Author: Navid Asadizanjani
Publisher: Elsevier
ISBN: 0443185433
Category : Technology & Engineering
Languages : en
Pages : 224
Book Description
Materials for Electronics Security and Assurance reviews the properties of materials that could enable devices that are resistant to tampering and manipulation. The book discusses recent advances in materials synthesis and characterization techniques for security applications. Topics addressed include anti-reverse engineering, detection, prevention, track and trace, fingerprinting, obfuscation, and how materials could enable these security solutions. The book introduces opportunities and challenges and provides a clear direction of the requirements for material-based solutions to address electronics security challenges. It is suitable for materials scientists and engineers who seek to enable future research directions, current computer and hardware security engineers who want to enable materials selection, and as a way to inspire cross-collaboration between both communities. - Discusses materials as enablers to provide electronics assurance, counterfeit detection/protection, and fingerprinting - Provides an overview of benefits and challenges of materials-based security solutions to inspire future materials research directions - Includes an introduction to material perspectives on hardware security to enable cross collaboration between materials, design, and testing
Materials for Electronics Security and Assurance
Author: Navid Asadizanjani
Publisher: Elsevier
ISBN: 0443185433
Category : Technology & Engineering
Languages : en
Pages : 224
Book Description
Materials for Electronics Security and Assurance reviews the properties of materials that could enable devices that are resistant to tampering and manipulation. The book discusses recent advances in materials synthesis and characterization techniques for security applications. Topics addressed include anti-reverse engineering, detection, prevention, track and trace, fingerprinting, obfuscation, and how materials could enable these security solutions. The book introduces opportunities and challenges and provides a clear direction of the requirements for material-based solutions to address electronics security challenges. It is suitable for materials scientists and engineers who seek to enable future research directions, current computer and hardware security engineers who want to enable materials selection, and as a way to inspire cross-collaboration between both communities. - Discusses materials as enablers to provide electronics assurance, counterfeit detection/protection, and fingerprinting - Provides an overview of benefits and challenges of materials-based security solutions to inspire future materials research directions - Includes an introduction to material perspectives on hardware security to enable cross collaboration between materials, design, and testing
Publisher: Elsevier
ISBN: 0443185433
Category : Technology & Engineering
Languages : en
Pages : 224
Book Description
Materials for Electronics Security and Assurance reviews the properties of materials that could enable devices that are resistant to tampering and manipulation. The book discusses recent advances in materials synthesis and characterization techniques for security applications. Topics addressed include anti-reverse engineering, detection, prevention, track and trace, fingerprinting, obfuscation, and how materials could enable these security solutions. The book introduces opportunities and challenges and provides a clear direction of the requirements for material-based solutions to address electronics security challenges. It is suitable for materials scientists and engineers who seek to enable future research directions, current computer and hardware security engineers who want to enable materials selection, and as a way to inspire cross-collaboration between both communities. - Discusses materials as enablers to provide electronics assurance, counterfeit detection/protection, and fingerprinting - Provides an overview of benefits and challenges of materials-based security solutions to inspire future materials research directions - Includes an introduction to material perspectives on hardware security to enable cross collaboration between materials, design, and testing
ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher: ASM International
ISBN: 1615030905
Category : Technology & Engineering
Languages : en
Pages : 372
Book Description
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
Publisher: ASM International
ISBN: 1615030905
Category : Technology & Engineering
Languages : en
Pages : 372
Book Description
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
Istfa '98
Author: ASM International
Publisher: ASM International
ISBN: 161503076X
Category : Technology & Engineering
Languages : en
Pages : 453
Book Description
Publisher: ASM International
ISBN: 161503076X
Category : Technology & Engineering
Languages : en
Pages : 453
Book Description
Understanding Logic Locking
Author: Kimia Zamiri Azar
Publisher: Springer Nature
ISBN: 3031379896
Category : Technology & Engineering
Languages : en
Pages : 385
Book Description
This book demonstrates the breadth and depth of IP protection through logic locking, considering both attacker/adversary and defender/designer perspectives. The authors draw a semi-chronological picture of the evolution of logic locking during the last decade, gathering and describing all the DO’s and DON’Ts in this approach. They describe simple-to-follow scenarios and guide readers to navigate/identify threat models and design/evaluation flow for further studies. Readers will gain a comprehensive understanding of all fundamentals of logic locking.
Publisher: Springer Nature
ISBN: 3031379896
Category : Technology & Engineering
Languages : en
Pages : 385
Book Description
This book demonstrates the breadth and depth of IP protection through logic locking, considering both attacker/adversary and defender/designer perspectives. The authors draw a semi-chronological picture of the evolution of logic locking during the last decade, gathering and describing all the DO’s and DON’Ts in this approach. They describe simple-to-follow scenarios and guide readers to navigate/identify threat models and design/evaluation flow for further studies. Readers will gain a comprehensive understanding of all fundamentals of logic locking.
Hardware Security
Author: Mark Tehranipoor
Publisher: Springer Nature
ISBN: 3031586875
Category :
Languages : en
Pages : 538
Book Description
Publisher: Springer Nature
ISBN: 3031586875
Category :
Languages : en
Pages : 538
Book Description
Embedded Artificial Intelligence
Author: Ovidiu Vermesan
Publisher: CRC Press
ISBN: 1000881911
Category : Computers
Languages : en
Pages : 143
Book Description
Recent technological developments in sensors, edge computing, connectivity, and artificial intelligence (AI) technologies have accelerated the integration of data analysis based on embedded AI capabilities into resource-constrained, energy-efficient hardware devices for processing information at the network edge. Embedded AI combines embedded machine learning (ML) and deep learning (DL) based on neural networks (NN) architectures such as convolutional NN (CNN), or spiking neural network (SNN) and algorithms on edge devices and implements edge computing capabilities that enable data processing and analysis without optimised connectivity and integration, allowing users to access data from various sources. Embedded AI efficiently implements edge computing and AI processes on resource-constrained devices to mitigate downtime and service latency, and it successfully merges AI processes as a pivotal component in edge computing and embedded system devices. Embedded AI also enables users to reduce costs, communication, and processing time by assembling data and by supporting user requirements without the need for continuous interaction with physical locations. This book provides an overview of the latest research results and activities in industrial embedded AI technologies and applications, based on close cooperation between three large-scale ECSEL JU projects, AI4DI, ANDANTE, and TEMPO. The book’s content targets researchers, designers, developers, academics, post-graduate students and practitioners seeking recent research on embedded AI. It combines the latest developments in embedded AI, addressing methodologies, tools, and techniques to offer insight into technological trends and their use across different industries.
Publisher: CRC Press
ISBN: 1000881911
Category : Computers
Languages : en
Pages : 143
Book Description
Recent technological developments in sensors, edge computing, connectivity, and artificial intelligence (AI) technologies have accelerated the integration of data analysis based on embedded AI capabilities into resource-constrained, energy-efficient hardware devices for processing information at the network edge. Embedded AI combines embedded machine learning (ML) and deep learning (DL) based on neural networks (NN) architectures such as convolutional NN (CNN), or spiking neural network (SNN) and algorithms on edge devices and implements edge computing capabilities that enable data processing and analysis without optimised connectivity and integration, allowing users to access data from various sources. Embedded AI efficiently implements edge computing and AI processes on resource-constrained devices to mitigate downtime and service latency, and it successfully merges AI processes as a pivotal component in edge computing and embedded system devices. Embedded AI also enables users to reduce costs, communication, and processing time by assembling data and by supporting user requirements without the need for continuous interaction with physical locations. This book provides an overview of the latest research results and activities in industrial embedded AI technologies and applications, based on close cooperation between three large-scale ECSEL JU projects, AI4DI, ANDANTE, and TEMPO. The book’s content targets researchers, designers, developers, academics, post-graduate students and practitioners seeking recent research on embedded AI. It combines the latest developments in embedded AI, addressing methodologies, tools, and techniques to offer insight into technological trends and their use across different industries.
ISTFA 2012
Author: ASM International
Publisher: ASM International
ISBN: 1615039953
Category : Technology & Engineering
Languages : en
Pages : 643
Book Description
Publisher: ASM International
ISBN: 1615039953
Category : Technology & Engineering
Languages : en
Pages : 643
Book Description
ISTFA 2000
Author: ASM International
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 610
Book Description
Proceedings of the 2000 International Symposium for Testing and Failure Analysis, held 12th-16th November, 2000, at Meydenbauer Convention Center, Belvue, Washington. These proceedings present in-depth coverage of the latest developments and the most advanced techniques for testing and failure analysis of microelectronic components. The book covers the full spectrum of failure analysis topics, but with special emphasis on backside (flipchip) failure analysis and the diagnosis of high-end microchip failures, by analyzing the silicon. Contents: Advanced Techniques; Packaging; Testing and Yield Enhancement; Backside Analysis; New Techniques; Case Histories; Focused Ion Beam Analysis; Scanning Probe Microscopy Analysis. The CD-ROMAs PDF-file format can be accessed using Adobe Acrobat Reader 4.0 or higher.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 610
Book Description
Proceedings of the 2000 International Symposium for Testing and Failure Analysis, held 12th-16th November, 2000, at Meydenbauer Convention Center, Belvue, Washington. These proceedings present in-depth coverage of the latest developments and the most advanced techniques for testing and failure analysis of microelectronic components. The book covers the full spectrum of failure analysis topics, but with special emphasis on backside (flipchip) failure analysis and the diagnosis of high-end microchip failures, by analyzing the silicon. Contents: Advanced Techniques; Packaging; Testing and Yield Enhancement; Backside Analysis; New Techniques; Case Histories; Focused Ion Beam Analysis; Scanning Probe Microscopy Analysis. The CD-ROMAs PDF-file format can be accessed using Adobe Acrobat Reader 4.0 or higher.
Machine Learning Support for Fault Diagnosis of System-on-Chip
Author: Patrick Girard
Publisher: Springer Nature
ISBN: 3031196392
Category : Technology & Engineering
Languages : en
Pages : 320
Book Description
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
Publisher: Springer Nature
ISBN: 3031196392
Category : Technology & Engineering
Languages : en
Pages : 320
Book Description
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
CAD for Hardware Security
Author: Farimah Farahmandi
Publisher: Springer Nature
ISBN: 3031268962
Category : Technology & Engineering
Languages : en
Pages : 415
Book Description
This book provides an overview of current hardware security problems and highlights how these issues can be efficiently addressed using computer-aided design (CAD) tools. Authors are from CAD developers, IP developers, SOC designers as well as SoC verification experts. Readers will gain a comprehensive understanding of SoC security vulnerabilities and how to overcome them, through an efficient combination of proactive countermeasures and a wide variety of CAD solutions.
Publisher: Springer Nature
ISBN: 3031268962
Category : Technology & Engineering
Languages : en
Pages : 415
Book Description
This book provides an overview of current hardware security problems and highlights how these issues can be efficiently addressed using computer-aided design (CAD) tools. Authors are from CAD developers, IP developers, SOC designers as well as SoC verification experts. Readers will gain a comprehensive understanding of SoC security vulnerabilities and how to overcome them, through an efficient combination of proactive countermeasures and a wide variety of CAD solutions.