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Author: Kai-hui Chang
Publisher: Springer Science & Business Media
ISBN: 1402093659
Category : Technology & Engineering
Languages : en
Pages : 213
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Book Description
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Author: Kai-hui Chang
Publisher: Springer Science & Business Media
ISBN: 1402093659
Category : Technology & Engineering
Languages : en
Pages : 213
Get Book Here
Book Description
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Author: Kai-Hui Chang
Publisher:
ISBN:
Category :
Languages : en
Pages : 520
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Book Description
Author: Kai-hui Chang
Publisher: Springer
ISBN: 9781402093661
Category : Technology & Engineering
Languages : en
Pages : 200
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Book Description
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 902
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Book Description
Author: Neal Glover
Publisher:
ISBN:
Category : Error-correcting codes (Information theory)
Languages : en
Pages : 506
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Book Description
Author: Dawoud Shenouda Dawoud
Publisher: River Publishers
ISBN: 8792329403
Category : Technology & Engineering
Languages : en
Pages : 571
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Book Description
Today, embedded systems are widely deployed in just about every piece of machinery from toasters to spacecrafts, and embedded system designers face many challenges. They are asked to produce increasingly complex systems using the latest technologies, but these technologies are changing faster than ever. They are asked to produce better quality designs with a shorter time-to-market. They are asked to implement increasingly complex functionality but, more importantly, to satisfy numerous other constraints. To achieve these current goals, the designer must be aware of such design constraints and, more importantly, the factors that have a direct effect on them. One of the challenges facing embedded system designers is the selection of the optimum processor for the application in hand: single-purpose, general-purpose, or application specific. Microcontrollers are one member of the family of the application specific processors. Digital System Design concentrates on the use of a microcontroller as the embedded system's processor and how to use it in many embedded system applications. The book covers both the hardware and software aspects needed to design using microcontrollers and is ideal for undergraduate students and engineers that are working in the field of digital system design.
Author: Moore School of Electrical Engineering
Publisher:
ISBN:
Category : Calculators
Languages : en
Pages : 1794
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Book Description
Author: Mostafa I Abd-el-barr
Publisher: World Scientific
ISBN: 190897978X
Category : Computers
Languages : en
Pages : 463
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Book Description
Covering both the theoretical and practical aspects of fault-tolerant mobile systems, and fault tolerance and analysis, this book tackles the current issues of reliability-based optimization of computer networks, fault-tolerant mobile systems, and fault tolerance and reliability of high speed and hierarchical networks.The book is divided into six parts to facilitate coverage of the material by course instructors and computer systems professionals. The sequence of chapters in each part ensures the gradual coverage of issues from the basics to the most recent developments. A useful set of references, including electronic sources, is listed at the end of each chapter./a
Author: Miron Abramovici
Publisher: Wiley-IEEE Press
ISBN: 9780780310629
Category : Technology & Engineering
Languages : en
Pages : 672
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Book Description
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Author: Lionel Bening
Publisher: Springer Science & Business Media
ISBN: 0306476312
Category : Technology & Engineering
Languages : en
Pages : 297
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Book Description
System designers, computer scientists and engineers have c- tinuously invented and employed notations for modeling, speci- ing, simulating, documenting, communicating, teaching, verifying and controlling the designs of digital systems. Initially these s- tems were represented via electronic and fabrication details. F- lowing C. E. Shannon’s revelation of 1948, logic diagrams and Boolean equations were used to represent digital systems in a fa- ion that de-emphasized electronic and fabrication detail while revealing logical behavior. A small number of circuits were made available to remove the abstraction of these representations when it was desirable to do so. As system complexity grew, block diagrams, timing charts, sequence charts, and other graphic and symbolic notations were found to be useful in summarizing the gross features of a system and describing how it operated. In addition, it always seemed necessary or appropriate to augment these documents with lengthy verbal descriptions in a natural language. While each notation was, and still is, a perfectly valid means of expressing a design, lack of standardization, conciseness, and f- mal definitions interfered with communication and the understa- ing between groups of people using different notations. This problem was recognized early and formal languages began to evolve in the 1950s when I. S. Reed discovered that flip-flop input equations were equivalent to a register transfer equation, and that xvi tor-like notation. Expanding these concepts Reed developed a no- tion that became known as a Register Transfer Language (RTL).
