Author: Jean M. Bennett
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 128
Book Description
Introduction to Surface Roughness and Scattering
Author: Jean M. Bennett
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 128
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 128
Book Description
Introduction to Surface Roughness and Scattering
Author:
Publisher:
ISBN: 9781557525635
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9781557525635
Category :
Languages : en
Pages :
Book Description
Light Scattering and Nanoscale Surface Roughness
Author: Alexei A. Maradudin
Publisher: Springer Science & Business Media
ISBN: 0387356592
Category : Science
Languages : en
Pages : 513
Book Description
This book covers both experimental and theoretical aspects of nanoscale light scattering and surface roughness. Topics include: spherical particles located on a substrate; surface and buried interface roughness; surface roughness of polymer thin films; magnetic and thermal fluctuations at planar surfaces; speckle patterns; scattering of electromagnetic waves from a metal; multiple wavelength light scattering; nanoroughness standards.
Publisher: Springer Science & Business Media
ISBN: 0387356592
Category : Science
Languages : en
Pages : 513
Book Description
This book covers both experimental and theoretical aspects of nanoscale light scattering and surface roughness. Topics include: spherical particles located on a substrate; surface and buried interface roughness; surface roughness of polymer thin films; magnetic and thermal fluctuations at planar surfaces; speckle patterns; scattering of electromagnetic waves from a metal; multiple wavelength light scattering; nanoroughness standards.
Surface Roughness and Scattering
Author:
Publisher:
ISBN: 9781557522610
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9781557522610
Category :
Languages : en
Pages :
Book Description
Scattering and Surface Roughness II
Author: Zu-Han Gu
Publisher: Society of Photo Optical
ISBN: 9780819428813
Category : Technology & Engineering
Languages : en
Pages : 382
Book Description
Publisher: Society of Photo Optical
ISBN: 9780819428813
Category : Technology & Engineering
Languages : en
Pages : 382
Book Description
Surface Roughness and Scattering
Author: National Science Foundation (U.S.)
Publisher:
ISBN: 9781557522610
Category : Light
Languages : en
Pages : 133
Book Description
Publisher:
ISBN: 9781557522610
Category : Light
Languages : en
Pages : 133
Book Description
Optical Scattering
Author: John C. Stover
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Theory of Wave Scattering From Random Rough Surfaces,
Author: J. A. Ogilvy
Publisher: CRC Press
ISBN:
Category : Art
Languages : en
Pages : 300
Book Description
A review of theories developed for the study of acoustic, elastic and electromagnetic wave scattering from randomly rough surfaces, and a comprehensive summary of the latest techniques. Different theories are illustrated by experimental data.With applications in radar, sonar, ultrasonics and optics this book will be invaluable to graduate students, researchers and engineers.
Publisher: CRC Press
ISBN:
Category : Art
Languages : en
Pages : 300
Book Description
A review of theories developed for the study of acoustic, elastic and electromagnetic wave scattering from randomly rough surfaces, and a comprehensive summary of the latest techniques. Different theories are illustrated by experimental data.With applications in radar, sonar, ultrasonics and optics this book will be invaluable to graduate students, researchers and engineers.
Scattering and Surface Roughness
Author: Zu-Han Gu
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819425638
Category : Science
Languages : en
Pages : 0
Book Description
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819425638
Category : Science
Languages : en
Pages : 0
Book Description
Scattering and Surface Roughness II
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description