Fringe Pattern Analysis for Optical Metrology

Fringe Pattern Analysis for Optical Metrology PDF Author: Manuel Servin
Publisher: John Wiley & Sons
ISBN: 3527411526
Category : Technology & Engineering
Languages : en
Pages : 344

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Book Description
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

Fringe Pattern Analysis for Optical Metrology

Fringe Pattern Analysis for Optical Metrology PDF Author: Manuel Servin
Publisher: John Wiley & Sons
ISBN: 3527411526
Category : Technology & Engineering
Languages : en
Pages : 344

Get Book Here

Book Description
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

Windowed Fringe Pattern Analysis

Windowed Fringe Pattern Analysis PDF Author: Qian Kemao
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819496430
Category : Technology & Engineering
Languages : en
Pages : 300

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Book Description
This book provides solutions to the challenges involved in fringe pattern analysis, covering techniques for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. Both theoretical analysis and algorithm development are covered to facilitate the work of researchers and engineers. The information presented is also appropriate as a specialized subject for students of optical and computer engineering.

Interferogram Analysis, Digital Fringe Pattern Measurement Techniques

Interferogram Analysis, Digital Fringe Pattern Measurement Techniques PDF Author: David W. Robinson
Publisher: CRC Press
ISBN:
Category : Art
Languages : en
Pages : 328

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Book Description
Very Good,No Highlights or Markup,all pages are intact.

Photomechanics

Photomechanics PDF Author: Pramod K. Rastogi
Publisher: Springer Science & Business Media
ISBN: 3540488006
Category : Science
Languages : en
Pages : 485

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Book Description
Presenting the use of photonics techniques for measurement in mechanics, this book provides a state-of-the-art review of this active and rapidly growing field. It serves as an invaluable resource for readers to explore the current status and includes a wealth of information on the essential principles and methods. It provides a substantial background in a concise and simple way to enable physicists and engineers to assess, analyze and implement experimental systems needed to solve their specific measurement problems.

High-Speed 3D Imaging with Digital Fringe Projection Techniques

High-Speed 3D Imaging with Digital Fringe Projection Techniques PDF Author: Song Zhang
Publisher: CRC Press
ISBN: 1482234343
Category : Computers
Languages : en
Pages : 218

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Book Description
Digital fringe projection (DFP) techniques are used for non-contact shape measurement of 3D images. In the rapidly expanding field of 3D high-speed imaging, the demand for DFP continues to grow due to the technology’s fast speed, flexibility, low cost, and high accuracy. High-Speed 3D Imaging with Digital Fringe Projection Techniques discusses the generation of digital fringe with digital video projection devices, covering a variety of core technical aspects. The book begins by establishing the theoretical foundations of fringe pattern analysis, reviewing various 3D imaging techniques while highlighting the advantages of DFP. The author then: Describes the differences between digital light processing (DLP), liquid crystal display (LCD), and liquid crystal on silicon (LCoS) Explains how to unwrap phase maps temporally and spatially Shows how to generate fringe patterns with video projectors Demonstrates how to convert phase to coordinates through system calibrations Provides a detailed example of a built-from-scratch 3D imaging system Incorporating valuable insights gained during the author’s 15+ years of 3D imaging research, High-Speed 3D Imaging with Digital Fringe Projection Techniques illuminates the pathway to advancement in high-speed 3D optical imaging using DFP.

Fringe 2009

Fringe 2009 PDF Author: Wolfgang Osten
Publisher: Springer Science & Business Media
ISBN: 3642030513
Category : Technology & Engineering
Languages : en
Pages : 808

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Book Description
21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.

Basics of Interferometry

Basics of Interferometry PDF Author: P. Hariharan
Publisher: Academic Press
ISBN: 0080918611
Category : Technology & Engineering
Languages : en
Pages : 232

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Book Description
This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers.The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.

Fringe 2005

Fringe 2005 PDF Author: Wolfgang Osten
Publisher: Springer Science & Business Media
ISBN: 3540293035
Category : Technology & Engineering
Languages : en
Pages : 729

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Book Description
In 1989 the time was hot to create a workshop series dedicated to the dicussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial applications of optical metrology. However, such a workshop must take place in a dynamic environment. The- fore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 new prin- ples of optical shape measurement, setup calibration, phase unwr- ping and nondestructive testing were the focus of discussion, while in 1997 new approaches in multi-sensor metrology, active measu- ment strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was dedicated to - tical methods for micromeasurements, hybrid measurement te- nologies and new sensor solutions for industrial inspection. The fifth workshop takes place in Stuttgart, the capital of the state of Baden- Württemberg and the centre of a region with a long and remarkable tradition in engineering. Thus after Berlin 1989, Bremen 1993, 1997 and 2001, Stuttgart is the third Fringe city where international - perts will meet each other to share new ideas and concepts in optical metrology. This volume contains the papers presented during FRINGE 2005.

Digital Photoelasticity

Digital Photoelasticity PDF Author: K. Ramesh
Publisher: Springer Science & Business Media
ISBN: 3642597238
Category : Science
Languages : en
Pages : 425

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Book Description
A straightforward introduction to basic concepts and methodologies for digital photoelasticity, providing a foundation on which future researchers and students can develop their own ideas. The book thus promotes research into the formulation of problems in digital photoelasticity and the application of these techniques to industries. In one volume it provides data acquisition by DIP techniques, its analysis by statistical techniques, and its presentation by computer graphics plus the use of rapid prototyping technologies to speed up the entire process. The book not only presents the various techniques but also provides the relevant time-tested software codes. Exercises designed to support and extend the treatment are found at the end of each chapter.

Holography and Deformation Analysis

Holography and Deformation Analysis PDF Author: W. Schumann
Publisher: Springer
ISBN: 3540389814
Category : Science
Languages : en
Pages : 243

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Book Description
In this book series on Optical Sciences, holography has been the subject of three previous volumes. In particular, Vol. 16, written by one of us (W. S. ) and Dr. M. Dubas, treated holographic interferometry of opaque bodies from the standpoint of deformation analysis. However, the fundamental principles of holography are developed there only briefly in preparation for a discussion of interference fringe modifications. This new volume in the series is intended to consider in detail many topics which were previously omitted, such as the deformation or distortion of holo graphic images, the theory of volume holograms, composite or multiplex holo graphy, holographic interferometry of transparent media, time dependent effects, holographic contouring, and applications of fringe modifications to the deformation of opaque bodies. In addition, these and other subjects will be treated with the same unifying concept developed in Vol. 16, but with an addi tional emphasis on those features that have their origins in classical optics, espe cially the small-wavelength approach, the coupled-wave theory, and the Seidel aberrations. Since the field of holography and its various applications is growing rapidly, it is impossible to be comprehensive in a single book. Every effort has beep. made to avoid unnecessary duplication of Vol. 16. For example, displace ment and fringe localization problems are only briefly discussed, while some modification techniques (e. g. , sandwich holography) are not included. When needed, however, the reader is directly referred to complementary publications.