Diffraction Methods in Materials Science PDF Download
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Author: Jindřich Hašek
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 490
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Book Description
Author: Jindřich Hašek
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 490
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Book Description
![Diffraction Methods in Materials Science. [With Illustrations.]. PDF](https://books.google.com/books/content/images/frontcover/mllRMwEACAAJ?fife=w80-h100)
Author: Jerome Bernard COHEN (Professor of Materials Science, Northwestern University.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 357
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Book Description
Author: Severin Amelinckx
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 422
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Book Description
Author: Jerome Bernard Cohen
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 376
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Book Description
Author: Aaron D. Krawitz
Publisher: Wiley-Interscience
ISBN: 9780471247241
Category : Science
Languages : en
Pages : 0
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Book Description
Fundamentals and practical applications of diffraction for researchers, engineers, and students Materials science relies heavily on diffraction for the analysis of materials. Introduction to Diffraction in Materials Science and Engineering is a survey of the practical aspects of this valuable tool. Though it contains basic discussion of the theory and physics of diffraction, this book emphasizes understanding and the practical application of diffraction in materials science-making it a valuable text and resource for students, professionals, and researchers. Designed as a teaching and self-study text, this resource begins with a treatment of the fundamentals of crystallography and crystal structure and its importance in diffraction before moving on to cover important aspects of diffraction applications. Numerous examples and problems at the end of each chapter, including critical thinking questions, make this an excellent tool for learning and understanding. The book includes treatments of: * Basics of crystallography * Geometrical representation of crystals and reciprocal space * X-rays and neutrons * Structure factors and intensity * Powder diffraction * Qualitative (Powder Diffraction File) and quantitative phase analysis * Use of the International Tables for more complex structures and the Reitveld method * Residual stress * Introductions to texture, small diffracting units, and long-range order Aaron Krawitz provides both a practical introduction to diffraction that suits the needs of students and a resource for professionals already at work in materials science or engineering who want to utilize the power of diffraction in the study of materials.
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author: E. J. Mittemeijer
Publisher: John Wiley & Sons
ISBN: 3527649905
Category : Science
Languages : en
Pages : 563
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Book Description
The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).
Author: Herbert Herman
Publisher: Elsevier
ISBN: 1483218260
Category : Technology & Engineering
Languages : en
Pages : 277
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Book Description
Treatise on Materials Science and Technology, Volume 19: Experimental Methods, Part A covers the methods of materials experimentation and testing. The book discusses the measurement of residual stresses by x-ray diffraction techniques; the investigation of composition variations by diffraction; and the use of Mössbauer spectroscopy in materials science. The text also describes photoluminescence techniques for studies of composition and defects in semiconductors; and materials production by high-rate sputter deposition. Graduate students in the field of materials science, laboratory scientists, and materials engineers will find the book invaluable.
Author: Leroy Elbert Alexander
Publisher: Krieger Publishing Company
ISBN:
Category : Science
Languages : en
Pages : 614
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Book Description
Author: Myeongkyu Lee
Publisher: CRC Press
ISBN: 1315361973
Category : Science
Languages : en
Pages : 302
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Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
