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Author: Roman Louban
Publisher: Springer Science & Business Media
ISBN: 3642006833
Category : Technology & Engineering
Languages : en
Pages : 174
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Book Description
The human ability to recognize objects on various backgrounds is amazing. Many times, industrial image processing tried to imitate this ability by its own techniques. This book discusses the recognition of defects on free-form edges and - homogeneous surfaces. My many years of experience has shown that such a task can be solved e?ciently only under particular conditions. Inevitably, the following questions must be answered: How did the defect come about? How and why is a person able to recognize a speci?c defect? In short, one needs an analysis of the process of defect creation as well as an analysis of its detection. As soon as the principle of these processes is understood, the processes can be described mathematically on the basis of an appropriate physical model and can then be captured in an algorithm for defect detection. This approach can be described as “image processing from a physicist’s perspective”. I have successfully used this approach in the development of several industrial image processingsystemsandimprovedupontheminthecourseoftime.Iwouldlike to present the achieved results in a hands-on book on the basis of edge-based algorithms for defect detection on edges and surfaces. I would like to thank all who have supported me in writing this book.
Author: Roman Louban
Publisher: Springer Science & Business Media
ISBN: 3642006833
Category : Technology & Engineering
Languages : en
Pages : 174
Get Book Here
Book Description
The human ability to recognize objects on various backgrounds is amazing. Many times, industrial image processing tried to imitate this ability by its own techniques. This book discusses the recognition of defects on free-form edges and - homogeneous surfaces. My many years of experience has shown that such a task can be solved e?ciently only under particular conditions. Inevitably, the following questions must be answered: How did the defect come about? How and why is a person able to recognize a speci?c defect? In short, one needs an analysis of the process of defect creation as well as an analysis of its detection. As soon as the principle of these processes is understood, the processes can be described mathematically on the basis of an appropriate physical model and can then be captured in an algorithm for defect detection. This approach can be described as “image processing from a physicist’s perspective”. I have successfully used this approach in the development of several industrial image processingsystemsandimprovedupontheminthecourseoftime.Iwouldlike to present the achieved results in a hands-on book on the basis of edge-based algorithms for defect detection on edges and surfaces. I would like to thank all who have supported me in writing this book.
Author: C. H. Chen
Publisher: World Scientific
ISBN: 9814343005
Category : Computers
Languages : en
Pages : 508
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Book Description
This book gives a comprehensive overview of the most advanced theories, methodologies and applications in computer vision. Particularly, it gives an extensive coverage of 3D and robotic vision problems. Example chapters featured are Fourier methods for 3D surface modeling and analysis, use of constraints for calibration-free 3D Euclidean reconstruction, novel photogeometric methods for capturing static and dynamic objects, performance evaluation of robot localization methods in outdoor terrains, integrating 3D vision with force/tactile sensors, tracking via in-floor sensing, self-calibration of camera networks, etc. Some unique applications of computer vision in marine fishery, biomedical issues, driver assistance, are also highlighted.
Author: J. Doneker
Publisher: Routledge
ISBN: 1351456466
Category : Science
Languages : en
Pages : 552
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Book Description
Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
Author: Roman Louban
Publisher: Springer
ISBN: 9783642007590
Category : Technology & Engineering
Languages : en
Pages : 168
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Book Description
The human ability to recognize objects on various backgrounds is amazing. Many times, industrial image processing tried to imitate this ability by its own techniques. This book discusses the recognition of defects on free-form edges and - homogeneous surfaces. My many years of experience has shown that such a task can be solved e?ciently only under particular conditions. Inevitably, the following questions must be answered: How did the defect come about? How and why is a person able to recognize a speci?c defect? In short, one needs an analysis of the process of defect creation as well as an analysis of its detection. As soon as the principle of these processes is understood, the processes can be described mathematically on the basis of an appropriate physical model and can then be captured in an algorithm for defect detection. This approach can be described as “image processing from a physicist’s perspective”. I have successfully used this approach in the development of several industrial image processingsystemsandimprovedupontheminthecourseoftime.Iwouldlike to present the achieved results in a hands-on book on the basis of edge-based algorithms for defect detection on edges and surfaces. I would like to thank all who have supported me in writing this book.
Author: Management Association, Information Resources
Publisher: IGI Global
ISBN: 1522552057
Category : Computers
Languages : en
Pages : 2494
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Book Description
The fields of computer vision and image processing are constantly evolving as new research and applications in these areas emerge. Staying abreast of the most up-to-date developments in this field is necessary in order to promote further research and apply these developments in real-world settings. Computer Vision: Concepts, Methodologies, Tools, and Applications is an innovative reference source for the latest academic material on development of computers for gaining understanding about videos and digital images. Highlighting a range of topics, such as computational models, machine learning, and image processing, this multi-volume book is ideally designed for academicians, technology professionals, students, and researchers interested in uncovering the latest innovations in the field.
Author: Donald O. Thompson
Publisher: Springer Science & Business Media
ISBN: 1461303834
Category : Technology & Engineering
Languages : en
Pages : 2348
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Book Description
These Proceedings, consisting of Parts A and B, contain the edited versions of most of the papers presented at the annual Review of Progress in Quantitative Nondestructive Evaluation held at the University of Washington, Seattle on July 30 to August 4, 1995. The Review was organized by the Center for NDE at Iowa State University, in cooperation with the Ames Laboratory of the USDOE, the American Society of Nondestructive Testing, the Department of Energy, the National Institute of Standards and Technology, the Federal Aviation Administration, the National Science Foundation IndustryiUniversity Cooperative Research Centers, and the Working Group in Quantitative NDE. This year's Review of Progress in QNDE was attended by approximately 450 participants from the US and many foreign countries who presented over 375 papers. The meeting was divided into 36 sessions with as many as four sessions running concurrently. The Review covered all phases of NDE research and development from fundamental investigations to engineering applications or inspection systems, and it included many important methods of inspection science from acoustics to x-rays. In the last several years, the Review has stabilized at about its current size. Most participants seem to agree it is large enough to permit a full-scale overview of the latest developments but still small enough to retain the collegial atmosphere which has marked the Review since its inception. The Proceedings are structured in a format to reflect the organization of the Review itself, producing a more logical organization for both the meeting and the present volume.
Author: Limin Jia
Publisher: Springer
ISBN: 9811079897
Category : Technology & Engineering
Languages : en
Pages : 995
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Book Description
The proceedings collect the latest research trends, methods and experimental results in the field of electrical and information technologies for rail transportation. The topics cover novel traction drive technologies of rail transportation, safety technology of rail transportation system, rail transportation information technology, rail transportation operational management technology, rail transportation cutting-edge theory and technology etc. The proceedings can be a valuable reference work for researchers and graduate students working in rail transportation, electrical engineering and information technologies.
Author: Sergei N. Magonov
Publisher: John Wiley & Sons
ISBN: 3527615105
Category : Technology & Engineering
Languages : en
Pages : 335
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Book Description
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.
Author: Wang, Limeng
Publisher: KIT Scientific Publishing
ISBN: 3731502399
Category : Technology & Engineering
Languages : en
Pages : 134
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Book Description
This work presents two image-based inspection approaches for the quality evaluation of cylinder bore surfaces. In the first algorithm, metal folds on plateau-honed surfaces are inspected with scanning electron microscopy. An edge-aware structure tensor is proposed for feature extraction and localization of surface defects. The second algorithm uses a morphgraphical method for detecting graphite grains in optical micrographs. Based on the inspection results, quality parameters are proposed.
Author: Aboul Ella Hassanien
Publisher: Springer Nature
ISBN: 3031206010
Category : Technology & Engineering
Languages : en
Pages : 844
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Book Description
This proceedings book constitutes the refereed proceedings of the 8th International Conference on Advanced Intelligent Systems and Informatics (AISI 2021), which took place in Cairo, Egypt, during November 20–22, 2022, and is an international interdisciplinary conference that presents a spectrum of scientific research on all aspects of informatics and intelligent systems, technologies, and applications.
