Low-Energy Ion Irradiation of Materials PDF Download
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Author: Bernd Rauschenbach
Publisher: Springer Nature
ISBN: 3030972771
Category : Technology & Engineering
Languages : en
Pages : 763
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Book Description
This book provides a comprehensive introduction to all aspects of low-energy ion–solid interaction from basic principles to advanced applications in materials science. It features a balanced and insightful approach to the fundamentals of the low-energy ion–solid surface interaction, focusing on relevant topics such as interaction potentials, kinetics of binary collisions, ion range, radiation damages, and sputtering. Additionally, the book incorporates key updates reflecting the latest relevant results of modern research on topics such as topography evolution and thin-film deposition under ion bombardment, ion beam figuring and smoothing, generation of nanostructures, and ion beam-controlled glancing angle deposition. Filling a gap of almost 20 years of relevant research activity, this book offers a wealth of information and up-to-date results for graduate students, academic researchers, and industrial scientists working in these areas.
Author: Bernd Rauschenbach
Publisher: Springer Nature
ISBN: 3030972771
Category : Technology & Engineering
Languages : en
Pages : 763
Get Book Here
Book Description
This book provides a comprehensive introduction to all aspects of low-energy ion–solid interaction from basic principles to advanced applications in materials science. It features a balanced and insightful approach to the fundamentals of the low-energy ion–solid surface interaction, focusing on relevant topics such as interaction potentials, kinetics of binary collisions, ion range, radiation damages, and sputtering. Additionally, the book incorporates key updates reflecting the latest relevant results of modern research on topics such as topography evolution and thin-film deposition under ion bombardment, ion beam figuring and smoothing, generation of nanostructures, and ion beam-controlled glancing angle deposition. Filling a gap of almost 20 years of relevant research activity, this book offers a wealth of information and up-to-date results for graduate students, academic researchers, and industrial scientists working in these areas.
Author: Hubert Gnaser
Publisher: Springer
ISBN: 9783662147382
Category :
Languages : en
Pages : 304
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Book Description
Author: Michael Nastasi
Publisher: Cambridge University Press
ISBN: 052137376X
Category : Science
Languages : en
Pages : 572
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Book Description
Comprehensive guide to an important materials science technique for students and researchers.
Author: Howard Saltsburg
Publisher: Elsevier
ISBN: 1483270637
Category : Science
Languages : en
Pages : 568
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Book Description
Fundamentals of Gas–Surface Interactions presents the study of the surface itself and the study of the gas phase partner of the interaction in which physical or chemical transformation of the gas resulted from that interaction. This book discusses the study of the energy and momentum exchanges resulting from the gas–solid physical interaction in which either gas or solid phase properties can be measured. Organized into three parts encompassing 33 chapters, this book begins with an overview of the different sensitive physical methods for the study of surface topography, surface defects, and surface irregularities to an accuracy of a few Angstroms. This text then reviews the adsorption at very low coverage that has yielded to equilibrium analysis. Other chapters consider the measurement of surface area by adsorption and optical techniques. The final chapter deals with scattering processes including momentum and energy transfer. This book is a valuable resource for engineers.
Author: Rainer Behrisch
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 346
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: James M. E. Harper
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 424
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Book Description
Presentations from the Symposium on Low Energy Ion Beam and Plasma Modification of Materials held at the Spring 1991 Materials Research Society Conference.
Author: Ricardo Diez Muino
Publisher: Springer Science & Business Media
ISBN: 3642329551
Category : Science
Languages : en
Pages : 439
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Book Description
This book gives a representative survey of the state of the art of research on gas-surface interactions. It provides an overview of the current understanding of gas surface dynamics and, in particular, of the reactive and non-reactive processes of atoms and small molecules at surfaces. Leading scientists in the field, both from the theoretical and the experimental sides, write in this book about their most recent advances. Surface science grew as an interdisciplinary research area over the last decades, mostly because of new experimental technologies (ultra-high vacuum, for instance), as well as because of a novel paradigm, the ‘surface science’ approach. The book describes the second transformation which is now taking place pushed by the availability of powerful quantum-mechanical theoretical methods implemented numerically. In the book, experiment and theory progress hand in hand with an unprecedented degree of accuracy and control. The book presents how modern surface science targets the atomic-level understanding of physical and chemical processes at surfaces, with particular emphasis on dynamical aspects. This book is a reference in the field.
Author: Sarah Fearn
Publisher: Morgan & Claypool Publishers
ISBN: 1681740885
Category : Technology & Engineering
Languages : en
Pages : 67
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Book Description
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
Author: O. Auciello
Publisher: Springer Science & Business Media
ISBN: 9400919468
Category : Science
Languages : en
Pages : 548
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Book Description
An understanding of the processes involved in the basic and applied physics and chemistry of the interaction of plasmas with materials is vital to the evolution of technologies such as those relevant to microelectronics, fusion and space. The subjects dealt with in the book include: the physics and chemistry of plasmas, plasma diagnostics, physical sputtering and chemical etching, plasma assisted deposition of thin films, ion and electron bombardment, and plasma processing of inorganic and polymeric materials. The book represents a concentration of a substantial amount of knowledge acquired in this area - knowledge which was hitherto widely scattered throughout the literature - and thus establishes a baseline reference work for both established and tyro research workers.
