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Author: Debashis Bhattacharya
Publisher: Springer Science & Business Media
ISBN: 1461315271
Category : Computers
Languages : en
Pages : 168
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Book Description
Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in test generation; however, the development of such methods has proceeded very slowly. To be acceptable, high-level approaches should be applicable to most types of digital circuits, and should provide fault coverage comparable to that of traditional, low-level methods. The fault coverage problem has, perhaps, been the most intractable, due to continued reliance in the testing industry on the single stuck-line (SSL) fault model, which is tightly bound to the gate level of abstraction. This monograph presents a novel approach to solving the foregoing problem. It is based on the systematic use of multibit vectors rather than single bits to represent logic signals, including fault signals. A circuit is viewed as a collection of high-level components such as adders, multiplexers, and registers, interconnected by n-bit buses. To match this high-level circuit model, we introduce a high-level bus fault that, in effect, replaces a large number of SSL faults and allows them to be tested in parallel. However, by reducing the bus size from n to one, we can obtain the traditional gate-level circuit and models.
Author: Debashis Bhattacharya
Publisher: Springer Science & Business Media
ISBN: 1461315271
Category : Computers
Languages : en
Pages : 168
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Book Description
Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in test generation; however, the development of such methods has proceeded very slowly. To be acceptable, high-level approaches should be applicable to most types of digital circuits, and should provide fault coverage comparable to that of traditional, low-level methods. The fault coverage problem has, perhaps, been the most intractable, due to continued reliance in the testing industry on the single stuck-line (SSL) fault model, which is tightly bound to the gate level of abstraction. This monograph presents a novel approach to solving the foregoing problem. It is based on the systematic use of multibit vectors rather than single bits to represent logic signals, including fault signals. A circuit is viewed as a collection of high-level components such as adders, multiplexers, and registers, interconnected by n-bit buses. To match this high-level circuit model, we introduce a high-level bus fault that, in effect, replaces a large number of SSL faults and allows them to be tested in parallel. However, by reducing the bus size from n to one, we can obtain the traditional gate-level circuit and models.
Author: M. Bushnell
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690
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Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 88
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Book Description
Author: David P. Morgan
Publisher: Springer Science & Business Media
ISBN: 1461539501
Category : Technology & Engineering
Languages : en
Pages : 402
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Book Description
We would like to take this opportunity to thank all of those individ uals who helped us assemble this text, including the people of Lockheed Sanders and Nestor, Inc., whose encouragement and support were greatly appreciated. In addition, we would like to thank the members of the Lab oratory for Engineering Man-Machine Systems (LEMS) and the Center for Neural Science at Brown University for their frequent and helpful discussions on a number of topics discussed in this text. Although we both attended Brown from 1983 to 1985, and had offices in the same building, it is surprising that we did not meet until 1988. We also wish to thank Kluwer Academic Publishers for their profes sionalism and patience, and the reviewers for their constructive criticism. Thanks to John McCarthy for performing the final proof, and to John Adcock, Chip Bachmann, Deborah Farrow, Nathan Intrator, Michael Perrone, Ed Real, Lance Riek and Paul Zemany for their comments and assistance. We would also like to thank Khrisna Nathan, our most unbi ased and critical reviewer, for his suggestions for improving the content and accuracy of this text. A special thanks goes to Steve Hoffman, who was instrumental in helping us perform the experiments described in Chapter 9.
Author: Rob A. Rutenbar
Publisher: John Wiley & Sons
ISBN: 047122782X
Category : Technology & Engineering
Languages : en
Pages : 773
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Book Description
The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.
Author: B. Antao
Publisher: Springer Science & Business Media
ISBN: 1461314054
Category : Technology & Engineering
Languages : en
Pages : 131
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Book Description
Modeling and Simulation of Mixed Analog-Digital Systems brings together in one place important contributions and state-of-the-art research results in this rapidly advancing area. Modeling and Simulation of Mixed Analog-Digital Systems serves as an excellent reference, providing insight into some of the most important issues in the field.
Author: Ulrich Ramacher
Publisher: Springer Science & Business Media
ISBN: 1461539943
Category : Technology & Engineering
Languages : en
Pages : 346
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Book Description
The early era of neural network hardware design (starting at 1985) was mainly technology driven. Designers used almost exclusively analog signal processing concepts for the recall mode. Learning was deemed not to cause a problem because the number of implementable synapses was still so low that the determination of weights and thresholds could be left to conventional computers. Instead, designers tried to directly map neural parallelity into hardware. The architectural concepts were accordingly simple and produced the so called interconnection problem which, in turn, made many engineers believe it could be solved by optical implementation in adequate fashion only. Furthermore, the inherent fault-tolerance and limited computation accuracy of neural networks were claimed to justify that little effort is to be spend on careful design, but most effort be put on technology issues. As a result, it was almost impossible to predict whether an electronic neural network would function in the way it was simulated to do. This limited the use of the first neuro-chips for further experimentation, not to mention that real-world applications called for much more synapses than could be implemented on a single chip at that time. Meanwhile matters have matured. It is recognized that isolated definition of the effort of analog multiplication, for instance, would be just as inappropriate on the part ofthe chip designer as determination of the weights by simulation, without allowing for the computing accuracy that can be achieved, on the part of the user.
Author: Bank W. Lee
Publisher: Springer Science & Business Media
ISBN: 1461539846
Category : Technology & Engineering
Languages : en
Pages : 251
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Book Description
Rapid advances in neural sciences and VLSI design technologies have provided an excellent means to boost the computational capability and efficiency of data and signal processing tasks by several orders of magnitude. With massively parallel processing capabilities, artificial neural networks can be used to solve many engineering and scientific problems. Due to the optimized data communication structure for artificial intelligence applications, a neurocomputer is considered as the most promising sixth-generation computing machine. Typical applica tions of artificial neural networks include associative memory, pattern classification, early vision processing, speech recognition, image data compression, and intelligent robot control. VLSI neural circuits play an important role in exploring and exploiting the rich properties of artificial neural networks by using pro grammable synapses and gain-adjustable neurons. Basic building blocks of the analog VLSI neural networks consist of operational amplifiers as electronic neurons and synthesized resistors as electronic synapses. The synapse weight information can be stored in the dynamically refreshed capacitors for medium-term storage or in the floating-gate of an EEPROM cell for long-term storage. The feedback path in the amplifier can continuously change the output neuron operation from the unity-gain configuration to a high-gain configuration. The adjustability of the vol tage gain in the output neurons allows the implementation of hardware annealing in analog VLSI neural chips to find optimal solutions very efficiently. Both supervised learning and unsupervised learning can be implemented by using the programmable neural chips.
Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9781139437431
Category : Computers
Languages : en
Pages : 1022
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Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 534
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Book Description
