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Author: Kai-hui Chang
Publisher: Springer Science & Business Media
ISBN: 1402093659
Category : Technology & Engineering
Languages : en
Pages : 213
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Book Description
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Author: Kai-hui Chang
Publisher: Springer Science & Business Media
ISBN: 1402093659
Category : Technology & Engineering
Languages : en
Pages : 213
Get Book Here
Book Description
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Author: Kai-Hui Chang
Publisher:
ISBN:
Category :
Languages : en
Pages : 520
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Book Description
Author: Kai-hui Chang
Publisher: Springer
ISBN: 9781402093661
Category : Technology & Engineering
Languages : en
Pages : 200
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Book Description
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 902
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Book Description
Author: Moore School of Electrical Engineering
Publisher:
ISBN:
Category : Calculators
Languages : en
Pages : 1794
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Book Description
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 478
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Book Description
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 476
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Book Description
Author: Hubert Kaeslin
Publisher: Cambridge University Press
ISBN: 0521882672
Category : Technology & Engineering
Languages : en
Pages : 878
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Book Description
This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 476
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Book Description
Author: W. W. Youden
Publisher:
ISBN:
Category : Computer science
Languages : en
Pages : 476
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Book Description
