Footprints of Deformation Mechanisms During In-situ X-ray Diffraction PDF Download
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Author: Željka Budrović
Publisher:
ISBN:
Category :
Languages : en
Pages : 133
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Book Description
Author: Željka Budrović
Publisher:
ISBN:
Category :
Languages : en
Pages : 133
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Book Description
Author: Zeljka Budrovic
Publisher:
ISBN:
Category :
Languages : en
Pages : 133
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Book Description
Author: Jochen Andreas Lohmiller
Publisher: KIT Scientific Publishing
ISBN: 3866449623
Category : Technology & Engineering
Languages : en
Pages : 250
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Book Description
In this work, different nanocrystalline metals and alloys were investigated by a synchrotron-based in situ XRD mechanical testing technique in order to investigate the dominant deformation mechanisms. All tested samples show a succession and coexistence of several mechanisms, regardless of grain size, loading condition, or sample geometry. However, the relative shares of the individual mechanisms strongly vary and depend on parameters such as grain size, sample purity, and alloy composition.
Author: Shiu Fai Li
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Book Description
Author: Ashley N. Bucsek
Publisher:
ISBN:
Category : Deformations (Mechanics)
Languages : en
Pages : 156
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Author: Oliver Kraft
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 250
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Book Description
The mechanical properties of small volumes of materials (such as thin films and patterned structures) can be very different from larger volumes, especially in the area of dislocation behavior. This text contains a selection of 31 papers from the April 2001 symposium devoted to new methods of dislocation modeling. Topics include mechanisms of plastic deformation in heteroepitaxial, multilayered, and polycrystalline thin films; as well as in 3D mesostructures such as epitaxial islands, semiconducting devices, and microcrystallites. The organizers of the symposium had the particular aim of stimulating exchange between experimental work, theoretical modeling, and numerical simulations. Annotation copyrighted by Book News Inc., Portland, OR.
Author:
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Category :
Languages : en
Pages :
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Category : Aeronautics
Languages : en
Pages : 248
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Book Description
Author: Deborah D. L. Chung
Publisher: Wiley-VCH
ISBN: 9783527278428
Category : X-rays
Languages : en
Pages : 268
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Book Description
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
