Gettering and Defect Engineering in Semiconductor Technology VI PDF Download
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Author: Hans Richter
Publisher: Trans Tech Publications Ltd
ISBN: 3035706611
Category : Technology & Engineering
Languages : en
Pages : 618
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Book Description
GADEST 1995 Proceedings of the 6th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology (GADEST '95) held in Berlin, Germany, September 1995
Author: Hans Richter
Publisher: Trans Tech Publications Ltd
ISBN: 3035706611
Category : Technology & Engineering
Languages : en
Pages : 618
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Book Description
GADEST 1995 Proceedings of the 6th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology (GADEST '95) held in Berlin, Germany, September 1995
Author: M. Kittler
Publisher: Trans Tech Publications Ltd
ISBN: 3035706441
Category : Technology & Engineering
Languages : en
Pages : 618
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Book Description
Proceedings of the 3rd International Conference on Gettering and Defect Engineering in Semiconductor Technology (GADEST '89) held at Garzau, GDR, October 1989
Author: M. Kittler
Publisher: Trans Tech Publications Ltd
ISBN: 3035703019
Category : Technology & Engineering
Languages : en
Pages : 659
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Book Description
Proceedings of the 4th International Conference on Gettering and Defect Engineering In Semiconductor Technology (GADEST '91), Frankfurt, Germany, October 1991
Author: Anna Cavallini
Publisher: Trans Tech Publications Ltd
ISBN: 3038131946
Category : Technology & Engineering
Languages : en
Pages : 643
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Book Description
GADEST 2007 Selected, peer reviewed papers from Gettering and Defect Engineering in Semiconductor Technology - GADEST 2007" held from 14th to 19th October 2007 in Italy at the EMFCSC
Author: J.D. Murphy
Publisher: Trans Tech Publications Ltd
ISBN: 3038262056
Category : Technology & Engineering
Languages : en
Pages : 513
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Book Description
GADEST 2013 Selected, peer reviewed papers from the 15th Gettering and Defect Engineering in Semiconductor Technology (GADEST 2013), September 22-27, 2013, Oxford, UK
Author:
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 844
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Book Description
Author: Martin Kittler
Publisher: Scitec Publications
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 634
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 640
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Book Description
At the present time, Si-based technology is undergoing a transition to the next generation of substrates, having a diameter of 300 mm. The fundamental physical limits are being approached in terms of miniaturization, increased chip area, faster switching speeds, and diversity of operations. This raises the question of the intrinsic limits of the currently predominant semiconductor, silicon, and of those circumstances where it may be advantageous to turn to materials such as GaAs, InP, or SiC. Progress in the field of semiconductor materials science is closely connected to the development of new or improved characterization techniques. These are tending towards atomic dimensions on the one hand and to the possibility of characterizing semiconductor wafers of increased diameter on the other hand. This timely publication comprises 20 invited and 54 contributed papers from more than 70 research institutes and universities in 23 countries, and offers a useful overview of the subject.
Author: Peter Pichler
Publisher: Trans Tech Publications Ltd
ISBN: 3035700834
Category : Technology & Engineering
Languages : en
Pages : 492
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Book Description
Selected, peer reviewed papers from the GADEST 2015: Gettering and Defect Engineering in Semiconductor Technology, September 20-25, 2015, Bad Staffelstein, Germany
Author: Victor A. Perevostchikov
Publisher: Springer Science & Business Media
ISBN: 3540294996
Category : Technology & Engineering
Languages : en
Pages : 400
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Book Description
Gettering Defects in Semiconductors fulfills three basic purposes: – to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; – to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; – to fill a gap in the contemporary literature on the underlying semiconductor-material theory. The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solid–state microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading.
