Author:
Publisher:
ISBN:
Category : Computer-aided design
Languages : en
Pages :
Book Description
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Author:
Publisher:
ISBN:
Category : Computer-aided design
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category : Computer-aided design
Languages : en
Pages :
Book Description
Proceedings of the Conference on Design, Automation and Test in Europe
Author: Giovanni De Micheli
Publisher:
ISBN: 9783981080162
Category : Computer science
Languages : en
Pages : 1814
Book Description
Publisher:
ISBN: 9783981080162
Category : Computer science
Languages : en
Pages : 1814
Book Description
European Design & Test Conference
Author: European Design and Test Conference
Publisher:
ISBN:
Category :
Languages : en
Pages : 634
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 634
Book Description
Proceedings
Author:
Publisher:
ISBN:
Category : Application specific integrated circuits
Languages : en
Pages : 738
Book Description
Publisher:
ISBN:
Category : Application specific integrated circuits
Languages : en
Pages : 738
Book Description
European Design and Test Conference
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Design, Automation, and Test in Europe
Author: Rudy Lauwereins
Publisher: Springer Science & Business Media
ISBN: 1402064888
Category : Technology & Engineering
Languages : en
Pages : 499
Book Description
In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.
Publisher: Springer Science & Business Media
ISBN: 1402064888
Category : Technology & Engineering
Languages : en
Pages : 499
Book Description
In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.
European Design and Test Conference (ED and TC '97).
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
European Design and Test Conference: Proceedings of the European Design and Test Conference Paris, France, 1996
Author: European Design
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Proceedings, the European Design and Test Conference
Author:
Publisher:
ISBN: 9780818654107
Category : Computer engineering
Languages : en
Pages : 676
Book Description
Proceedings of the conference jointly presented by EDAC, ETC, and EuroASIC--and therefore the premier European event in the field of CAD, design, and test of circuits and systems. The major emphasis of the CAD portion is on high level design and verification tools, but information on the latest developments in logic synthesis and layout automation is also supplied. The key area of focus in design is in digital design and design methodologies, but papers on mixed digital/analog and full system design are also presented. The emphasis in test is on design for testability and novel methods for fault simulation and test generation, with sessions on new test techniques such as inductive fault analysis and IDDQ testing. No index. Acidic paper. Annotation copyright by Book News, Inc., Portland, OR
Publisher:
ISBN: 9780818654107
Category : Computer engineering
Languages : en
Pages : 676
Book Description
Proceedings of the conference jointly presented by EDAC, ETC, and EuroASIC--and therefore the premier European event in the field of CAD, design, and test of circuits and systems. The major emphasis of the CAD portion is on high level design and verification tools, but information on the latest developments in logic synthesis and layout automation is also supplied. The key area of focus in design is in digital design and design methodologies, but papers on mixed digital/analog and full system design are also presented. The emphasis in test is on design for testability and novel methods for fault simulation and test generation, with sessions on new test techniques such as inductive fault analysis and IDDQ testing. No index. Acidic paper. Annotation copyright by Book News, Inc., Portland, OR
EDTC
Author: ACM
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description