages : 354
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Book Description
This report of digital evaluation and generic failure analysis data is one of a series of annual microcircuit device reliability data publications compiled by the Reliability Analysis Center. This compendium provides burn-in and environmental/screening data on SSI and MSI digital microcircuits. Each document in the series contains analyzed reliability information in addition to a detailed presentation of field and test results. This information aids in determining device fallout rates and the operational test and field characteristics of devices. Life test results can be reviewed. The relative risks of screening decisions may also be determined. Additionally, information is available to form the foundation for failure mode effects and criticality analyses(FMECA). Through the data presented, these publications are intended to actively complement such publications as MIL-STD-883 and MIL-HDBK-217B. The user is cautioned, however, that the listed data may not be used in lieu of contractually cited references.
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 436
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Book Description
Author:
Publisher:
ISBN:
Category : Government reports announcements & index
Languages : en
Pages : 968
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Book Description
Author: David B. Nicholls
Publisher:
ISBN:
Category :
Languages : en
Pages : 328
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Book Description
Author:
Publisher:
ISBN:
Category : Government reports announcements & index
Languages : en
Pages : 976
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Book Description
Author: Mark R. Klein
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 344
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Book Description
