IEEE International Symposium on Circuits and Systems PDF Download
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Author:
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 1048
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Author:
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 1048
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Author:
Publisher:
ISBN:
Category : Electric filters
Languages : en
Pages : 536
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Author: Sanghamitra Roy
Publisher: MDPI
ISBN: 3036507205
Category : Technology & Engineering
Languages : en
Pages : 120
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Book Description
Modern society is witnessing a sea change in ubiquitous computing, in which people have embraced computing systems as an indispensable part of day-to-day existence. Computation, storage, and communication abilities of smartphones, for example, have undergone monumental changes over the past decade. However, global emphasis on creating and sustaining green environments is leading to a rapid and ongoing proliferation of edge computing systems and applications. As a broad spectrum of healthcare, home, and transport applications shift to the edge of the network, near-threshold computing (NTC) is emerging as one of the promising low-power computing platforms. An NTC device sets its supply voltage close to its threshold voltage, dramatically reducing the energy consumption. Despite showing substantial promise in terms of energy efficiency, NTC is yet to see widescale commercial adoption. This is because circuits and systems operating with NTC suffer from several problems, including increased sensitivity to process variation, reliability problems, performance degradation, and security vulnerabilities, to name a few. To realize its potential, we need designs, techniques, and solutions to overcome these challenges associated with NTC circuits and systems. The readers of this book will be able to familiarize themselves with recent advances in electronics systems, focusing on near-threshold computing.
Author:
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ISBN:
Category : Research
Languages : en
Pages : 674
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Author:
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ISBN:
Category : Electric filters
Languages : en
Pages : 602
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Author:
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ISBN:
Category : Computer engineering
Languages : en
Pages : 832
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Author:
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ISBN:
Category : Research
Languages : en
Pages : 688
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Author: Kamal Jabbour
Publisher: North Holland
ISBN:
Category : Electric circuits
Languages : en
Pages : 1488
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Book Description
Author: F. Lombardi
Publisher: Springer Science & Business Media
ISBN: 9400914172
Category : Technology & Engineering
Languages : en
Pages : 531
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Book Description
This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Author:
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 840
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Book Description
