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Author: Theo W. Hänsch
Publisher: IOS Press
ISBN: 1586037846
Category : Computers
Languages : en
Pages : 683
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Book Description
One of the exciting characteristics of metrology is its intimate relationship between fundamental physics and the leading edge of technology which is needed to perform advanced and challenging experiments and measurements. This title includes a set of lectures which present the relevant progress in Metrology.
Author: Theo W. Hänsch
Publisher: IOS Press
ISBN: 1586037846
Category : Computers
Languages : en
Pages : 683
Get Book Here
Book Description
One of the exciting characteristics of metrology is its intimate relationship between fundamental physics and the leading edge of technology which is needed to perform advanced and challenging experiments and measurements. This title includes a set of lectures which present the relevant progress in Metrology.
Author: P. Tavella
Publisher: IOS Press
ISBN: 1614998183
Category : Science
Languages : en
Pages : 528
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Book Description
Metrology is a constantly evolving field, and one which has developed in many ways in the last four decades. This book presents the proceedings of the Enrico Fermi Summer School on the topic of Metrology, held in Varenna, Italy, from 26 June to 6 July 2017. This was the 6th Enrico Fermi summer school devoted to metrology, the first having been held in 1976. The 2017 program addressed two major new directions for metrology: the work done in preparation for a possible re-definition of four of the base units of the SI in 2018, and the impact of the application of metrology to issues addressing quality of life – such as global climate change and clinical and food analysis – on science, citizens and society. The lectures were grouped into three modules: metrology for quality of life; fundamentals of metrology; and physical metrology and fundamental constants, and topics covered included food supply and safety; biomarkers; monitoring climate and air quality; new IS units; measurement uncertainty; fundamental constants; electrical metrology; optical frequency standards; and photometry and light metrology. The book provides an overview of the topics and changes relevant to metrology today, and will be of interest to both academics and all those whose work involves any of the various aspects of this field.
Author: V. de Sabbata
Publisher: Springer Science & Business Media
ISBN: 9789027727091
Category : Science
Languages : en
Pages : 568
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Book Description
Proceedings of the NATO Advanced Study Institute, Erice, Italy, May 2-12, 1987
Author: A. Di Giuseppe
Publisher: IOS Press
ISBN: 1614993262
Category : Science
Languages : en
Pages : 567
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Book Description
The reliability and accuracy of systems of measurement continue to advance. We are about to enter a period of the most stable measurement system we can imagine with the anticipated new definitions of the SI units of measurement; a direct link between fundamental physics and metrology which will eliminate the current definition of the kilogram, until now based upon an artifact. This book presents selected papers from Course 185 of the Enrico Fermi International School of Physics, held in Varenna, Italy, in July 2012 and jointly organized with the Bureau International des Poids et Mesures (BIPM). The papers delivered at the school covered some of the most advanced topics in the discipline of metrology, including nano-technologies; quantum information and quantum devices; biology and medicine; food; surface quality; ionising radiation for health, environment, art and archaeology; and climate. The continuous and striking advances in basic research concerning atomic frequency standards operating both in the visible range and at microwave levels and the applications to satellite systems are also considered, in the framework of a historical review of the international organization of metrology, as are the problems inherent in uncertainty statements and definitions. This book will be of interest to all those whose work involves scientific measurement at the highest levels of accuracy.
Author: F. Piquemal
Publisher:
ISBN:
Category : Physical measurements
Languages : en
Pages : 420
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Book Description
Author: Savely G Karshenboim
Publisher: Springer
ISBN: 9783662144596
Category :
Languages : en
Pages : 368
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Book Description
Author: John Barrow
Publisher: Vintage
ISBN: 0307555356
Category : Science
Languages : en
Pages : 370
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Book Description
Reality as we know it is bound by a set of constants—numbers and values that dictate the strengths of forces like gravity, the speed of light, and the masses of elementary particles. In The Constants of Nature, Cambridge Professor and bestselling author John D.Barrow takes us on an exploration of these governing principles. Drawing on physicists such as Einstein and Planck, Barrow illustrates with stunning clarity our dependence on the steadfastness of these principles. But he also suggests that the basic forces may have been radically different during the universe’s infancy, and suggests that they may continue a deeply hidden evolution. Perhaps most tantalizingly, Barrow theorizes about the realities that might one day be found in a universe with different parameters than our own.
Author: Theo W. Hänsch
Publisher:
ISBN: 9781435677814
Category : Science
Languages : en
Pages : 649
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Book Description
Author: S. V. Gupta
Publisher: Springer Nature
ISBN: 3030439690
Category : Technology & Engineering
Languages : en
Pages : 317
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Book Description
This book delivers a comprehensive overview of units of measurement. Beginning with a historical look at metrology in Ancient India, the book explains fundamental concepts in metrology such as basic, derived and dimensionless quantities, and introduces the concept of quantity calculus. It discusses and critically examines various three and four-dimensional systems of units used both presently and in the past, while explaining why only four base units are needed for a system of measurement. It discusses the Metre Convention as well as the creation of the International Bureau of Weights and Measures, and gives a detailed look at the evolution of the current SI base units of time, length, mass, electric current, temperature, intensity of illumination and substance. This updated second edition is extended with timely new chapters discussing past efforts to redefine the SI base units as well as the most recent 2019 redefinitions based entirely on the speed of light and other fundamental physical constants. Additionally, it provides biographical presentations of many of the historical figures behind commonly used units of measurements, such as Newton, Joule and Ohm, With its accessible and comprehensive treatment of the field, together with its unique presentation of the underlying history, this book is well suited to any student and researcher interested in the practical and historical aspects of the field of metrology.
Author: Waldemar Nawrocki
Publisher: Springer
ISBN: 3319156691
Category : Technology & Engineering
Languages : en
Pages : 287
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Book Description
This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
