High Performance Multi-Channel High-Speed I/O Circuits PDF Download
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Author: Taehyoun Oh
Publisher: Springer Science & Business Media
ISBN: 1461449634
Category : Technology & Engineering
Languages : en
Pages : 91
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Book Description
This book describes design techniques that can be used to mitigate crosstalk in high-speed I/O circuits. The focus of the book is in developing compact and low power integrated circuits for crosstalk cancellation, inter-symbol interference (ISI) mitigation and improved bit error rates (BER) at higher speeds. This book is one of the first to discuss in detail the problem of crosstalk and ISI mitigation encountered as data rates have continued beyond 10Gb/s. Readers will learn to avoid the data performance cliff, with circuits and design techniques described for novel, low power crosstalk cancellation methods that are easily combined with current ISI mitigation architectures.
Author: Taehyoun Oh
Publisher: Springer Science & Business Media
ISBN: 1461449634
Category : Technology & Engineering
Languages : en
Pages : 91
Get Book Here
Book Description
This book describes design techniques that can be used to mitigate crosstalk in high-speed I/O circuits. The focus of the book is in developing compact and low power integrated circuits for crosstalk cancellation, inter-symbol interference (ISI) mitigation and improved bit error rates (BER) at higher speeds. This book is one of the first to discuss in detail the problem of crosstalk and ISI mitigation encountered as data rates have continued beyond 10Gb/s. Readers will learn to avoid the data performance cliff, with circuits and design techniques described for novel, low power crosstalk cancellation methods that are easily combined with current ISI mitigation architectures.
Author: Kyung Suk (Dan) Oh
Publisher: Prentice Hall
ISBN: 0132827115
Category : Technology & Engineering
Languages : en
Pages : 608
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Book Description
New System-Level Techniques for Optimizing Signal/Power Integrity in High-Speed Interfaces--from Pioneering Innovators at Rambus, Stanford, Berkeley, and MIT As data communication rates accelerate well into the multi-gigahertz range, ensuring signal integrity both on- and off-chip has become crucial. Signal integrity can no longer be addressed solely through improvements in package or board-level design: Diverse engineering teams must work together closely from the earliest design stages to identify the best system-level solutions. In High-Speed Signaling, several of the field’s most respected practitioners and researchers introduce cutting-edge modeling, simulation, and optimization techniques for meeting this challenge. Edited by pioneering experts Drs. Dan Oh and Chuck Yuan, these contributors explain why noise and jitter are no longer separable, demonstrate how to model their increasingly complex interactions, and thoroughly introduce a new simulation methodology for predicting link-level performance with unprecedented accuracy. The authors address signal integrity from architecture through high-volume production, thoroughly discussing design, implementation, and verification. Coverage includes New advances in passive-channel modeling, power-supply noise and jitter modeling, and system margin prediction Methodologies for balancing system voltage and timing budgets to improve system robustness in high-volume manufacturing Practical, stable formulae for converting key network parameters Improved solutions for difficult problems in the broadband modeling of interconnects Equalization techniques for optimizing channel performance Important new insights into the relationships between jitter and clocking topologies New on-chip measurement techniques for in-situ link performance testing Trends and future directions in signal integrity engineering High-Speed Signaling thoroughly introduces new techniques pioneered at Rambus and other leading high-tech companies and universities: approaches that have never before been presented with this much practical detail. It will be invaluable to everyone concerned with signal integrity, including signal and power integrity engineers, high-speed I/O circuit designers, and system-level board design engineers.
Author: Yuyu Liu
Publisher: World Scientific
ISBN: 9814478709
Category : Technology & Engineering
Languages : en
Pages : 242
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Book Description
This book explores the unique advantages and large inherent transmission capacity of optical fiber communication systems. The long-term and high-risk research challenges of optical transceivers are analyzed with a view to sustaining the seemingly insatiable demand for bandwidth. A broad coverage of topics relating to the design of high-speed optical devices and integrated circuits, oriented to low power, low cost, and small area, is discussed.Written by specialists with many years of research and engineering experience in the field of optical fiber communication, this book is essential for an audience dedicated to the development of integrated electronic systems for optical communication applications. It can also be used as a supplementary text for graduate courses on optical transceiver IC design.
Author: Behzad Razavi
Publisher: John Wiley & Sons
ISBN: 1118439457
Category : Technology & Engineering
Languages : en
Pages : 444
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Book Description
The only book on integrated circuits for optical communications that fully covers High-Speed IOs, PLLs, CDRs, and transceiver design including optical communication The increasing demand for high-speed transport of data has revitalized optical communications, leading to extensive work on high-speed device and circuit design. With the proliferation of the Internet and the rise in the speed of microprocessors and memories, the transport of data continues to be the bottleneck, motivating work on faster communication channels. Design of Integrated Circuits for Optical Communications, Second Edition deals with the design of high-speed integrated circuits for optical communication transceivers. Building upon a detailed understanding of optical devices, the book describes the analysis and design of critical building blocks, such as transimpedance and limiting amplifiers, laser drivers, phase-locked loops, oscillators, clock and data recovery circuits, and multiplexers. The Second Edition of this bestselling textbook has been fully updated with: A tutorial treatment of broadband circuits for both students and engineers New and unique information dealing with clock and data recovery circuits and multiplexers A chapter dedicated to burst-mode optical communications A detailed study of new circuit developments for optical transceivers An examination of recent implementations in CMOS technology This text is ideal for senior graduate students and engineers involved in high-speed circuit design for optical communications, as well as the more general field of wireline communications.
Author: Mohab Anis
Publisher: Springer Science & Business Media
ISBN: 9781402075292
Category : Computers
Languages : en
Pages : 248
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Book Description
Over the past decade, reducing the dynamic switching power was the main focus in many of the proposed low-power circuit techniques. At that time, the off-state leakage power was negligible compared to dynamic power. However, as technology scales into the deep-submicron regime, the increase in leakage power can no longer be neglected. Soon, the biggest challenge that SoC designers must resolve is the fact that transistors for digital and memory circuits will be more and more leaky as technology generations advance. The semiconductor industry must therefore reduce leakage current in chip designs by two orders of magnitude over the next ten years, or face an interruption in projected chip complexity. Failure to do so would make the mounting leakage current the "big stumbling block to Moore's Law". Furthermore, cooperative approaches between computer-aided design development, circuit design, and technology process must be examined. Multi-Threshold CMOS Digital Circuits Managing Leakage Power discusses the Multi-threshold voltage CMOS (MTCMOS) technology, that has emerged as an increasingly popular technique to control the escalating leakage power, while maintaining high performance. The book addresses the leakage problem in a number of designs for combinational, sequential, dynamic, and current-steering logic. Moreover, computer-aided design methodologies for designing low-leakage integrated circuits are presented. The book give an excellent survey of state-of-the-art techniques presented in the literature as well as proposed designs that minimize leakage power, while achieving high-performance. Multi-Threshold CMOS Digital Circuits Managing Leakage Power is written for students of VLSI design as well as practicing circuit designers, system designers, CAD tool developers and researchers. It assumes a basic knowledge of digital circuit design and device operation, and covers a broad range of circuit design techniques.
Author: Vazgen Melikyan
Publisher: Springer Nature
ISBN: 3031507142
Category : Technology & Engineering
Languages : en
Pages : 351
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Book Description
This book describes machine learning-based new principles, methods of design and optimization of high-speed integrated circuits, included in one electronic system, which can exchange information between each other up to 128/256/512 Gbps speed. The efficiency of methods has been proven and is described on the examples of practical designs. This will enable readers to use them in similar electronic system designs. The author demonstrates newly developed principles and methods to accelerate communication between ICs, working in non-standard operating conditions, considering signal deviation compensation with linearity self-calibration. The observed circuit types also include but are not limited to mixed-signal, high performance heterogeneous integrated circuits as well as digital cores.
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1456
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Book Description
Author: Ron Mancini
Publisher: Newnes
ISBN: 0750677015
Category : Technology & Engineering
Languages : en
Pages : 470
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Book Description
The operational amplifier ("op amp") is the most versatile and widely used type of analog IC, used in audio and voltage amplifiers, signal conditioners, signal converters, oscillators, and analog computing systems. Almost every electronic device uses at least one op amp. This book is Texas Instruments' complete professional-level tutorial and reference to operational amplifier theory and applications. Among the topics covered are basic op amp physics (including reviews of current and voltage division, Thevenin's theorem, and transistor models), idealized op amp operation and configuration, feedback theory and methods, single and dual supply operation, understanding op amp parameters, minimizing noise in op amp circuits, and practical applications such as instrumentation amplifiers, signal conditioning, oscillators, active filters, load and level conversions, and analog computing. There is also extensive coverage of circuit construction techniques, including circuit board design, grounding, input and output isolation, using decoupling capacitors, and frequency characteristics of passive components. The material in this book is applicable to all op amp ICs from all manufacturers, not just TI. Unlike textbook treatments of op amp theory that tend to focus on idealized op amp models and configuration, this title uses idealized models only when necessary to explain op amp theory. The bulk of this book is on real-world op amps and their applications; considerations such as thermal effects, circuit noise, circuit buffering, selection of appropriate op amps for a given application, and unexpected effects in passive components are all discussed in detail. *Published in conjunction with Texas Instruments *A single volume, professional-level guide to op amp theory and applications *Covers circuit board layout techniques for manufacturing op amp circuits.
Author: William J. Dally
Publisher: Cambridge University Press
ISBN: 1139936239
Category : Computers
Languages : en
Pages : 944
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Book Description
What makes some computers slow? Why do some digital systems operate reliably for years while others fail mysteriously every few hours? How can some systems dissipate kilowatts while others operate off batteries? These questions of speed, reliability, and power are all determined by the system-level electrical design of a digital system. Digital Systems Engineering presents a comprehensive treatment of these topics. It combines a rigorous development of the fundamental principles in each area with real-world examples of circuits and methods. The book not only serves as an undergraduate textbook, filling the gap between circuit design and logic design, but can also help practising digital designers keep pace with the speed and power of modern integrated circuits. The techniques described in this book, once used only in supercomputers, are essential to the correct and efficient operation of any type of digital system.
Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 0080556809
Category : Technology & Engineering
Languages : en
Pages : 893
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Book Description
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
