Author: Eric Munro
Publisher:
ISBN:
Category : Electron beams
Languages : en
Pages : 536
Book Description
Electron-beam Sources and Charged-particle Optics
Author: Eric Munro
Publisher:
ISBN:
Category : Electron beams
Languages : en
Pages : 536
Book Description
Publisher:
ISBN:
Category : Electron beams
Languages : en
Pages : 536
Book Description
Electron-beam Sources and Charged-particle Optics
Author: Eric Munro
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 556
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 556
Book Description
Handbook of Charged Particle Optics
Author: Jon Orloff
Publisher: CRC Press
ISBN: 1420045555
Category : Science
Languages : en
Pages : 666
Book Description
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Publisher: CRC Press
ISBN: 1420045555
Category : Science
Languages : en
Pages : 666
Book Description
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Applied Charged Particle Optics
Author: Albert L. Septier
Publisher:
ISBN:
Category : Electron optics
Languages : en
Pages : 426
Book Description
Publisher:
ISBN:
Category : Electron optics
Languages : en
Pages : 426
Book Description
Atomic, Molecular, and Optical Physics: Charged Particles
Author:
Publisher: Academic Press
ISBN: 0080860176
Category : Science
Languages : en
Pages : 485
Book Description
With this volume, Methods of Experimental Physics becomes Experimental Methods in the Physical Sciences, a name change which reflects the evolution of todays science. This volume is the first of three which will provide a comprehensive treatment of the key experimental methods of atomic, molecular, and optical physics; the three volumes as a set will form an excellent experimental handbook for the field. The wide availability of tunable lasers in the pastseveral years has revolutionized the field and lead to the introduction of many new experimental methods that are covered in these volumes. Traditional methods are also included to ensure that the volumes will be a complete reference source for the field.
Publisher: Academic Press
ISBN: 0080860176
Category : Science
Languages : en
Pages : 485
Book Description
With this volume, Methods of Experimental Physics becomes Experimental Methods in the Physical Sciences, a name change which reflects the evolution of todays science. This volume is the first of three which will provide a comprehensive treatment of the key experimental methods of atomic, molecular, and optical physics; the three volumes as a set will form an excellent experimental handbook for the field. The wide availability of tunable lasers in the pastseveral years has revolutionized the field and lead to the introduction of many new experimental methods that are covered in these volumes. Traditional methods are also included to ensure that the volumes will be a complete reference source for the field.
Intense Electron and Ion Beams
Author: Sergey Ivanovich Molokovsky
Publisher: Springer Science & Business Media
ISBN: 3540288120
Category : Science
Languages : en
Pages : 285
Book Description
Intense Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental installations such as free electron lasers and accelerators. It addresses, among other things, the physics and basic theory of intense charged-particle beams; computation and design of charged-particle guns and focusing systems; multiple-beam charged-particle systems; and experimental methods for investigating intense particle beams. The coverage is carefully balanced between the physics of intense charged-particle beams and the design of optical systems for their formation and focusing. It can be recommended to all scientists studying or applying vacuum electronics and charged-particle beam technology, including students, engineers, and researchers.
Publisher: Springer Science & Business Media
ISBN: 3540288120
Category : Science
Languages : en
Pages : 285
Book Description
Intense Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental installations such as free electron lasers and accelerators. It addresses, among other things, the physics and basic theory of intense charged-particle beams; computation and design of charged-particle guns and focusing systems; multiple-beam charged-particle systems; and experimental methods for investigating intense particle beams. The coverage is carefully balanced between the physics of intense charged-particle beams and the design of optical systems for their formation and focusing. It can be recommended to all scientists studying or applying vacuum electronics and charged-particle beam technology, including students, engineers, and researchers.
Applied Charged Particle Optics
Author: Helmut Liebl
Publisher: Springer Science & Business Media
ISBN: 3540719253
Category : Science
Languages : en
Pages : 131
Book Description
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Publisher: Springer Science & Business Media
ISBN: 3540719253
Category : Science
Languages : en
Pages : 131
Book Description
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Geometrical Charged-Particle Optics
Author: Harald H. Rose
Publisher: Springer Science & Business Media
ISBN: 3540859152
Category : Science
Languages : en
Pages : 422
Book Description
This resource covering all theoretical aspects of modern geometrical charged-particle optics is aimed at anyone involved in the design of electron optical instruments and beam-guiding systems for charged particles.
Publisher: Springer Science & Business Media
ISBN: 3540859152
Category : Science
Languages : en
Pages : 422
Book Description
This resource covering all theoretical aspects of modern geometrical charged-particle optics is aimed at anyone involved in the design of electron optical instruments and beam-guiding systems for charged particles.
Introduction to Electron Optics
Author: Vernon Ellis Cosslett
Publisher:
ISBN:
Category : Electron beams
Languages : en
Pages : 312
Book Description
Publisher:
ISBN:
Category : Electron beams
Languages : en
Pages : 312
Book Description
Theory and Design of Charged Particle Beams
Author: Martin Reiser
Publisher: John Wiley & Sons
ISBN: 3527617639
Category : Science
Languages : en
Pages : 634
Book Description
Although particle accelerators are the book's main thrust, it offers a broad synoptic description of beams which applies to a wide range of other devices such as low-energy focusing and transport systems and high-power microwave sources. Develops material from first principles, basic equations and theorems in a systematic way. Assumptions and approximations are clearly indicated. Discusses underlying physics and validity of theoretical relationships, design formulas and scaling laws. Features a significant amount of recent work including image effects and the Boltzmann line charge density profiles in bunched beams.
Publisher: John Wiley & Sons
ISBN: 3527617639
Category : Science
Languages : en
Pages : 634
Book Description
Although particle accelerators are the book's main thrust, it offers a broad synoptic description of beams which applies to a wide range of other devices such as low-energy focusing and transport systems and high-power microwave sources. Develops material from first principles, basic equations and theorems in a systematic way. Assumptions and approximations are clearly indicated. Discusses underlying physics and validity of theoretical relationships, design formulas and scaling laws. Features a significant amount of recent work including image effects and the Boltzmann line charge density profiles in bunched beams.