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Author: Max Knoll
Publisher: Springer Science & Business Media
ISBN: 3642459366
Category : Technology & Engineering
Languages : en
Pages : 504
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Book Description
This bookis intended to be of assistance to the physicist or engineer concerned with designing and building electron devices such as high-vacuum transmitter- or amplifier tubes, gas- or vapor-filled rectifiers, thyratrons, X-ray or luminescent tubes, glow or incandescent lamps, Geiger- or ionization counters, vacuum photo cells, photoconductive cells, selenium-, germanium- or silicon rectifiers or trans istors. For this purpose, extensive information is required concerning the compo sition, behavior and handling of materials as well as a thorough knowledge of high-vacuum technique necessary for processing electron devices after their assembly. The text covers the preparation and working of materials used in these devices; the finishing methods for vacuum tubes (especially degassing, pumping and getter procedures); and different production steps of solid state devices. This book contains about 2300 references indicated in the text by the author's name and reference number. At the end of each chapter the references themselves are listed alphabetically by the author's name and with the title sometimes abbreviated. In accordance with the purpose of the book, "first" publications are quoted only when they contain up-to-date-knowledge of the subject in question. Patents are treated as references. The quotation of a patent gives only a hint of the technical details described there. Mentioning, or not mentioning, a patent does not imply a statement concerning its importance or validity or warning against imitation. Expired patents are named in addition to ones still valid.
Author: Max Knoll
Publisher: Springer Science & Business Media
ISBN: 3642459366
Category : Technology & Engineering
Languages : en
Pages : 504
Get Book Here
Book Description
This bookis intended to be of assistance to the physicist or engineer concerned with designing and building electron devices such as high-vacuum transmitter- or amplifier tubes, gas- or vapor-filled rectifiers, thyratrons, X-ray or luminescent tubes, glow or incandescent lamps, Geiger- or ionization counters, vacuum photo cells, photoconductive cells, selenium-, germanium- or silicon rectifiers or trans istors. For this purpose, extensive information is required concerning the compo sition, behavior and handling of materials as well as a thorough knowledge of high-vacuum technique necessary for processing electron devices after their assembly. The text covers the preparation and working of materials used in these devices; the finishing methods for vacuum tubes (especially degassing, pumping and getter procedures); and different production steps of solid state devices. This book contains about 2300 references indicated in the text by the author's name and reference number. At the end of each chapter the references themselves are listed alphabetically by the author's name and with the title sometimes abbreviated. In accordance with the purpose of the book, "first" publications are quoted only when they contain up-to-date-knowledge of the subject in question. Patents are treated as references. The quotation of a patent gives only a hint of the technical details described there. Mentioning, or not mentioning, a patent does not imply a statement concerning its importance or validity or warning against imitation. Expired patents are named in addition to ones still valid.
Author: National Research Council (U.S.). Ad Hoc Committee on Materials and Processes for Electron Devices
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 260
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Book Description
Author:
Publisher: ASTM International
ISBN:
Category :
Languages : en
Pages : 283
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Book Description
Author: K. M. Gupta
Publisher: John Wiley & Sons
ISBN: 1118998588
Category : Technology & Engineering
Languages : en
Pages : 762
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Book Description
This comprehensive and unique book is intended to cover the vast and fast-growing field of electrical and electronic materials and their engineering in accordance with modern developments. Basic and pre-requisite information has been included for easy transition to more complex topics. Latest developments in various fields of materials and their sciences/engineering, processing and applications have been included. Latest topics like PLZT, vacuum as insulator, fiber-optics, high temperature superconductors, smart materials, ferromagnetic semiconductors etc. are covered. Illustrations and examples encompass different engineering disciplines such as robotics, electrical, mechanical, electronics, instrumentation and control, computer, and their inter-disciplinary branches. A variety of materials ranging from iridium to garnets, microelectronics, micro alloys to memory devices, left-handed materials, advanced and futuristic materials are described in detail.
Author: Osamu Ueda
Publisher: Springer Science & Business Media
ISBN: 1461443369
Category : Technology & Engineering
Languages : en
Pages : 618
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Book Description
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
Author: W. Murray Bullis
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 60
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Book Description
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 58
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Book Description
Author: Milton Ohring
Publisher: Academic Press
ISBN: 0080575528
Category : Technology & Engineering
Languages : en
Pages : 759
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Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author:
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 60
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Book Description
Author: Osamu Ueda
Publisher: Springer Science & Business Media
ISBN: 1461443377
Category : Science
Languages : en
Pages : 618
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Book Description
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
