Growth, Processing, and Characterization of Semiconductor Heterostructures: Volume 326

Growth, Processing, and Characterization of Semiconductor Heterostructures: Volume 326 PDF Author: Materials Research Society. Meeting Symposium M.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 634

Get Book Here

Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Growth, Processing, and Characterization of Semiconductor Heterostructures: Volume 326

Growth, Processing, and Characterization of Semiconductor Heterostructures: Volume 326 PDF Author: Materials Research Society. Meeting Symposium M.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 634

Get Book Here

Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

National Semiconductor Metrology Program

National Semiconductor Metrology Program PDF Author: National Semiconductor Metrology Program (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 108

Get Book Here

Book Description


National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999

National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 148

Get Book Here

Book Description


National Semiconductor Metrology Program

National Semiconductor Metrology Program PDF Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160

Get Book Here

Book Description


Selected Semiconductor Research

Selected Semiconductor Research PDF Author: Ming Fu Li
Publisher: World Scientific
ISBN: 1908978384
Category : Technology & Engineering
Languages : en
Pages : 529

Get Book Here

Book Description
This unique volume assembles the author's scientific and engineering achievements of the past three decades in the areas of (1) semiconductor physics and materials, including topics in deep level defects and band structures, (2) CMOS devices, including the topics in device technology, CMOS device reliability, and nano CMOS device quantum modeling, and (3) Analog Integrated circuit design. It reflects the scientific career of a semiconductor researcher educated in China during the 20th century. The book can be referenced by research scientists, engineers, and graduate students working in the areas of solid state and semiconductor physics and materials, electrical engineering and semiconductor devices, and chemical engineering./a

Materials Reliability in Microelectronics IV

Materials Reliability in Microelectronics IV PDF Author: Materials Research Society. Spring Meeting
Publisher:
ISBN:
Category : Electrodiffusion
Languages : en
Pages : 666

Get Book Here

Book Description


National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000

National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 160

Get Book Here

Book Description


Flat Panel Display Materials

Flat Panel Display Materials PDF Author:
Publisher:
ISBN:
Category : Information display devices
Languages : en
Pages : 360

Get Book Here

Book Description


Molecularly Designed Ultrafine/nanostructured Materials

Molecularly Designed Ultrafine/nanostructured Materials PDF Author: Kenneth E. Gonsalves
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 502

Get Book Here

Book Description


Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy

Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy PDF Author: Mehmet Sarikaya
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 648

Get Book Here

Book Description