Instrumentation, Metrology, and Standards for Nanomanufacturing IV PDF Download
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Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819482631
Category : Microfabrication
Languages : en
Pages : 178
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Book Description
Includes Proceedings Vol. 7821
Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819482631
Category : Microfabrication
Languages : en
Pages : 178
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Book Description
Includes Proceedings Vol. 7821
Author: Michael T. Postek
Publisher:
ISBN: 9780819491831
Category : Microfabrication
Languages : en
Pages : 194
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Book Description
Includes Proceedings Vol. 7821
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819487155
Category : Microfabrication
Languages : en
Pages : 132
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Book Description
Includes Proceedings Vol. 7821
Author:
Publisher:
ISBN:
Category : Microfabrication
Languages : en
Pages :
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Book Description
Author: National Science and Technology Council (U.S.). Interagency Working Group on Manufacturing Research and Development
Publisher:
ISBN:
Category : Metrology
Languages : en
Pages : 131
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Book Description
Author: Günter Wilkening
Publisher: John Wiley & Sons
ISBN: 3527606874
Category : Technology & Engineering
Languages : en
Pages : 541
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Book Description
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Author: Ichiko Misumi
Publisher:
ISBN: 9780750331913
Category : Nanotechnology
Languages : en
Pages : 0
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Book Description
The purpose of this book is to help semiconductor inspection equipment users and manufacturers understand what nano dimensional standards are used to calibrate their equipment and how to employ them effectively. Reviewing trends and developments in nanoscale standards, the book starts with an introductory overview of nanometrological standards before proceeding to detail pitch standard, step height, line width, nano particle size, and surface roughness. This book is essential for users making quantitative nanoscale measurements, be that in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications. Here the author provides an approachable understanding and application of the nanoscale standards in a practical context across a range of common nanoscale measurement modalities, including 3D, with particular emphasis on applications to AFM, an exceptional and arguably the most common technique used in nanometrology due to the ease of use and versatility of applications.
Author: Nigel Cameron
Publisher: John Wiley & Sons
ISBN: 0470165863
Category : Technology & Engineering
Languages : en
Pages : 490
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Book Description
An authoritative examination of the present and potential impact of nanoscale science and technology on modern life Because truly transformative technologies have far-reaching consequences, they always generate controversy. Establishing an effective process for identifying and understanding the broad implications of nanotechnology will advance its acceptance and success, impact the decisions of policymakers and regulatory agencies, and facilitate the development of judicious policy approaches to new technology options. Nanoscale: Issues and Perspectives for the Nano Century addresses the emerging ethical, legal, policy, business, and social issues. A compilation of provocative treatises, this reference: Covers an area of increasing research and funding Organizes topics in four sections: Policy and Perspectives; Nano Law and Regulation; Nanomedicine, Ethics, and the Human Condition; and Nano and Society: The NELSI Imperative Presents differing perspectives, with views from nanotechnology's most ardent supporters as well as its most vocal critics Includes contributions from professionals in a variety of industries and disciplines, including science, law, ethics, business, health and safety, government regulation, and policy This is a core reference for professionals dealing with nanotechnology, including scientists from academia and industry, policy makers, ethicists and social scientists, safety and risk assessment professionals, investors, and others. It is also an excellent text for students in fields that involve nanotechnology.
Author: Samir Mekid
Publisher: John Wiley & Sons
ISBN: 1119721717
Category : Technology & Engineering
Languages : en
Pages : 404
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Book Description
Metrology and Instrumentation: Practical Applications for Engineering and Manufacturing provides students and professionals with an accessible foundation in the metrology techniques, instruments, and governing standards used in mechanical engineering and manufacturing. The book opens with an overview of metrology units and scale, then moves on to explain topics such as sources of error, calibration systems, uncertainty, and dimensional, mechanical, and thermodynamic measurement systems. A chapter on tolerance stack-ups covers GD&T, ASME Y14.5-2018, and the ISO standard for general tolerances, while a chapter on digital measurements connects metrology to newer, Industry 4.0 applications.
