Author: Bogdan MadzarPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 228
Book Description
Incremental Test Pattern Generation for Sequential Circuits
Author: Bogdan MadzarPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 228
Book Description
Test Pattern Generation using Boolean Proof Engines
Author: Rolf DrechslerPublisher: Springer Science & Business Media
ISBN: 9048123607
Category : Technology & Engineering
Languages : en
Pages : 196
Book Description
In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
Test Pattern Generation for ILA Sequential Circuits
Author: Yü FengPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 48
Book Description
An Incremental Algorithm and Hardware Accelerator for Test Pattern Generation
Author: Sang-Hoon SongPublisher:
ISBN:
Category :
Languages : en
Pages : 234
Book Description
An Approach to Test Pattern Generation for Synchronous Sequential Circuits
Author: Robert Stewart LewisPublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Performance of a Parallel Automatic Test Pattern Generation System for Sequential Circuits
Author: Jessica L. HandyPublisher:
ISBN:
Category :
Languages : en
Pages : 156
Book Description
Automatic Test Pattern Generation for Synchronous Sequential Circuits
Author: Marinus Hendrik KonijnenburgPublisher:
ISBN: 9789090120966
Category :
Languages : en
Pages : 226
Book Description
Sequential Circuit Test Pattern Generation Using Empirical Partial Scan and Distributed Computation
Author: Kee Sup KimPublisher:
ISBN:
Category :
Languages : en
Pages : 386
Book Description
Automatic test pattern generation for hierarchical sequential circuits
Author: Heinrich Theodor VierhausPublisher:
ISBN:
Category :
Languages : de
Pages : 19
Book Description
The Implementation of a Parallel Automatic Test Pattern Generation System for Sequential Circuits
Author: Donald E. EdenfeldPublisher:
ISBN:
Category :
Languages : en
Pages : 282
Book Description
