Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Instrumentation, Metrology, and Standards for Nanomanufacturing III
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Instrumentation, Metrology, and Standards for Nanomanufacturing IV
Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819482631
Category : Microfabrication
Languages : en
Pages : 178
Book Description
Includes Proceedings Vol. 7821
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819482631
Category : Microfabrication
Languages : en
Pages : 178
Book Description
Includes Proceedings Vol. 7821
Instrumentation, Metrology, and Standards for Nanomanufacturing
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Instrumentation, Metrology, and Standards for Nanomanufacturing II
Author: Michael T. Postek
Publisher: Society of Photo Optical
ISBN: 9780819472625
Category : Technology & Engineering
Languages : en
Pages : 200
Book Description
Includes Proceedings Vol. 7821
Publisher: Society of Photo Optical
ISBN: 9780819472625
Category : Technology & Engineering
Languages : en
Pages : 200
Book Description
Includes Proceedings Vol. 7821
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V
Author: Michael T. Postek
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819487155
Category : Microfabrication
Languages : en
Pages : 132
Book Description
Includes Proceedings Vol. 7821
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819487155
Category : Microfabrication
Languages : en
Pages : 132
Book Description
Includes Proceedings Vol. 7821
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI
Author: Michael T. Postek
Publisher:
ISBN: 9780819491831
Category : Microfabrication
Languages : en
Pages : 194
Book Description
Includes Proceedings Vol. 7821
Publisher:
ISBN: 9780819491831
Category : Microfabrication
Languages : en
Pages : 194
Book Description
Includes Proceedings Vol. 7821
Instrumentation, Metrology, and Standards for Nanomanufacturing III : 3-5 August 2009, San Diego, California, United States
Author:
Publisher:
ISBN:
Category : Microfabrication
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category : Microfabrication
Languages : en
Pages :
Book Description
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII
Author: Michael T. Postek
Publisher:
ISBN: 9780819496690
Category : Technology & Engineering
Languages : en
Pages : 110
Book Description
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Publisher:
ISBN: 9780819496690
Category : Technology & Engineering
Languages : en
Pages : 110
Book Description
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
Author: Michael T. Postek
Publisher:
ISBN: 9781628412000
Category : Microfabrication
Languages : en
Pages : 277
Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Publisher:
ISBN: 9781628412000
Category : Microfabrication
Languages : en
Pages : 277
Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Instrumentation, Metrology, and Standards for Nanotechnology
Author: National Science and Technology Council (U.S.). Interagency Working Group on Manufacturing Research and Development
Publisher:
ISBN:
Category : Metrology
Languages : en
Pages : 131
Book Description
Publisher:
ISBN:
Category : Metrology
Languages : en
Pages : 131
Book Description