Author: Abbas Omar
Publisher: Artech House
ISBN: 1596932171
Category : Science
Languages : en
Pages : 314
Book Description
Based on the authorOCOs more-than 30 years of experience, this first-of-its-kind volume presents a comprehensive and systematic analysis of electromagnetic fields and their scattering by material objects. The book considers all three categories of scattering environments commonly used for material measurements OCo unbounded regions, waveguides, and cavity resonators. The book covers such essential topics as electromagnetic field propagation, radiation, and scattering, containing mathematically rigorous approaches for the computation of electromagnetic fields and the explanation of their behavior. Moreover, the book explore new measurement techniques for material characterization most of which have never been published before. This detailed reference is packed with over 400 equations.
Electromagnetic Scattering and Material Characterization
Author: Abbas Omar
Publisher: Artech House
ISBN: 1596932171
Category : Science
Languages : en
Pages : 314
Book Description
Based on the authorOCOs more-than 30 years of experience, this first-of-its-kind volume presents a comprehensive and systematic analysis of electromagnetic fields and their scattering by material objects. The book considers all three categories of scattering environments commonly used for material measurements OCo unbounded regions, waveguides, and cavity resonators. The book covers such essential topics as electromagnetic field propagation, radiation, and scattering, containing mathematically rigorous approaches for the computation of electromagnetic fields and the explanation of their behavior. Moreover, the book explore new measurement techniques for material characterization most of which have never been published before. This detailed reference is packed with over 400 equations.
Publisher: Artech House
ISBN: 1596932171
Category : Science
Languages : en
Pages : 314
Book Description
Based on the authorOCOs more-than 30 years of experience, this first-of-its-kind volume presents a comprehensive and systematic analysis of electromagnetic fields and their scattering by material objects. The book considers all three categories of scattering environments commonly used for material measurements OCo unbounded regions, waveguides, and cavity resonators. The book covers such essential topics as electromagnetic field propagation, radiation, and scattering, containing mathematically rigorous approaches for the computation of electromagnetic fields and the explanation of their behavior. Moreover, the book explore new measurement techniques for material characterization most of which have never been published before. This detailed reference is packed with over 400 equations.
Materials Characterization
Author: Yang Leng
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Eddy-Current Characterization of Materials and Structures
Author: George Birnbaum
Publisher: ASTM International
ISBN:
Category : Eddy currents (Electric)
Languages : en
Pages : 504
Book Description
Publisher: ASTM International
ISBN:
Category : Eddy currents (Electric)
Languages : en
Pages : 504
Book Description
Electromagnetics for Engineers Volume 1: Electrostatics and Magnetostatics
Author: Dean James Friesen
Publisher: Artech House
ISBN: 1685690068
Category : Science
Languages : en
Pages : 249
Book Description
Electromagnetism for Engineers, VOL. I: Electrostatics is a comprehensive introduction to the fundamental principles of electromagnetism, making it an indispensable source for a wide range of readers. This volume covers the essential concepts of electrostatics, including Coulomb's law, electric fields, Gauss's law, and vector mathematics, which forms a foundational tool throughout the book. What sets this book apart are the numerous illustrations and diagrams that visually elucidate complex topics, ensuring a clear and thorough understanding. To reinforce learning, the text includes problem and solution sets, giving readers an opportunity to apply the concepts they have acquired. This book is particularly valuable for college graduates and engineering students who are beginning their journey into the realm of electromagnetism. It is also an excellent reference for practicing engineers seeking to refresh their knowledge of the basic principles of electromagnetism. With a focus on both theory and practical application, this volume provides a strong foundation for readers at various stages of their engineering education and career.
Publisher: Artech House
ISBN: 1685690068
Category : Science
Languages : en
Pages : 249
Book Description
Electromagnetism for Engineers, VOL. I: Electrostatics is a comprehensive introduction to the fundamental principles of electromagnetism, making it an indispensable source for a wide range of readers. This volume covers the essential concepts of electrostatics, including Coulomb's law, electric fields, Gauss's law, and vector mathematics, which forms a foundational tool throughout the book. What sets this book apart are the numerous illustrations and diagrams that visually elucidate complex topics, ensuring a clear and thorough understanding. To reinforce learning, the text includes problem and solution sets, giving readers an opportunity to apply the concepts they have acquired. This book is particularly valuable for college graduates and engineering students who are beginning their journey into the realm of electromagnetism. It is also an excellent reference for practicing engineers seeking to refresh their knowledge of the basic principles of electromagnetism. With a focus on both theory and practical application, this volume provides a strong foundation for readers at various stages of their engineering education and career.
Principles of Materials Characterization and Metrology
Author: Kannan M. Krishnan
Publisher: Oxford University Press
ISBN: 0192566083
Category : Science
Languages : en
Pages : 550
Book Description
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
Publisher: Oxford University Press
ISBN: 0192566083
Category : Science
Languages : en
Pages : 550
Book Description
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
Ultrasonic Materials Characterization
Author: Harold Berger
Publisher:
ISBN:
Category : Ultrasonic testing
Languages : en
Pages : 680
Book Description
Publisher:
ISBN:
Category : Ultrasonic testing
Languages : en
Pages : 680
Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 322
Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 322
Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Microwave Materials Characterization
Author: Sandra Costanzo
Publisher: BoD – Books on Demand
ISBN: 9535108484
Category : Technology & Engineering
Languages : en
Pages : 174
Book Description
Microwave Materials Characterization is an edited book discussing recent researches on basic and innovative measurement techniques for the characterization of materials at microwave frequencies, in terms of quantitative determination of their electromagnetic parameters, namely the complex permittivity and permeability. It is divided into two parts: Part 1, including original contributions on advanced techniques for the characterization of dielectric materials, and Part 2, devoted to the microwave characterization of biological tissues.
Publisher: BoD – Books on Demand
ISBN: 9535108484
Category : Technology & Engineering
Languages : en
Pages : 174
Book Description
Microwave Materials Characterization is an edited book discussing recent researches on basic and innovative measurement techniques for the characterization of materials at microwave frequencies, in terms of quantitative determination of their electromagnetic parameters, namely the complex permittivity and permeability. It is divided into two parts: Part 1, including original contributions on advanced techniques for the characterization of dielectric materials, and Part 2, devoted to the microwave characterization of biological tissues.
Magnetic Measurement Techniques for Materials Characterization
Author: Victorino Franco
Publisher: Springer Nature
ISBN: 3030704432
Category : Technology & Engineering
Languages : en
Pages : 814
Book Description
This book discusses the most commonly used techniques for characterizing magnetic material properties and their applications. It provides a comprehensive and easily digestible collection and review of magnetic measurement techniques. It also examines the underlying operating principles and techniques of magnetic measurements, and presents current examples where such measurements and properties are relevant. Given the pervasive nature of magnetic materials in everyday life, this book is a vital resource for both professionals and students wishing to deepen their understanding of the subject.
Publisher: Springer Nature
ISBN: 3030704432
Category : Technology & Engineering
Languages : en
Pages : 814
Book Description
This book discusses the most commonly used techniques for characterizing magnetic material properties and their applications. It provides a comprehensive and easily digestible collection and review of magnetic measurement techniques. It also examines the underlying operating principles and techniques of magnetic measurements, and presents current examples where such measurements and properties are relevant. Given the pervasive nature of magnetic materials in everyday life, this book is a vital resource for both professionals and students wishing to deepen their understanding of the subject.
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1050
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1050
Book Description