Strain And Dislocation Gradients From Diffraction: Spatially-resolved Local Structure And Defects PDF Download
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Author: Rozaliya I Barabash
Publisher: World Scientific
ISBN: 190897964X
Category : Science
Languages : en
Pages : 478
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Book Description
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author: Rozaliya I Barabash
Publisher: World Scientific
ISBN: 190897964X
Category : Science
Languages : en
Pages : 478
Get Book Here
Book Description
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author: S.J.L. Billinge
Publisher: Springer Science & Business Media
ISBN: 0306470772
Category : Technology & Engineering
Languages : en
Pages : 397
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Book Description
This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science and engineering, with length scales ranging from Ångstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M.F. Thorpe, Series Editor E-mail: thorpe @ pa.msu.edu East Lansing, Michigan PREFACE One of the most challenging problems in the study of structure is to characterize the atomic short-range order in materials. Long-range order can be determined with a high degree of accuracy by analyzing Bragg peak positions and intensities in data from single crystals or powders. However, information about short-range order is contained in the diffuse scattering intensity. This is difficult to analyze because it is low in absolute intensity (though the integrated intensity may be significant) and widely spread in reciprocal space.
Author: Koichi Hayashi
Publisher: Springer Nature
ISBN: 9819952352
Category : Technology & Engineering
Languages : en
Pages : 458
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Book Description
This book introduces characterizations of hyperordered structures using latest quantum beam technologies, the advanced theoretical methods for understanding the roles of the structures, and the state-of-the-arts materials containing the structures. In this book, the authors focus on the importance of defect complexes to improve functionality of crystals and that of orders of network structures to improve functionality of glass materials. These features can be regarded as interphases between perfect crystals and perfect amorphous, and they are the key factor for the evolution of materials science to a new dimension. The authors call such interphases "hyperordered structures" in this book. This is the first book that comprehensively summarizes glass science, defect science, and quantum beam science. It is valuable not only for active researchers in industry and academia but also graduate students.
Author: Uri Shmueli
Publisher: Springer Science & Business Media
ISBN: 9781402082054
Category : Science
Languages : en
Pages : 704
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Book Description
International Tables for Crystallography are no longer available for purchase from Springer. For further information please contact Wiley Inc. (follow the link on the right hand side of this page). Volume B presents accounts of the numerous aspects of reciprocal space in crystallographic research. After an introductory chapter, Part 1 presents the reader with an account of structure-factor formalisms, an extensive treatment of the theory, algorithms and crystallographic applications of Fourier methods, and fundamental as well as advanced treatments of symmetry in reciprocal space. In Part 2, these general accounts are followed by detailed expositions of crystallographic statistics, the theory of direct methods, Patterson techniques, isomorphous replacement and anomalous scattering, and treatments of the role of electron microscopy and diffraction in crystal structure determination, including applications of direct methods to electron crystallography. Part 3 deals with applications of reciprocal space to molecular geometry and `best'-plane calculations, and contains a treatment of the principles of molecular graphics and modelling and their applications. A convergence-acceleration method of importance in the computation of approximate lattice sums is presented and the part concludes with a discussion of the Ewald method. Part 4 contains treatments of various diffuse-scattering phenomena arising from crystal dynamics, disorder and low dimensionality (liquid crystals), and an exposition of the underlying theories and/or experimental evidence. Polymer crystallography and reciprocal-space images of aperiodic crystals are also treated. Part 5 of the volume contains introductory treatments of the theory of the interaction of radiation with matter (dynamical theory) as applied to X-ray, electron and neutron diffraction techniques. The simplified trigonometric expressions for the structure factors in the 230 three-dimensional space groups, which appeared in Volume I of International Tables for X-ray Crystallography, are now given in Appendix 1.4.3 to Chapter 1.4 of this volume. Volume B is a vital addition to the library of scientists engaged in crystal structure determination, crystallographic computing, crystal physics and other fields of crystallographic research. Graduate students specializing in crystallography will find much material suitable for self-study and a rich source of references to the relevant literature.
Author: Alexander V. Kolobov
Publisher: Springer Science & Business Media
ISBN: 3642287050
Category : Technology & Engineering
Languages : en
Pages : 288
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Book Description
A state-of-the-art description of metastability observed in chalcogenide alloys is presented with the accent on the underlying physics. A comparison is made between sulphur(selenium)-based chalcogenide glasses, where numerous photo-induced phenomena take place entirely within the amorphous phase, and tellurides where a reversible crystal-to-amorphous phase-change transformation is a major effect. Applications of metastability in devices¿optical memories and nonvolatile electronic phase-change random-access memories among others are discussed, including the latest trends. Background material essential for understanding current research in the field is also provided.
Author: Takeshi Egami
Publisher: Elsevier
ISBN: 0080543383
Category : Technology & Engineering
Languages : en
Pages : 423
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Book Description
* Introducing a unique method to study the atomic structure of nano-materials* Award winning research. Takeshi Egami received the 2003 Eugene Bertram Warren Diffraction Physics Award for the work described in the book.This book focuses on the structural determination of crystalline solids with extensive disorder. Well-established methods exist for characterizing the structure of fully crystalline solids or fully disordered materials such as liquids and glasses, but there is a dearth of techniques for the cases in-between, crystalline solids with internal atomic and nanometer scale disorder. Egami and Billinge discuss how to fill the gap using modern tools of structural characterization. While this subject might sound rather narrow, the fact is that today this problem is encountered in the structural characterization of a surprisingly wide range of complex materials of interest to modern technology and is becoming increasingly important.
Author: A. Gonis
Publisher: Springer Science & Business Media
ISBN: 1475737602
Category : Science
Languages : en
Pages : 413
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Book Description
This is the second in a series of "International Workshops on Electron Correlations and Materials Properties. " The aim of this series of workshops is to provide a periodic (triennial) and in-depth assessment of advances in the study and understanding of the effects that electron-electron interactions in solids have on the determination of measurable properties of materials. The workshop is structured to include exposure to experimental work, to phenomenology, and to ab initio theory. Since correlation effects are pervasive the workshop aims to concentrate on the identification of promising developing methodology, experimental and theoretical, addressing the most critical frontier issues of electron correlations on the properties of materials. This series of workshops is distinguished from other topical meetings and conferences in that it strongly promotes an interdisciplinary approach to the study of correlations, involving the fields of quantum chemistry, physics, and materials science. The First Workshop was held June 28-July 3, 1998, and a proceedings of the workshop was published by KluwerlPlenum. The Second Workshop was held June 24- 29,2001, and this volume contains the proceedings of that scientific meeting. Through the publications of proceedings, the workshop attempts to disseminate the information gathered during the discussions held at the Workshop to the wider scientific community, and to establish a record of advances in the field.
Author: J.C. Phillips
Publisher: Springer Science & Business Media
ISBN: 0306471132
Category : Science
Languages : en
Pages : 455
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Book Description
Advances in nanoscale science show that the properties of many materials are dominated by internal structures. In molecular cases, such as window glass and proteins, these internal structures obviously have a network character. However, in many partly disordered electronic materials, almost all attempts at understanding are based on traditional continuum models. This workshop focuses first on the phase diagrams and phase transitions of materials known to be composed of molecular networks. These phase properties characteristically contain remarkable features, such as intermediate phases that lead to reversibility windows in glass transitions as functions of composition. These features arise as a result of self-organization of the internal structures of the intermediate phases. In the protein case, this self-organization is the basis for protein folding. The second focus is on partly disordered electronic materials whose phase properties exhibit the same remarkable features. In fact, the phenomenon of High Temperature Superconductivity, discovered by Bednorz and Mueller in 1986, and now the subject of 75,000 research papers, also arises from such an intermediate phase. More recently discovered electronic phenomena, such as giant magnetoresistance, also are made possible only by the existence of such special phases. This book gives an overview of the methods and results obtained so far by studying the characteristics and properties of nanoscale self-organized networks. It demonstrates the universality of the network approach over a range of disciplines, from protein folding to the newest electronic materials.
Author: Nan Yao
Publisher: Springer Science & Business Media
ISBN: 1402080069
Category : Technology & Engineering
Languages : en
Pages : 745
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Book Description
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Author: Hideo Aoki
Publisher: Cambridge University Press
ISBN: 9780521643429
Category : Science
Languages : en
Pages : 426
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Book Description
Leading international researchers discuss the application of condensed matter physics to mineralogy and crystallography.
