Fault Diagnosis of Digital Systems PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Fault Diagnosis of Digital Systems PDF full book. Access full book title Fault Diagnosis of Digital Systems by Herbert Y. Chang. Download full books in PDF and EPUB format.
Author: Herbert Y. Chang
Publisher: New York : Wiley-Interscience
ISBN:
Category : Computers
Languages : en
Pages : 184
Get Book Here
Book Description
Author: Herbert Y. Chang
Publisher: New York : Wiley-Interscience
ISBN:
Category : Computers
Languages : en
Pages : 184
Get Book Here
Book Description
Author: Ron J. Patton
Publisher: Springer Science & Business Media
ISBN: 9783540199687
Category : Computers
Languages : en
Pages : 632
Get Book Here
Book Description
Since the time our first book Fault Diagnosis in Dynamic Systems: The ory and Applications was published in 1989 by Prentice Hall, there has been a surge in interest in research and applications into reliable methods for diag nosing faults in complex systems. The first book sold more than 1,200 copies and has become the main text in fault diagnosis for dynamic systems. This book will follow on this excellent record by focusing on some of the advances in this subject, by introducing new concepts in research and new application topics. The work cannot provide an exhaustive discussion of all the recent research in fault diagnosis for dynamic systems, but nevertheless serves to sample some of the major issues. It has been valuable once again to have the co-operation of experts throughout the world working in industry, gov emment establishments and academic institutions in writing the individual chapters. Sometimes dynamical systems have associated numerical models available in state space or in frequency domain format. When model infor mation is available, the quantitative model-based approach to fault diagnosis can be taken, using the mathematical model to generate analytically redun dant alternatives to the measured signals. When this approach is used, it becomes important to try to understand the limitations of the mathematical models i. e. , the extent to which model parameter variations occur and the effect of changing the systems point of operation.
Author: Silvio Simani
Publisher: Springer Science & Business Media
ISBN: 1447138295
Category : Technology & Engineering
Languages : en
Pages : 294
Get Book Here
Book Description
Safety in industrial process and production plants is a concern of rising importance but because the control devices which are now exploited to improve the performance of industrial processes include both sophisticated digital system design techniques and complex hardware, there is a higher probability of failure. Control systems must include automatic supervision of closed-loop operation to detect and isolate malfunctions quickly. A promising method for solving this problem is "analytical redundancy", in which residual signals are obtained and an accurate model of the system mimics real process behaviour. If a fault occurs, the residual signal is used to diagnose and isolate the malfunction. This book focuses on model identification oriented to the analytical approach of fault diagnosis and identification covering: choice of model structure; parameter identification; residual generation; and fault diagnosis and isolation. Sample case studies are used to demonstrate the application of these techniques.
Author: Rolf Isermann
Publisher: Springer Science & Business Media
ISBN: 3642127673
Category : Technology & Engineering
Languages : en
Pages : 358
Get Book Here
Book Description
Supervision, condition-monitoring, fault detection, fault diagnosis and fault management play an increasing role for technical processes and vehicles in order to improve reliability, availability, maintenance and lifetime. For safety-related processes fault-tolerant systems with redundancy are required in order to reach comprehensive system integrity. This book is a sequel of the book “Fault-Diagnosis Systems” published in 2006, where the basic methods were described. After a short introduction into fault-detection and fault-diagnosis methods the book shows how these methods can be applied for a selection of 20 real technical components and processes as examples, such as: Electrical drives (DC, AC) Electrical actuators Fluidic actuators (hydraulic, pneumatic) Centrifugal and reciprocating pumps Pipelines (leak detection) Industrial robots Machine tools (main and feed drive, drilling, milling, grinding) Heat exchangers Also realized fault-tolerant systems for electrical drives, actuators and sensors are presented. The book describes why and how the various signal-model-based and process-model-based methods were applied and which experimental results could be achieved. In several cases a combination of different methods was most successful. The book is dedicated to graduate students of electrical, mechanical, chemical engineering and computer science and for engineers.
Author: Prithviraj Kabisatpathy
Publisher: Springer Science & Business Media
ISBN: 0387257438
Category : Technology & Engineering
Languages : en
Pages : 183
Get Book Here
Book Description
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9780521773560
Category : Computers
Languages : en
Pages : 1016
Get Book Here
Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author: Hamid Reza Karimi
Publisher: Elsevier
ISBN: 0128224738
Category : Technology & Engineering
Languages : en
Pages : 419
Get Book Here
Book Description
Fault Diagnosis and Prognosis Techniques for Complex Engineering Systems gives a systematic description of the many facets of envisaging, designing, implementing, and experimentally exploring emerging trends in fault diagnosis and failure prognosis in mechanical, electrical, hydraulic and biomedical systems. The book is devoted to the development of mathematical methodologies for fault diagnosis and isolation, fault tolerant control, and failure prognosis problems of engineering systems. Sections present new techniques in reliability modeling, reliability analysis, reliability design, fault and failure detection, signal processing, and fault tolerant control of engineering systems. Sections focus on the development of mathematical methodologies for diagnosis and prognosis of faults or failures, providing a unified platform for understanding and applicability of advanced diagnosis and prognosis methodologies for improving reliability purposes in both theory and practice, such as vehicles, manufacturing systems, circuits, flights, biomedical systems. This book will be a valuable resource for different groups of readers - mechanical engineers working on vehicle systems, electrical engineers working on rotary machinery systems, control engineers working on fault detection systems, mathematicians and physician working on complex dynamics, and many more. Presents recent advances of theory, technological aspects, and applications of advanced diagnosis and prognosis methodologies in engineering applications Provides a series of the latest results, including fault detection, isolation, fault tolerant control, failure prognosis of components, and more Gives numerical and simulation results in each chapter to reflect engineering practices
Author: Francesco Ferracuti
Publisher: MDPI
ISBN: 3036504621
Category : Technology & Engineering
Languages : en
Pages : 130
Get Book Here
Book Description
Due to the increasing demand for security and reliability in manufacturing and mechatronic systems, early detection and diagnosis of faults are key points to reduce economic losses caused by unscheduled maintenance and downtimes, to increase safety, to prevent the endangerment of human beings involved in the process operations and to improve reliability and availability of autonomous systems. The development of algorithms for health monitoring and fault and anomaly detection, capable of the early detection, isolation, or even prediction of technical component malfunctioning, is becoming more and more crucial in this context. This Special Issue is devoted to new research efforts and results concerning recent advances and challenges in the application of “Algorithms for Fault Detection and Diagnosis”, articulated over a wide range of sectors. The aim is to provide a collection of some of the current state-of-the-art algorithms within this context, together with new advanced theoretical solutions.
Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9781139437431
Category : Computers
Languages : en
Pages : 1022
Get Book Here
Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author: Md Shafiullah
Publisher: Elsevier
ISBN: 032388430X
Category : Technology & Engineering
Languages : en
Pages : 430
Get Book Here
Book Description
Power System Fault Diagnosis: A Wide Area Measurement Based Intelligent Approach is a comprehensive overview of the growing interests in efficient diagnosis of power system faults to reduce outage duration and revenue losses by expediting the restoration process.This book illustrates intelligent fault diagnosis schemes for power system networks, at both transmission and distribution levels, using data acquired from phasor measurement units. It presents the power grid modeling, fault modeling, feature extraction processes, and various fault diagnosis techniques, including artificial intelligence techniques, in steps. The book also incorporates uncertainty associated with line parameters, fault information (resistance and inception angle), load demand, renewable energy generation, and measurement noises. - Provides step-by-step modeling of power system networks (distribution and transmission) and faults in MATLAB/SIMULINK and real-time digital simulator (RTDS) platforms - Presents feature extraction processes using advanced signal processing techniques (discrete wavelet and Stockwell transforms) and an easy-to-understand optimal feature selection method - Illustrates comprehensive results in the graphical and tabular formats that can be easily reproduced by beginners - Highlights various utility practices for fault location in transmission networks, distribution systems, and underground cables.
