Low Voltage Scanning Electron Microscopy of Polymers PDF Download
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Author: Oscar Walter Vaz
Publisher:
ISBN:
Category : Polymerization
Languages : en
Pages : 246
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Book Description
Author: Oscar Walter Vaz
Publisher:
ISBN:
Category : Polymerization
Languages : en
Pages : 246
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Book Description
Author: Goerg H. Michler
Publisher: Springer Science & Business Media
ISBN: 3540363521
Category : Technology & Engineering
Languages : en
Pages : 472
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Book Description
The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book. The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Author: Linda Sawyer
Publisher: Springer Science & Business Media
ISBN: 0387726284
Category : Science
Languages : en
Pages : 568
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Book Description
This extensively updated and revised Third Edition is a comprehensive and practical guide to the study of the microstructure of polymers. It is the result of the authors' many years of academic and industrial experience. Introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization. Emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy are considered. The book closes with a problem solving guide.
Author: Wolfgang Grellmann
Publisher: Springer
ISBN: 3319418793
Category : Technology & Engineering
Languages : en
Pages : 537
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Book Description
This book covers the most recent advances in the deformation and fracture behaviour of polymer material. It provides deeper insight into related morphology–property correlations of thermoplastics, elastomers and polymer resins. Each chapter of this book gives a comprehensive review of state-of-the-art methods of materials testing and diagnostics, tailored for plastic pipes, films and adhesive systems as well as elastomeric components and others. The investigation of deformation and fracture behaviour using the experimental methods of fracture mechanics has been the subject of intense research during the last decade. In a systematic manner, modern aspects of fracture mechanics in the industrial application of polymers for bridging basic research and industrial development are illustrated by multifarious examples of innovative materials usage. This book will be of value to scientists, engineers and in polymer materials science.
Author: Ludwig Reimer
Publisher: SPIE Press
ISBN: 9780819412065
Category : Science
Languages : en
Pages : 162
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Book Description
While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic and inelastic scattering processes on electron diffusion and electron range; charging and radiation damage effects; the dependence of SE yield and the backscattering coefficient on electron energy, surface tilt, and material as well as the angular and energy distributions; and types of image contrast and the differences between LVSEM and conventional SEM modes due to the influence of electron-specimen interactions.
Author: L. H. Princen
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 240
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Book Description
Author: David C. Bell
Publisher: John Wiley & Sons
ISBN: 1118498488
Category : Science
Languages : en
Pages : 241
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Book Description
Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.
Author: Ludwig Reimer
Publisher: Springer
ISBN: 3662135531
Category : Science
Languages : en
Pages : 532
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Book Description
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.
Author: Qipeng Guo
Publisher: John Wiley & Sons
ISBN: 1118452151
Category : Technology & Engineering
Languages : en
Pages : 472
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Book Description
With a focus on structure-property relationships, this book describes how polymer morphology affects properties and how scientists can modify them. The book covers structure development, theory, simulation, and processing; and discusses a broad range of techniques and methods. • Provides an up-to-date, comprehensive introduction to the principles and practices of polymer morphology • Illustrates major structure types, such as semicrystalline morphology, surface-induced polymer crystallization, phase separation, self-assembly, deformation, and surface topography • Covers a variety of polymers, such as homopolymers, block copolymers, polymer thin films, polymer blends, and polymer nanocomposites • Discusses a broad range of advanced and novel techniques and methods, like x-ray diffraction, thermal analysis, and electron microscopy and their applications in the morphology of polymer materials
Author: Applie
Publisher:
ISBN: 9780471032786
Category :
Languages : en
Pages :
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Book Description
