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Author: International Business Machines Corporation
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 588
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Book Description
Author: International Business Machines Corporation
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 588
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Book Description
Author:
Publisher:
ISBN:
Category : Fluid dynamics
Languages : en
Pages : 234
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Book Description
Author: Forrest W. Breyfogle, III
Publisher: John Wiley & Sons
ISBN: 9780471540359
Category : Business & Economics
Languages : en
Pages : 556
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Book Description
Clearly illustrates how established techniques can be easily understood and used with a sample size that is smaller than normally envisioned. Provides solutions to complex industrial problems by demonstrating how to define the problem and evaluate it statistically with the aim of accelerating product design testing that requires fewer samples and offers more information with less test effort. Along with examples, it contains detailed additional material presented in tabular form for both easy reference and cross-reference.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 1072
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Book Description
Author: Hugh M. Sierra
Publisher: Elsevier
ISBN: 0323139655
Category : Computers
Languages : en
Pages : 280
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Book Description
This book presents an exposition of the technology, design, organization, and structure of direct access storage devices (disk drives). It includes a discussion of the evolution of the technology (magnetic recording) and an assessment of other storage technologies, including optical recording. Examples of codes used in past implementations of disk drives as well as an application of disk drive usage dictated by reliability considerations are also included. The presentation assumes a minimum knowledge of magnetic recording, servomechanism design, and coding.
Author: United States. Congress. House
Publisher:
ISBN:
Category :
Languages : en
Pages : 2190
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Book Description
Author: R.A. Powell
Publisher: Elsevier
ISBN: 0080983588
Category : Technology & Engineering
Languages : en
Pages : 312
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Book Description
This volume collects together for the first time a series of in-depth, critical reviews of important topics in dry etching, such as dry processing of III-V compound semiconductors, dry etching of refractory metal silicides and dry etching aluminium and aluminium alloys. This topical format provides the reader with more specialised information and references than found in a general review article. In addition, it presents a broad perspective which would otherwise have to be gained by reading a large number of individual research papers. An additional important and unique feature of this book is the inclusion of an extensive literature review of dry processing, compiled by search of computerized data bases. A subject index allows ready access to the key points raised in each of the chapters.
Author: Michael Blakeney
Publisher: CABI
ISBN: 1845935608
Category : Social Science
Languages : en
Pages : 280
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Book Description
This book examines the contribution which intellectual property rights can make in the struggle for food security in developing countries. The book consists of 11 chapters. Chapter 1 locates intellectual property rights within the armoury of food security policies. Chapter 2 deals with definitional issues and examines the role of intellectual property rights in incentivizing agricultural research and development. Chapter 3 examines the international landscape of intellectual property and the approaches taken to the relationship between intellectual property rights, agricultural biotechnology, access to biological resources, food security and globalization which are taken by the WTO, FAO, CBD and WIPO among the various international and development agencies. Plant variety rights (PVRs) are a specially created form of intellectual property right originally minted to encourage agricultural innovation and Chapter 4 examines the effectiveness of PVRs in a food security context. Agricultural innovation is in part dependent upon access of researchers to the genetic resources of the biodiverse countries of the South. Chapter 5 considers the attempts to construct an international regime to secure this access. The important role of traditional farmers in preserving landraces and cultivars from which improvements can be derived has generated for a call for the recognition of farmers' rights, and this is examined in Chapter 6 together with agitation for the protection of the traditional knowledge which often informs access to the useful genetic resources. Chapter 7 examines the intellectual property implications of the use of genetically modified (GM) crops as a technological solution to food insecurity. The protection of GM crops is achieved through patent protection and Chapter 9 looks at the competition law implications of patent licensing, patent pools and patent thickets. An old intellectual property device that underpinned the commercial development of European agricultural marketing is the geographical indication, and Chapter 8 examines the contribution it might make to achieving food security. Returning to the theme of the role of intellectual property law in incentivizing innovation, Chapter 10 examines its role in promoting agricultural research. The concluding chapter proposes a number of recommendations for action in deploying intellectual property law in the struggle for food security.
Author: K. Iwansson
Publisher: Elsevier
ISBN: 0080523978
Category : Technology & Engineering
Languages : en
Pages : 233
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Book Description
This authoritative new book focuses on recent developments in the instrumentation for sending voltages and currents. It covers new trends and challenges in the field, such as measurements of biocurrents, the increased speed of the components for data taking, testing of computers and integrated circuits where the measurement of rapid voltage and current variations on a very small geometrical scale is necessary. The first chapter concentrates on recent methods to sense voltages and currents, while the rest of the book investigates the applied side, covering for instance electrical power and energy measurements. The main purpose of this volume is to illustrate commonly employed techniques rather than track the scientific evolution and merits and therefore mainly covers patent literature aimed at industrial applications. It is an exciting addition, justifying the series' claim to cover state-of-the-art developments in both the applied and theoretical fields of sensors and actuators. The measurement of voltages and currents is a common task in the field of electricity and electronics. From a technical point of view it is useful to identify schematically different steps of such a measurement. In a first step a voltage or a current is sensed, intermediate steps such as amplification, transmission and further treatment may follow to yield the result in the final step. Today in most cases microprocessors perform the final steps of such measurements. Analog-to digital converters digitise a voltage that is proportional to the value to be measured and a processor performs further computations and handles the storage and the display of the results. The prerequisite for such measurements are sensors or transducers that respond in a known way to the voltage or current to be measured. The emphasis of this book is put on recent developments of the instrumentation for sensing voltages and currents. Aside from the general trend towards smaller, cheaper and more reliable instrumentation, new demands have arisen. New applications, like measurements of biocurrents, ask for higher sensitivities. Computers and integrated circuits pose new challenges. To exploit the increased speed of the components for data taking, suitable sensors are required. The accuracy that can be achieved depends more than ever on the first step, the acquisition of the raw data. The influence of the measurement process on the results becomes more crucial. Testing of integrated circuits themselves is a completely new application. For such tests one has to measure rapid voltage and current variations on very small geometrical scales. Here, as well as in the traditional high voltage applications, contactless measurements play an important role. The organisation of this book is as follows: In the first chapter different methods to sense voltages and currents are described. For the sake of completeness most commonly used methods are mentioned, we concentrate, however, on those developed recently. The chapters address the subject from the side of different applications in which voltages and currents are sensed. Since the main purpose of this publication is to illustrate commonly employed techniques rather than to track the scientific evolution and merits in particular fields, in general those publications that illustrate a particular measurement principle best have been cited. The citation of a particular reference does therefore not imply that this is the first or most pertinent publication in the respective field.
Author: Israel Koren
Publisher: Springer Science & Business Media
ISBN: 1461567998
Category : Computers
Languages : en
Pages : 362
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Book Description
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
