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Author: Milton Ohring
Publisher: Academic Press
ISBN: 0080575528
Category : Technology & Engineering
Languages : en
Pages : 759
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Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author: Milton Ohring
Publisher: Academic Press
ISBN: 0080575528
Category : Technology & Engineering
Languages : en
Pages : 759
Get Book Here
Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 228
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Book Description
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 828
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Book Description
Author: John Moalli
Publisher: William Andrew
ISBN: 081551865X
Category : Technology & Engineering
Languages : en
Pages : 351
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Book Description
This book contains analysis of reasons that cause products to fail. General methods of product failure evaluation give powerful tools in product improvement. Such methods, discussed in the book, include practical risk analysis, failure mode and effect analysis, preliminary hazard analysis, progressive failure analysis, fault tree analysis, mean time between failures, Wohler curves, finite element analysis, cohesive zone model, crack propagation kinetics, time-temperature collectives, quantitative characterization of fatigue damage, and fracture maps. Methods of failure analysis are critical to for material improvement and they are broadly discussed in this book. Fractography of plastics is relatively a new field which has many commonalities with fractography of metals. Here various aspects of fractography of plastics and metals are compared and contrasted. Fractography application in studies of static and cycling loading of ABS is also discussed. Other methods include SEM, SAXS, FTIR, DSC, DMA, GC/MS, optical microscopy, fatigue behavior, multiaxial stress, residual stress analysis, punch resistance, creep-rupture, impact, oxidative induction time, craze testing, defect analysis, fracture toughness, activation energy of degradation.Many references are given in this book to real products and real cases of their failure. The products discussed include office equipment, automotive compressed fuel gas system, pipes, polymer blends, blow molded parts, layered, cross-ply and continuous fiber composites, printed circuits, electronic packages, hip implants, blown and multilayered films, construction materials, component housings, brake cups, composite pressure vessels, swamp coolers, electrical cables, plumbing fittings, medical devices, medical packaging, strapping tapes, balloons, marine coatings, thermal switches, pressure relief membranes, pharmaceutical products, window profiles, and bone cements.
Author: J. M. Blocher
Publisher:
ISBN:
Category : Chemical vapor deposition
Languages : en
Pages : 844
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Book Description
Author:
Publisher: ASM International
ISBN: 9780871702852
Category : Technology & Engineering
Languages : en
Pages : 1234
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Book Description
Volume 1: Packaging is an authoritative reference source of practical information for the design or process engineer who must make informed day-to-day decisions about the materials and processes of microelectronic packaging. Its 117 articles offer the collective knowledge, wisdom, and judgement of 407 microelectronics packaging experts-authors, co-authors, and reviewers-representing 192 companies, universities, laboratories, and other organizations. This is the inaugural volume of ASMAs all-new ElectronicMaterials Handbook series, designed to be the Metals Handbook of electronics technology. In over 65 years of publishing the Metals Handbook, ASM has developed a unique editorial method of compiling large technical reference books. ASMAs access to leading materials technology experts enables to organize these books on an industry consensus basis. Behind every article. Is an author who is a top expert in its specific subject area. This multi-author approach ensures the best, most timely information throughout. Individually selected panels of 5 and 6 peers review each article for technical accuracy, generic point of view, and completeness.Volumes in the Electronic Materials Handbook series are multidisciplinary, to reflect industry practice applied in integrating multiple technology disciplines necessary to any program in advanced electronics. Volume 1: Packaging focusing on the middle level of the electronics technology size spectrum, offers the greatest practical value to the largest and broadest group of users. Future volumes in the series will address topics on larger (integrated electronic assemblies) and smaller (semiconductor materials and devices) size levels.
Author:
Publisher:
ISBN:
Category : Computer networks
Languages : en
Pages : 32
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Book Description
High performance computing (HPC) has historically played a major role in the ability of the United States to develop and deploy superior weapons, warfighting capabilities, and mission support systems. Under the auspices of the Director, Defense Research and Engineering (DDR & E), the Department of Defense (DoD) High Performance Computing Modernization Program (HPCMP) is the focused modernization effort within the DoD to acquire, manage, and sustain modern HPC resources in support of defense science and technology, and developmental test and evaluation. The HPCMP is rapidly evolving past its initial program development and procurement start up phase and is increasing focus on application of HPC technology and resources to priority defense requirements. This plan describes some of the accomplishments achieved by the program in Fiscal Year (FY) 1997 and outlines the major strategies and milestones we expect to achieve over the next two years. The overriding goal of the program is to exploit HPC technology for military advantage across battlespace. The strategy to achieve this goal is to acquire and sustain world class high performance computing and network capabilities for use by defense scientists and engineers.
Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1252
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 402
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Book Description
PCMag.com is a leading authority on technology, delivering Labs-based, independent reviews of the latest products and services. Our expert industry analysis and practical solutions help you make better buying decisions and get more from technology.
Author: United States. Superintendent of Documents
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1116
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Book Description
February issue includes Appendix entitled Directory of United States Government periodicals and subscription publications; September issue includes List of depository libraries; June and December issues include semiannual index
