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Author: C.A. Brebbia
Publisher: WIT Press
ISBN: 1845649486
Category : Technology & Engineering
Languages : en
Pages : 413
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Book Description
Containing papers presented at the Seventh International Conference on Materials Characterisation, this book presents the latest advances in a rapidly developing field that requires the application of a combination of numerical and experimental methods. The work has been contributed by researchers who use computational methods, those who perform experiments, and those who combine both. Materials characterisation is important to ensuring that new products meet the needs of industry and consumers. The accurate characterisation of the physical and chemical properties of the materials requires the application of both experimental techniques and computer simulation methods. The wide range of materials now available, from metals to polymers and semiconductors to composites, necessitates a variety of experimental techniques and numerical methods. The papers in the book examine various combinations of techniques. The papers cover such topics as: Mechanical Characterisation and Testing; Micro and Macro Materials Characterisation; Cementitious Materials; Advances in Composites; Semiconductor Materials Characterisation; Computational Models and Experiments; Corrosion Problems.
Author: C.A. Brebbia
Publisher: WIT Press
ISBN: 1845649486
Category : Technology & Engineering
Languages : en
Pages : 413
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Book Description
Containing papers presented at the Seventh International Conference on Materials Characterisation, this book presents the latest advances in a rapidly developing field that requires the application of a combination of numerical and experimental methods. The work has been contributed by researchers who use computational methods, those who perform experiments, and those who combine both. Materials characterisation is important to ensuring that new products meet the needs of industry and consumers. The accurate characterisation of the physical and chemical properties of the materials requires the application of both experimental techniques and computer simulation methods. The wide range of materials now available, from metals to polymers and semiconductors to composites, necessitates a variety of experimental techniques and numerical methods. The papers in the book examine various combinations of techniques. The papers cover such topics as: Mechanical Characterisation and Testing; Micro and Macro Materials Characterisation; Cementitious Materials; Advances in Composites; Semiconductor Materials Characterisation; Computational Models and Experiments; Corrosion Problems.
Author: C.A. Brebbia
Publisher: WIT Press
ISBN: 178466197X
Category : Technology & Engineering
Languages : en
Pages : 421
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Book Description
Material and contact characterisation is a rapidly advancing field that requires the application of a combination of numerical and experimental methods. Including papers from the International Conference on Computational Methods and Experiments in Material and Contact Characterisation this volume presents the latest research in the field.
Author: Sandy Suet To
Publisher: Springer
ISBN: 3662548232
Category : Technology & Engineering
Languages : en
Pages : 269
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Book Description
This book presents an in-depth study and elucidation on the mechanisms of the micro-cutting process, with particular emphasis and a novel viewpoint on materials characterization and its influences on ultra-precision machining. Ultra-precision single point diamond turning is a key technology in the manufacture of mechanical, optical and opto-electronics components with a surface roughness of a few nanometers and form accuracy in the sub-micrometric range. In the context of subtractive manufacturing, ultra-precision diamond turning is based on the pillars of materials science, machine tools, modeling and simulation technologies, etc., making the study of such machining processes intrinsically interdisciplinary. However, in contrast to the substantial advances that have been achieved in machine design, laser metrology and control systems, relatively little research has been conducted on the material behavior and its effects on surface finish, such as the material anisotropy of crystalline materials. The feature of the significantly reduced depth of cut on the order of a few micrometers or less, which is much smaller than the average grain size of work-piece materials, unavoidably means that conventional metal cutting theories can only be of limited value in the investigation of the mechanisms at work in micro-cutting processes in ultra-precision diamond turning.
Author: D.O. Northwood
Publisher: WIT Press
ISBN: 1784663077
Category : Technology & Engineering
Languages : en
Pages : 179
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Book Description
Containing selected papers on Materials Characterisation this volume presents the latest research in the field. Material and contact characterisation is a rapidly advancing field that requires the application of a combination of numerical and experimental methods. Contributions come from both industry and research communities using computational methods and performing experiments. Demand for high quality production from both industry and consumers has led to rapid developments in materials science and engineering. Current research is focussed on modification technologies that can increase the surface durability of materials. The characteristics of the system reveal which surface engineering methods should be chosen and as a consequence it is essential to study the combination of surface treatment and contact mechanics. The accurate characterisation of the physical and chemical properties of materials requires the application of both experimental techniques and computer simulation methods in order to gain a correct analysis. A very wide range of materials, starting with metals through polymers and semiconductors to composites, necessitates a whole spectrum of characteristic experimental techniques and research methods. The papers in this book examine various combinations of techniques across various topics.
Author: Mauro Sardela
Publisher: Springer
ISBN: 1461492815
Category : Technology & Engineering
Languages : en
Pages : 242
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Book Description
Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.
Author: S. Syngellakis
Publisher: WIT Press
ISBN: 1784662496
Category : Technology & Engineering
Languages : en
Pages : 317
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Book Description
Corrosion is a degrading material process frequently encountered in engineering structures and components, which may lead to costly and catastrophic failures if not properly and timely addressed. This volume describes a wide spectrum of experimental and analytical studies, which provide a fairly comprehensive account of corrosion manifestations and methodologies for addressing them in structural and industrial design. As such, it is expected to make a valuable reference publication for engineers and scientists interested in the protection of structures and components from harmful and potentially ruinous corrosive action. The collected articles comprising this volume address issues which can be categorised into two main areas. The first is concerned with material science approaches to corrosion, that is, visual or instrumental means of assessing existing behaviour or effectiveness of corrective measures and techniques. The second part of the volume comprises boundary element simulations of cathodic protection schemes for the purpose of predicting and optimising their performance. A number of practical problems are analysed such as: the coating condition on a ballast tank wall; the impressed current cathodic protection of an offshore platform and minimizing a ship’s electric and magnetic signature. Topics covered include: Elemental identification; Material loss; Strain fields; Stress corrosion cracking; Corrosion resistance; Fretting corrosion; Contact surface damage; Electrochemical testing; Coating conditions; Cathodic protection; Current density distribution; Pipelines and deep well casings; Electric and magnetic signatures; Coating damage effects; Galvanic corrosion.
Author: Philip Llewellyn
Publisher: Elsevier
ISBN: 0080463711
Category : Technology & Engineering
Languages : en
Pages : 749
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Book Description
The 7th International Symposium on the Characterization of Porous Solids (COPS-VII) was held in the Congress Centre in Aix-en-Provence between the 25th-28th May 2005. The symposium covered recent results of fundamental and applied research on the characterization of porous solids. Papers relating to characterization methods such as gas adsorption and liquid porosimetry, X-ray techniques and microscopic measurements as well as the corresponding molecular modelling methods were given. These characterization methods were shown to be applied to all types of porous solids such as clays, carbons, ordered mesoporous materials, porous glasses, oxides, zeolites and metal organic frameworks. * 36 oral presentations and 166 posters and around 230 guests from 27 countries. * A large part of this symposium was devoted to the use computational methods to characterise porous solids
Author: Alokesh Pramanik
Publisher: Trans Tech Publications Ltd
ISBN: 3035738637
Category : Science
Languages : en
Pages : 215
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Book Description
Selected peer-reviewed full text papers from the 10th Spring International Conference on Material Sciences and Technology (MST-S 2021) Selected, peer-reviewed papers from the 2021 Spring International Conference on Material Sciences and Technology (MST-S), April 20-22, 2021, Xi’an, China
Author: Ramiro Pérez Campos
Publisher: Springer
ISBN: 3319152041
Category : Technology & Engineering
Languages : en
Pages : 219
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Book Description
This book covers novel research results for process and techniques of materials characterization for a wide range of materials. The authors provide a comprehensive overview of the aspects of structural and chemical characterization of these materials. The articles contained in this book covers state of the art and experimental techniques commonly used in modern materials characterization. The book includes theoretical models and numerous illustrations of structural and chemical characterization properties.
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
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Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
