Microbeam Analysis. Electron Probe Microanalysis. Guidelines for Qualitative Point Analysis by Wavelength Dispersive X-ray Spectrometry PDF Download
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Author: British Standards Institute Staff
Publisher:
ISBN: 9780580445170
Category :
Languages : en
Pages : 20
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Book Description
Electron beams, Microanalysis, Chemical analysis and testing, X-ray fluorescence spectrometry, Spectrophotometry, Spectroscopy, Instrumental methods of analysis, Dispersion (waves), Wavelengths, Electron microscopes
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580445170
Category :
Languages : en
Pages : 20
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Book Description
Electron beams, Microanalysis, Chemical analysis and testing, X-ray fluorescence spectrometry, Spectrophotometry, Spectroscopy, Instrumental methods of analysis, Dispersion (waves), Wavelengths, Electron microscopes
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580502378
Category :
Languages : en
Pages : 24
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Book Description
Chemical analysis and testing, Microanalysis, Electron beams, Spectroscopy, Instrumental methods of analysis, Dispersion (waves), Wavelengths, X-rays, X-ray analysis, Specimen preparation, Test equipment
Author: International Organization for Standardization
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 17
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Book Description
Author: Abraham Boekestein
Publisher: Springer Science & Business Media
ISBN: 3709166799
Category : Science
Languages : en
Pages : 271
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Book Description
This supplement of Mikrochimica Acta contains selected papers from the Second Workshop of the European Microbeam Analysis Society (EMAS) "Modern Developments and Applications in Microbeam Analysis", on which took place in May 1991 in Dubrovnik (Yugoslavia). EMAS was founded in 1987 by members from almost all European countries, in order to stimulate research, applications and development of all forms of microbeam methods. One of the most important activities EMAS is the organisation of biannual workshops for demonstrating the current status and developing trends of microbeam methods. For this meeting, EMAS chose to highlight the following topics: electron-beam microanalysis (EPMA) of thin films and quantitative analysis of ultra-light elements, Auger electron spectroscopy (AES), electron energy loss spec trometry (EELS), high-resolution transmission electron microscopy (HRTEM), quantitative analysis of biological samples and standard-less electron-beam microanalysis. Seven introductory lectures and almost seventy poster presentations were given by speakers from twelve European and two non-European (U.S.A. and Argentina) countries were made. One cannot assume that all fields of research in Europe were duly represented, but a definite trend is discernible. EPMA with wavelength-dispersive spectrometry (WDS) or energy-dispersive spectrometry (EDS) is the method with by far the widest range of applications, followed by TEM with EELS and then AES. There are also interesting suggestions for the further development of new appa ratus with new fields of application. Applications are heavily biased towards materials science (thin films in microelectronics and semicon ductors), ceramics and metallurgy, followed by analysis of biological and mineral samples.
Author: Elisabeth Mansfield
Publisher: John Wiley & Sons
ISBN: 3527800050
Category : Technology & Engineering
Languages : en
Pages : 630
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Book Description
For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.
Author: Peter E. J. Flewitt
Publisher: CRC Press
ISBN: 1351043161
Category : Science
Languages : en
Pages : 796
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Book Description
This completely revised and expanded new edition covers the full range of techniques now available for the investigation of materials structure and accurate quantitative determination of microstructural features within materials. It continues to provide the best introductory resource for understanding the interrelationship between microstructure and physical, mechanical, and chemical properties, as well as selection and application of techniques for both basic and applied studies. In particular, changes have been made to reflect developments in analysis of nanoscale and biological materials.
Author: International Organization for Standardization
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 17
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Book Description
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580442445
Category :
Languages : en
Pages : 24
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Book Description
Chemical analysis and testing, Microanalysis, Spectroscopy, Wavelengths
Author: K.F.J. Heinrich
Publisher: Springer Science & Business Media
ISBN: 1489926178
Category : Science
Languages : en
Pages : 397
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Book Description
In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Author: https://www.chinesestandard.net
Publisher: https://www.chinesestandard.net
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 21
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Book Description
This Standard specifies the calibration curve method that uses electron probe to determine the contents of silicon and manganese in carbon steel and low alloy steel (iron mass fraction is greater than 95%). This Standard is applicable to electron probe spectrometers, not to energy spectrometers. Scanning electron microscope with spectrometer can refer to this Standard as reference.
