Ion Spectroscopies for Surface Analysis PDF Download
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Author: Alvin W. Czanderna
Publisher: Springer Science & Business Media
ISBN: 1461537088
Category : Science
Languages : en
Pages : 479
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Book Description
Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.
Author: Alvin W. Czanderna
Publisher: Springer Science & Business Media
ISBN: 1461537088
Category : Science
Languages : en
Pages : 479
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Book Description
Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.
Author: John F. Watts
Publisher: John Wiley & Sons
ISBN: 1119417643
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Author: John O'Connor
Publisher: Springer Science & Business Media
ISBN: 9783540413301
Category : Science
Languages : en
Pages : 626
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Book Description
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
Author: David Briggs
Publisher: Im Publications
ISBN: 9781901019049
Category : Electron spectroscopy
Languages : en
Pages : 899
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Book Description
Author: John C. Vickerman
Publisher: John Wiley & Sons
ISBN: 1119965519
Category : Technology & Engineering
Languages : en
Pages : 690
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Book Description
This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
Author: J. R. Cuthill
Publisher: ASTM International
ISBN:
Category : Metallography
Languages : en
Pages : 156
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Book Description
Author: Gabor A. Somorjai
Publisher: John Wiley & Sons
ISBN: 047050823X
Category : Science
Languages : en
Pages : 804
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Book Description
Now updated-the current state of development of modern surface science Since the publication of the first edition of this book, molecular surface chemistry and catalysis science have developed rapidly and expanded into fields where atomic scale and molecular information were previously not available. This revised edition of Introduction to Surface Chemistry and Catalysis reflects this increase of information in virtually every chapter. It emphasizes the modern concepts of surface chemistry and catalysis uncovered by breakthroughs in molecular-level studies of surfaces over the past three decades while serving as a reference source for data and concepts related to properties of surfaces and interfaces. The book opens with a brief history of the evolution of surface chemistry and reviews the nature of various surfaces and interfaces encountered in everyday life. New research in two crucial areas-nanomaterials and polymer and biopolymer interfaces-is emphasized, while important applications in tribology and catalysis, producing chemicals and fuels with high turnover and selectivity, are addressed. The basic concepts surrounding various properties of surfaces such as structure, thermodynamics, dynamics, electrical properties, and surface chemical bonds are presented. The techniques of atomic and molecular scale studies of surfaces are listed with references to up-to-date review papers. For advanced readers, this book covers recent developments in in-situ surface analysis such as high- pressure scanning tunneling microscopy, ambient pressure X-ray photoelectron spectroscopy, and sum frequency generation vibrational spectroscopy (SFG). Tables listing surface structures and data summarizing the kinetics of catalytic reactions over metal surfaces are also included. New to this edition: A discussion of new physical and chemical properties of nanoparticles Ways to utilize new surface science techniques to study properties of polymers, reaction intermediates, and mobility of atoms and molecules at surfaces Molecular-level studies on the origin of the selectivity for several catalytic reactions A microscopic understanding of mechanical properties of surfaces Updated tables of experimental data A new chapter on "soft" surfaces, polymers, and biointerfaces Introduction to Surface Chemistry and Catalysis serves as a textbook for undergraduate and graduate students taking advanced courses in physics, chemistry, engineering, and materials science, as well as researchers in surface science, catalysis science, and their applications.
Author: Graham C. Smith
Publisher: Springer Science & Business Media
ISBN: 1489909672
Category : Science
Languages : en
Pages : 165
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Book Description
This book is t~e fifth in aseries of scientific textbooks designed to cover advances in selected research fields from a basic and general view point. The reader is taken carefully but rapidly through the introductory material in order that t~e significance of recent developments can be understood with only limited initial knowledge. The inclusion in the Appendix of the abstracts of many of the more important papers in the field provides further assistance for the non-specialist, and acts as aspringboard to supplementary reading for those who wish to consult the original liter ature. Surface analysis has been the subject of numerous books and review articles, and the fundamental scientific principles of t~e more popular techniques are now reasonably weIl established. This book is concerned with the very powerful techniques of Auger electron and X-ray photoelectron spectroscopy (AES and XPS), with an emphasis on how they may be performed as part of a modern analytical facility. Since the development of AES and XPS in the late 1960s and early 1970s there have been great strides forward in the sensitivities and resolutions of the instrumentation. Simultaneously, these spectroscopies have undergone a veritable explosion, both in their acceptance alongside more routine ana1ytical techniques and in the range of problems and materials to which they are applied. As a result, many researchers in industry and in academia now come into contact with AES and XPS not as specialists, but as users.
Author: Tery Lynn Barr
Publisher: ASTM International
ISBN: 9780803102774
Category : Science
Languages : en
Pages : 220
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Book Description
Author: Rajiv Kohli
Publisher: Elsevier
ISBN: 0815516851
Category : Science
Languages : en
Pages : 1209
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Book Description
Surface contamination is of cardinal importance in a host of technologies and industries, ranging from microelectronics to optics to automotive to biomedical. Thus, the need to understand the causes of surface contamination and their removal is very patent. Generally speaking, there are two broad categories of surface contaminants: film-type and particulates. In the world of shrinking dimensions, such as the ever-decreasing size of microelectronic devices, there is an intensified need to understand the behavior of nanoscale particles and to devise ways to remove them to an acceptable level. Particles which were functionally innocuous a few years ago are ôkiller defectsö today, with serious implications for yield and reliability of the components. This book addresses the sources, detection, characterization and removal of both kinds of contaminants, as well as ways to prevent surfaces from being contaminated. A number of techniques to monitor the level of cleanliness are also discussed. Special emphasis is placed on the behaviour of nanoscale particles. The book is amply referenced and profusely illustrated.• Excellent reference for a host of technologies and industries ranging from microelectronics to optics to automotive to biomedical.• A single source document addressing everything from the sources of contamination to their removal and prevention.• Amply referenced and profusely illustrated.
