IEEE Std 1181-1991 PDF Download
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ISBN: 9780738123882
Category :
Languages : en
Pages :
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Author:
Publisher:
ISBN: 9780738123882
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Institute of Electrical and Electronics Engineers
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 164
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Author: Ming-Dou Ker
Publisher: John Wiley & Sons
ISBN: 0470824085
Category : Technology & Engineering
Languages : en
Pages : 265
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Book Description
The book all semiconductor device engineers must read to gain a practical feel for latchup-induced failure to produce lower-cost and higher-density chips. Transient-Induced Latchup in CMOS Integrated Circuits equips the practicing engineer with all the tools needed to address this regularly occurring problem while becoming more proficient at IC layout. Ker and Hsu introduce the phenomenon and basic physical mechanism of latchup, explaining the critical issues that have resurfaced for CMOS technologies. Once readers can gain an understanding of the standard practices for TLU, Ker and Hsu discuss the physical mechanism of TLU under a system-level ESD test, while introducing an efficient component-level TLU measurement setup. The authors then present experimental methodologies to extract safe and area-efficient compact layout rules for latchup prevention, including layout rules for I/O cells, internal circuits, and between I/O and internal circuits. The book concludes with an appendix giving a practical example of extracting layout rules and guidelines for latchup prevention in a 0.18-micrometer 1.8V/3.3V silicided CMOS process. Presents real cases and solutions that occur in commercial CMOS IC chips Equips engineers with the skills to conserve chip layout area and decrease time-to-market Written by experts with real-world experience in circuit design and failure analysis Distilled from numerous courses taught by the authors in IC design houses worldwide The only book to introduce TLU under system-level ESD and EFT tests This book is essential for practicing engineers involved in IC design, IC design management, system and application design, reliability, and failure analysis. Undergraduate and postgraduate students, specializing in CMOS circuit design and layout, will find this book to be a valuable introduction to real-world industry problems and a key reference during the course of their careers.
Author: Institute of Electrical and Electronics Engineers
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Computers
Languages : en
Pages : 1304
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Book Description
Früher u.d.T.: Institute of Electrical and Electronics Engineers: The new IEEE standard dictionary of electrical and electronics terms.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 248
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Book Description
Author: Andrew R. Hileman
Publisher: CRC Press
ISBN: 9781420052015
Category : Technology & Engineering
Languages : en
Pages : 788
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Book Description
This detailed and comprehensive reference presents the latest developments in power system insulation coordination—emphasizing the achievement of optimum insulation strength at minimum cost. Comprehensively covering a myriad of insulation coordination techniques, the book examines electrical transmission and distribution lines and substations. Supplemented with end-of-chapter problem sets and over 1700 literature citations, tables, drawings, and equations, the book focuses on the conventional (or deterministic) method of insulation coordination, as well as the probabilistic method with its emphasis on statistical analysis.
Author: Fei Yuan
Publisher: CRC Press
ISBN: 0429017707
Category : Computers
Languages : en
Pages : 154
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Book Description
The book addresses the need to investigate new approaches to lower energy requirement in multiple application areas and serves as a guide into emerging circuit technologies. It explores revolutionary device concepts, sensors, and associated circuits and architectures that will greatly extend the practical engineering limits of energy-efficient computation. The book responds to the need to develop disruptive new system architecutres, circuit microarchitectures, and attendant device and interconnect technology aimed at achieving the highest level of computational energy efficiency for general purpose computing systems. Features Discusses unique technologies and material only available in specialized journal and conferences Covers emerging applications areas, such as ultra low power communications, emerging bio-electronics, and operation in extreme environments Explores broad circuit operation, ex. analog, RF, memory, and digital circuits Contains practical applications in the engineering field, as well as graduate studies Written by international experts from both academia and industry
Author: Vojin G. Oklobdzija
Publisher: Springer Science & Business Media
ISBN: 0387340475
Category : Technology & Engineering
Languages : en
Pages : 342
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Book Description
Written by the world’s most prominent microprocessor design leaders from industry and academia, this book provides complete coverage of all aspects of complex microprocessor design: technology, power management, clocking, high-performance architecture, design methodologies, memory and I/O design, computer aided design, testing and design for testability. The chapters provide state-of-the-art knowledge while including sufficient tutorial material to bring non-experts up to speed. A useful companion to design engineers working in related areas.
Author:
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 2334
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Book Description
