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Author: Sam Stuart
Publisher: Elsevier
ISBN: 1483138275
Category : Technology & Engineering
Languages : en
Pages : 217
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Book Description
Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use.
Author: Sam Stuart
Publisher: Elsevier
ISBN: 1483138275
Category : Technology & Engineering
Languages : en
Pages : 217
Get Book Here
Book Description
Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use.
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 412
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Book Description
Author: Defense Documentation Center (U.S.)
Publisher:
ISBN:
Category : Military art and science
Languages : en
Pages : 128
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Book Description
Author: CCPS (Center for Chemical Process Safety)
Publisher: John Wiley & Sons
ISBN: 047093834X
Category : Technology & Engineering
Languages : en
Pages : 326
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Book Description
The book supplements Guidelines for Chemical Process Quantitative Risk Analysis by providing the failure rate data needed to perform a chemical process quantitative risk analysis.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1370
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Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author: D.H. Stamatis
Publisher: CRC Press
ISBN: 1420000292
Category : Business & Economics
Languages : en
Pages : 822
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Book Description
This volume addresses design improvement from the perspective of prevention by introducing readers to the tools of the Six Sigma design process. The author discusses the issues of designing for Six Sigma, covering the topics that any Shogun Six Sigma Master must be familiar with: customer satisfaction, quality function deployment, benchmarking, sys
Author: G. W. A. Dummer
Publisher: Elsevier
ISBN: 1483185494
Category : Technology & Engineering
Languages : en
Pages : 961
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Book Description
American Microelectronics Data Annual 1964-65 provides comprehensive information on different microelectronics available in the U.S. The microelectronics covered in the text includes thin film, semiconductor, and integrated and hybrid circuit assemblies. The selection also provides an index that can be utilized for locating assemblies by the virtue of circuit function or design category. Information on the techniques essential in the practice of microelectronics is also included. The book will be of great use to student and professional electronics engineers and technicians.
Author: United States. National Aeronautics and Space Administration. Office of Reliability and Quality Assurance
Publisher:
ISBN:
Category : Quality control
Languages : en
Pages : 580
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Book Description
Author: United States. National Technical Information Service
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 32
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Book Description
Author:
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 690
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Book Description
