Dynamic Experiments in the Electron Microscope PDF Download
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Author: E. P. Butler
Publisher: North-Holland
ISBN:
Category : Science
Languages : en
Pages : 484
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Book Description
Author: E. P. Butler
Publisher: North-Holland
ISBN:
Category : Science
Languages : en
Pages : 484
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Book Description
Author: R.F. Egerton
Publisher: Springer Science & Business Media
ISBN: 1475750994
Category : Science
Languages : en
Pages : 491
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Book Description
to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
Author: Audry M. Glauert
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 484
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Book Description
Author: Frances M. Ross
Publisher: Cambridge University Press
ISBN: 1107116570
Category : Science
Languages : en
Pages : 529
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Book Description
2.6.2 Electrodes for Electrochemistry
Author: Peter W. Hawkes
Publisher: Springer Nature
ISBN: 3030000699
Category : Technology & Engineering
Languages : en
Pages : 1561
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Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Author: Renu Sharma
Publisher: John Wiley & Sons
ISBN: 3527834842
Category : Science
Languages : en
Pages : 389
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Book Description
In-Situ Transmission Electron Microscopy Experiments Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals. In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements, incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research. In-Situ Transmission Electron Microscopy Experiments readers will also find: Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more Discussion of future challenges and opportunities facing this field of research In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.
Author: Florian Banhart
Publisher: World Scientific
ISBN: 9812797335
Category : Science
Languages : en
Pages : 318
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Book Description
In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
Author: Masashi Arita
Publisher: BoD – Books on Demand
ISBN: 1838818820
Category : Science
Languages : en
Pages : 102
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Book Description
TEM and SEM have contributed greatly to the progress of various research fields, which has been accelerated in the last few decades by highly functional electron microscopes and microscopy. In this tide of microscopy, various microscopic methods have been developed to make clear many unsolved problems, e.g. pulse beam TEM, environmental microscopy, correlative microscopy, etc. In this book, a number of reviews have been collected concerning these subjects. We think that the content in each chapter is impressive, and we hope this book will contribute to future advances in electron microscopy, materials science, and biomedicine.
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 800
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Book Description
Author: Thomas Willum Hansen
Publisher: Springer
ISBN: 3319229885
Category : Technology & Engineering
Languages : en
Pages : 334
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Book Description
This book illustrates the practical workings of environmental transmission electron microscopy (ETEM) from history and instrument design through to solving practical problems. Aspects of instrument design, performance, and operating procedures are covered, together with common problems and pitfalls of the technique. Not only will a properly operated instrument and a carefully set up experiment provide new insight into your specimen, but the ability to observe the specimen in its natural habitat will be essential to meeting specific design criteria for the development of the next generation of materials. Over the past five decades, transmission electron microscopy (TEM) under environmental conditions relevant to a particular sample has been of increasing interest. Symposia dealing with the topic are now among the best attended at international microscopy conferences. Since typical operating modes for the ETEM require the sample be subjected to a harsh environment consisting of corrosive gases and high temperatures, the challenges of adapting and operating the instrument for observation under dynamic operating conditions are numerous. However, careful consideration of the interaction of the electrons with the gases and sample, as well as the gases with the microscope components, can lead to highly rewarding results. In Controlled Atmosphere Transmission Electron Microscopy, leading experts help you to perform successful experiments using the ETEM, and to interpret and understand the results.
