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Author: Günter H. Zschornack
Publisher: Springer Science & Business Media
ISBN: 3540286187
Category : Technology & Engineering
Languages : en
Pages : 969
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Book Description
This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (Americium). The tabulated data are characterized and, in most cases, evaluated. Furthermore, all important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed.
Author: Günter H. Zschornack
Publisher: Springer Science & Business Media
ISBN: 3540286187
Category : Technology & Engineering
Languages : en
Pages : 969
Get Book Here
Book Description
This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (Americium). The tabulated data are characterized and, in most cases, evaluated. Furthermore, all important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed.
Author: Keith Arnaud
Publisher: Cambridge University Press
ISBN: 1139502565
Category : Science
Languages : en
Pages : 207
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Book Description
Modern x-ray data, available through online archives, are important for many astronomical topics. However, using these data requires specialized techniques and software. Written for graduate students, professional astronomers and researchers who want to start working in this field, this book is a practical guide to x-ray astronomy. The handbook begins with x-ray optics, basic detector physics and CCDs, before focussing on data analysis. It introduces the reduction and calibration of x-ray data, scientific analysis, archives, statistical issues and the particular problems of highly extended sources. The book describes the main hardware used in x-ray astronomy, emphasizing the implications for data analysis. The concepts behind common x-ray astronomy data analysis software are explained. The appendices present reference material often required during data analysis.
Author: John F. Moulder
Publisher:
ISBN: 9780964812413
Category : Electron spectroscopy
Languages : en
Pages : 261
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Book Description
Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
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Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: Paolo Russo
Publisher: CRC Press
ISBN: 1498741541
Category : Medical
Languages : en
Pages : 1477
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Book Description
Containing chapter contributions from over 130 experts, this unique publication is the first handbook dedicated to the physics and technology of X-ray imaging, offering extensive coverage of the field. This highly comprehensive work is edited by one of the world’s leading experts in X-ray imaging physics and technology and has been created with guidance from a Scientific Board containing respected and renowned scientists from around the world. The book's scope includes 2D and 3D X-ray imaging techniques from soft-X-ray to megavoltage energies, including computed tomography, fluoroscopy, dental imaging and small animal imaging, with several chapters dedicated to breast imaging techniques. 2D and 3D industrial imaging is incorporated, including imaging of artworks. Specific attention is dedicated to techniques of phase contrast X-ray imaging. The approach undertaken is one that illustrates the theory as well as the techniques and the devices routinely used in the various fields. Computational aspects are fully covered, including 3D reconstruction algorithms, hard/software phantoms, and computer-aided diagnosis. Theories of image quality are fully illustrated. Historical, radioprotection, radiation dosimetry, quality assurance and educational aspects are also covered. This handbook will be suitable for a very broad audience, including graduate students in medical physics and biomedical engineering; medical physics residents; radiographers; physicists and engineers in the field of imaging and non-destructive industrial testing using X-rays; and scientists interested in understanding and using X-ray imaging techniques. The handbook's editor, Dr. Paolo Russo, has over 30 years’ experience in the academic teaching of medical physics and X-ray imaging research. He has authored several book chapters in the field of X-ray imaging, is Editor-in-Chief of an international scientific journal in medical physics, and has responsibilities in the publication committees of international scientific organizations in medical physics. Features: Comprehensive coverage of the use of X-rays both in medical radiology and industrial testing The first handbook published to be dedicated to the physics and technology of X-rays Handbook edited by world authority, with contributions from experts in each field
Author: Yoshio Waseda
Publisher: Springer Science & Business Media
ISBN: 3642166350
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Author: Lev. I. Mirkin
Publisher: Springer
ISBN:
Category : Science
Languages : en
Pages : 762
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Book Description
The book is best used in the following sequence. (1) The radiation and method of recording are selected in accordance with the data of Chapters 1 and 2; the detailed param eters for the recording are defined. (2) The patterns are indexed with the assistance of the graphs and tables of Chapter 3. (3) The measured intensities are compared with the values found from the tables of Chapter 4. (4) The particular problem at hand (determi nation of stresses, phase analysis, and so on) is solved with the aid of the tables and nomo grams given in the second part of the book. The nomograms can be enlarged for use if necessary. This is not the only mode of use; in particular, the material in the appropriate chapter may be sufficient for a particular type of routine analysis. I have had the benefit of valuable advice from workers in various laboratories (Moscow State University, Moscow Steel Institute, the Institute of Crystallography, the Central Research Institute for Ferrous Metallurgy, the Technological Research Institute of the Automobile Industry, the Karpov Institute of Physical Chemistry, the All-Union Hard Alloys K~search Institute, and so on). In addition, I am deeply indebted for much assistance to Professor Ya. S. Umanskii (scientific editor), Professor V. I. Iveronova, Professor A. I. Kitaigorodskii, G. A. Gol'der, and V. I. Rydnik. I recognize that this work cannot be free from deficiencies, and I should like to thank in advance workers in x-ray laboratories who may offer criticisms.
Author: Myeongkyu Lee
Publisher: CRC Press
ISBN: 1315361973
Category : Science
Languages : en
Pages : 302
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Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Jacob Beutel
Publisher: SPIE Press
ISBN: 9780819436214
Category : Medical
Languages : en
Pages : 542
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Book Description
This volume describes concurrent engineering developments that affect or are expected to influence future development of digital diagnostic imaging. It also covers current developments in Picture Archiving and Communications System (PACS) technology, with particular emphasis on integration of emerging imaging technologies into the hospital environment.
Author: Rene Van Grieken
Publisher: CRC Press
ISBN: 9780203908709
Category : Science
Languages : en
Pages : 1016
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Book Description
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
