Author:
Publisher:
ISBN:
Category : Acoustic surface waves
Languages : en
Pages : 558

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Author: Ard‚shir Guran
Publisher: World Scientific
ISBN: 9789812778536
Category : Mathematics
Languages : en
Pages : 522

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Book Description
This series of volumes constitutes an outstanding collection of contributions by the most active research workers in the area of acoustics and mechanics. It brings the reader up to date on the status of the various aspects of research in this field. The volumes should preserve their value for a long time, as they represent a monument to the achievements of human research capabilities in the underwater-acoustics aspects of the environment.

Author: Sam Stuart
Publisher: Elsevier
ISBN: 1483140539
Category : Science
Languages : en
Pages : 974

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Book Description
Ultrasonics International 87 contains the Proceedings of the Ultrasonics International Conference and Exhibition held at London, United Kingdom on July 1987. The conference discussed and reviewed some of the developments in the field of ultrasonics. The compendium consists of over 150 contributed papers, four invited papers and three plenary papers. Topics discussed include generation of unipolar ultrasonic pulses by signal processing; scattering of longitudinal waves by partially closed slots; piezoelectric materials for ultrasonic transducers; and measuring turbulent flow characteristics using a multi- dimensional ultrasonic probe. Fiber optic sensors, medical imaging and inverse methods, and laser generation of ultrasound are covered as well. Physicians, technicians, researchers, and physical scientists will find the book insightful.

Author:
Publisher:
ISBN:
Category : Acoustic surface waves
Languages : en
Pages : 572

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Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 284

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Author: J. David N. Cheeke
Publisher: CRC Press
ISBN: 143985498X
Category : Science
Languages : en
Pages : 504

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Book Description
Written at an intermediate level in a way that is easy to understand, Fundamentals and Applications of Ultrasonic Waves, Second Edition provides an up-to-date exposition of ultrasonics and some of its main applications. Designed specifically for newcomers to the field, this fully updated second edition emphasizes underlying physical concepts over mathematics. The first half covers the fundamentals of ultrasonic waves for isotropic media. Starting with bulk liquid and solid media, discussion extends to surface and plate effects, at which point the author introduces new modes such as Rayleigh and Lamb waves. This focus on only isotropic media simplifies the usually complex mathematics involved, enabling a clearer understanding of the underlying physics to avoid the complicated tensorial description characteristic of crystalline media. The second part of the book addresses a broad spectrum of industrial and research applications, including quartz crystal resonators, surface acoustic wave devices, MEMS and microacoustics, and acoustic sensors. It also provides a broad discussion on the use of ultrasonics for non-destructive evaluation. The author concentrates on the developing area of microacoustics, including exciting new work on the use of probe microscopy techniques in nanotechnology. Focusing on the physics of acoustic waves, as well as their propagation, technology, and applications, this book addresses viscoelasticity, as well as new concepts in acoustic microscopy. It updates coverage of ultrasonics in nature and developments in sonoluminescence, and it also compares new technologies, including use of atomic force acoustic microscopy and lasers. Highlighting both direct and indirect applications for readers working in neighboring disciplines, the author presents particularly important sections on the use of microacoustics and acoustic nanoprobes in next-generation devices and instruments.

Author: Maurice H. Francombe
Publisher: Academic Press
ISBN: 1483288900
Category : Technology & Engineering
Languages : en
Pages : 342

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Book Description
In this volume of the highly esteemed Physics of Thin Films serial, focused coverage is given to new trends in solid state devices. Four chapters combine to provide comprehensive discussions of magnetostatic wave phenomena in epitaxial magnetic oxide films and their applications in microwave signal processing devices: Thin-film rare earth transition metal alloys for magnetooptic recording. Two new classes of quantum well structures that have been used for infrared detectors and ultrafast resonant tunneling devices. Recent applications of Fourier transform spectroscopy for the analysis of inorganic thin solid films. This book provides a focused treatment of recent developments in novel thin film solid state components, and specifically discusses magnetic, semiconducting, and optical phenomena.

Author: Andreas Graffunder
Publisher: Springer Science & Business Media
ISBN: 3663068420
Category : Technology & Engineering
Languages : en
Pages : 180

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Book Description
Autonomous mobile systems (AMS) are systems capable of some mobility and equipped with advanced sensor devices in order to flexibly respond to changing environmental situations, thus achieving some degree of autonomy. The purpose of this book is to contribute to some essential topics in this broad research area related to sensing and control, but not to present a complete design of an AMS. Subjects conceming knowledge based control and decision, such as moving around obstacles, task planning and diagnosis are left for future publications in this series. Research in the area of AMS has grown rapidly during the last decade, see e.g. [WAXMAN et al. 87], [DICKMANNS , ZAPP 87]. The requirements of an AMS strongly depends on the desired tasks the system should execute, its operational environment and the expected speed of the AMS. For instance, road vehicles obtain velocities of 10 m/s and more, therefore the processing of sensor data such as video image sequences has to be very fast and simple, while indoor mobile robots deal with shorter distances and lower speeds, thus more sophistcated techniques are applicable and -as is done in our approach- additional sensors can be integrated to allow for multi sensor processing.

Author: A.G. Cullis
Publisher: CRC Press
ISBN: 1000157016
Category : Science
Languages : en
Pages : 836

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Book Description
The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.

Author: Cullis
Publisher: CRC Press
ISBN: 9780854981786
Category : Technology & Engineering
Languages : en
Pages : 836

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Book Description
The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.