European Powder Diffraction 3 PDF Download
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Author: R. Delhez
Publisher: Trans Tech Publications Ltd
ISBN: 3035704899
Category : Technology & Engineering
Languages : en
Pages : 791
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Book Description
Third European Powder Diffraction Conference (EPDIC III), Vienna, Austria, September 1993
Author: R. Delhez
Publisher: Trans Tech Publications
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 544
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Book Description
Powder diffraction continues to be a highly active field of research where many interesting developments are currently taking place.
Author: R. Delhez
Publisher: Trans Tech Publications Ltd
ISBN: 3035704899
Category : Technology & Engineering
Languages : en
Pages : 791
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Book Description
Third European Powder Diffraction Conference (EPDIC III), Vienna, Austria, September 1993
Author:
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3486992589
Category : Science
Languages : en
Pages : 568
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Book Description
Zeitschrift für Kristallographie. Supplement Volume 30 presents the complete Proceedings of all contributions to the XI European Powder Diffraction Conference in Warsaw 2008: Method Development and Application Instrumental Software Development Materials Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.
Author: Robert E. Dinnebier
Publisher: Royal Society of Chemistry
ISBN: 0854042318
Category : Education
Languages : en
Pages : 606
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Book Description
A long awaited overview of the status of powder diffraction in modern research including essential theory and introductory material for students and researchers.
Author: M. Ladd
Publisher: Springer Science & Business Media
ISBN: 1461579309
Category : Science
Languages : en
Pages : 404
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Book Description
Crystallography may be described as the science of the structure of materi als, using this word in its widest sense, and its ramifications are apparent over a broad front of current scientific endeavor. It is not surprising, therefore, to find that most universities offer some aspects of crystallography in their undergraduate courses in the physical sciences. It is the principal aim of this book to present an introduction to structure determination by X-ray crystal lography that is appropriate mainly to both final-year undergraduate studies in crystallography, chemistry, and chemical physics, and introductory post graduate work in this area of crystallography. We believe that the book will be of interest in other disciplines, such as physics, metallurgy, biochemistry, and geology, where crystallography has an important part to play. In the space of one book, it is not possible either to cover all aspects of crystallography or to treat all the subject matter completely rigorously. In particular, certain mathematical results are assumed in order that their applications may be discussed. At the end of each chapter, a short bibliog raphy is given, which may be used to extend the scope of the treatment given here. In addition, reference is made in the text to specific sources of information. We have chosen not to discuss experimental methods extensively, as we consider that this aspect of crystallography is best learned through practical experience, but an attempt has been made to simulate the interpretive side of experimental crystallography in both examples and exercises.
Author: Vitalij Pecharsky
Publisher: Springer Science & Business Media
ISBN: 0387095799
Category : Science
Languages : en
Pages : 751
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Book Description
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
Author: R. Delhez
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 496
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Book Description
X-ray powder diffraction is a non-destructive technique widely applied for the characterisation of crystalline materials. The method has been traditionally used for phase identification, quantitative analysis and the determination of structure imperfections. In recent years, applications have been extended to new areas, such as the determination of crystal structures and the extraction of three-dimensional microstructural properties.
Author: Peter Brouwer
Publisher:
ISBN: 9789090167589
Category :
Languages : en
Pages : 71
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Book Description
Author: Robert E. Dinnebier
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3110461382
Category : Science
Languages : en
Pages : 348
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Book Description
Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
