Efficient Methods for Partial Scan Sequential Circuit Design and Test PDF Download
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Author: Chia-Lin Chan
Publisher:
ISBN:
Category : Digital electronics
Languages : en
Pages : 92
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Book Description
Author: Chia-Lin Chan
Publisher:
ISBN:
Category : Digital electronics
Languages : en
Pages : 92
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Book Description
Author: Dongho Lee
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 248
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Book Description
Author: Soo Y. Lee
Publisher:
ISBN:
Category :
Languages : en
Pages : 252
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Book Description
Author: Kee Sup Kim
Publisher:
ISBN:
Category :
Languages : en
Pages : 386
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Book Description
Author:
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 504
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Book Description
Author: Francis C. Wong
Publisher: Elsevier
ISBN: 0080504345
Category : Technology & Engineering
Languages : en
Pages : 248
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Book Description
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Author: Chryssa Dislis
Publisher: Prentice Hall
ISBN: 9780131089945
Category : Technology & Engineering
Languages : en
Pages : 224
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Book Description
Providing an examination of the economics of design and test of electronics circuits and systems, this book describes the overall economic effects of design and test decisions facing electronic designers, engineering managers and test engineers at device, board, system and field test stages, and includes issues such as time-to-market and product liability. It also discusses the issues and parameters that can cause variations in test-related costs, and covers cost model creation, and the use/usability of cost models for making design and test decisions.
Author: Naresh Maheshwari
Publisher: Springer Science & Business Media
ISBN: 1461556376
Category : Technology & Engineering
Languages : en
Pages : 202
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Book Description
Recent years have seen rapid strides in the level of sophistication of VLSI circuits. On the performance front, there is a vital need for techniques to design fast, low-power chips with minimum area for increasingly complex systems, while on the economic side there is the vastly increased pressure of time-to-market. These pressures have made the use of CAD tools mandatory in designing complex systems. Timing Analysis and Optimization of Sequential Circuits describes CAD algorithms for analyzing and optimizing the timing behavior of sequential circuits with special reference to performance parameters such as power and area. A unified approach to performance analysis and optimization of sequential circuits is presented. The state of the art in timing analysis and optimization techniques is described for circuits using edge-triggered or level-sensitive memory elements. Specific emphasis is placed on two methods that are true sequential timing optimizations techniques: retiming and clock skew optimization. Timing Analysis and Optimization of Sequential Circuits covers the following topics: Algorithms for sequential timing analysis Fast algorithms for clock skew optimization and their applications Efficient techniques for retiming large sequential circuits Coupling sequential and combinational optimizations. Timing Analysis and Optimization of Sequential Circuits is written for graduate students, researchers and professionals in the area of CAD for VLSI and VLSI circuit design.
Author:
Publisher: IEEE Computer Society Press
ISBN:
Category : Computers
Languages : en
Pages : 464
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Book Description
Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si
Author: Xinghao Chen
Publisher: Springer Science & Business Media
ISBN: 1461313295
Category : Technology & Engineering
Languages : en
Pages : 151
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Book Description
Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and many important optimization problems. In many applications, the classic branch-and-bound search methods perform duplications of computations, or rely on the search decision trees which keep track of the branch-and-bound search processes. In CAD and many other technical fields, the computational cost of constructing branch-and-bound search decision trees in solving large scale problems is prohibitive and duplications of computations are intolerable. Efficient branch-and-bound methods are needed to deal with today's computational challenges. Efficient branch-and-bound methods must not duplicate computations. Efficient Branch and Bound Search with Application to Computer-Aided Design describes an efficient branch-and-bound method for logic justification, which is fundamental to automatic test pattern generation (ATPG), redundancy identification, logic synthesis, minimization, verification, and other problems in CAD. The method is called justification equivalence, based on the observation that justification processes may share identical subsequent search decision sequences. With justification equivalence, duplication of computations is avoided in the dynamic branch-and-bound search process without using search decision trees. Efficient Branch and Bound Search with Application to Computer-Aided Design consists of two parts. The first part, containing the first three chapters, provides the theoretical work. The second part deals with applications, particularly ATPG for sequential circuits. This book is particularly useful to readers who are interested in the design and test of digital circuits.
