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Author: Ji-Xin Cheng
Publisher: Elsevier
ISBN: 0323903371
Category : Science
Languages : en
Pages : 612
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Book Description
Stimulated Raman Scattering Microscopy: Techniques and Applications describes innovations in instrumentation, data science, chemical probe development, and various applications enabled by a state-of-the-art stimulated Raman scattering (SRS) microscope. Beginning by introducing the history of SRS, this book is composed of seven parts in depth including instrumentation strategies that have pushed the physical limits of SRS microscopy, vibrational probes (which increased the SRS imaging functionality), data science methods, and recent efforts in miniaturization. This rapidly growing field needs a comprehensive resource that brings together the current knowledge on the topic, and this book does just that. Researchers who need to know the requirements for all aspects of the instrumentation as well as the requirements of different imaging applications (such as different types of biological tissue) will benefit enormously from the examples of successful demonstrations of SRS imaging in the book. Led by Editor-in-Chief Ji-Xin Cheng, a pioneer in coherent Raman scattering microscopy, the editorial team has brought together various experts on each aspect of SRS imaging from around the world to provide an authoritative guide to this increasingly important imaging technique. This book is a comprehensive reference for researchers, faculty, postdoctoral researchers, and engineers. - Includes every aspect from theoretic reviews of SRS spectroscopy to innovations in instrumentation and current applications of SRS microscopy - Provides copious visual elements that illustrate key information, such as SRS images of various biological samples and instrument diagrams and schematics - Edited by leading experts of SRS microscopy, with each chapter written by experts in their given topics
Author: Ji-Xin Cheng
Publisher: Elsevier
ISBN: 0323903371
Category : Science
Languages : en
Pages : 612
Get Book Here
Book Description
Stimulated Raman Scattering Microscopy: Techniques and Applications describes innovations in instrumentation, data science, chemical probe development, and various applications enabled by a state-of-the-art stimulated Raman scattering (SRS) microscope. Beginning by introducing the history of SRS, this book is composed of seven parts in depth including instrumentation strategies that have pushed the physical limits of SRS microscopy, vibrational probes (which increased the SRS imaging functionality), data science methods, and recent efforts in miniaturization. This rapidly growing field needs a comprehensive resource that brings together the current knowledge on the topic, and this book does just that. Researchers who need to know the requirements for all aspects of the instrumentation as well as the requirements of different imaging applications (such as different types of biological tissue) will benefit enormously from the examples of successful demonstrations of SRS imaging in the book. Led by Editor-in-Chief Ji-Xin Cheng, a pioneer in coherent Raman scattering microscopy, the editorial team has brought together various experts on each aspect of SRS imaging from around the world to provide an authoritative guide to this increasingly important imaging technique. This book is a comprehensive reference for researchers, faculty, postdoctoral researchers, and engineers. - Includes every aspect from theoretic reviews of SRS spectroscopy to innovations in instrumentation and current applications of SRS microscopy - Provides copious visual elements that illustrate key information, such as SRS images of various biological samples and instrument diagrams and schematics - Edited by leading experts of SRS microscopy, with each chapter written by experts in their given topics
Author: Jürgen Thieme
Publisher: Springer Science & Business Media
ISBN: 3642721060
Category : Science
Languages : en
Pages : 382
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Book Description
This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci plinary and cooperative character of this field and the growing demand for micro scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface.
Author: Chris Jacobsen
Publisher: Cambridge University Press
ISBN: 1107076579
Category : Medical
Languages : en
Pages : 594
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Book Description
A complete introduction to x-ray microscopy, covering optics, 3D and chemical imaging, lensless imaging, radiation damage, and applications.
Author: Freddy Adams
Publisher: Elsevier
ISBN: 0444634509
Category : Science
Languages : en
Pages : 493
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Book Description
Chemical Imaging Analysis covers the advancements made over the last 50 years in chemical imaging analysis, including different analytical techniques and the ways they were developed and refined to link the composition and structure of manmade and natural materials at the nano/micro scale to the functional behavior at the macroscopic scale. In a development process that started in the early 1960s, a variety of specialized analytical techniques was developed – or adapted from existing techniques – and these techniques have matured into versatile and powerful tools for visualizing structural and compositional heterogeneity. This text explores that journey, providing a general overview of imaging techniques in diverse fields, including mass spectrometry, optical spectrometry including X-rays, electron microscopy, and beam techniques. - Provides comprehensive coverage of analytical techniques used in chemical imaging analysis - Explores a variety of specialized techniques - Provides a general overview of imaging techniques in diverse fields
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 322
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Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Author: Matthias Worgull
Publisher: Elsevier
ISBN: 0323984215
Category : Technology & Engineering
Languages : en
Pages : 640
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Book Description
The second edition of Hot Embossing: Theory of Microreplication will present the current state of the art in microreplication with a focus on hot embossing, nanoimprint, thermoforming, and roll-to-roll replication. Polymer processing, the theory of polymers and the processing of polymers are discussed in detail. Aspects of process simulation and the corresponding material models are also covered. The book contains in-depth analysis of processing processes and replication techniques including mold fabrication. Monitoring, data analysis and reliability of molded parts is also discussed. In the Second Edition new processes are included, including the process of micro- and nanothermoforming to generate 3D structures and the hot pulling processes to generate hierarchical structures with high aspect ratios. Based on hot pulling, "Nanofur for Oil-water-separation is a large-scale biomimetic application. Upscaling, especially the seamless roll-to-roll replication, is also explored. The book is designed to cover the entire workflow for a seamless lithographic sleeve.This new edition marks a substantial update of the previous edition, incorporating several new chapters. It is an important resource for materials scientists and engineers working in the areas of micro- and nanofabrication. - Comprehensively updated to include new techniques, processes, and variables that have come to prominence in recent years - Includes new chapters that address monitoring, properties of molded parts, 3D thermoforming, hot pulling, functional materials, smart surfaces, and upscaling by roll-2-roll - Discusses the entire microreplication process, from theory and processes to technology and mold to surface-oriented applications
Author: Earl J. Kirkland
Publisher: Springer Nature
ISBN: 3030332608
Category : Science
Languages : en
Pages : 357
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Book Description
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 704
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Book Description
Author: Benedikt Sebastian Günther
Publisher: Springer Nature
ISBN: 3031177428
Category : Science
Languages : en
Pages : 356
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Book Description
This thesis presents research on novel laboratory-scale synchrotron X-ray sources based on inverse Compton scattering and applications of their X-ray radiation using the Munich Compact Light Source (MuCLS) as an example. It provides an introduction to the theory of this laser-electron interaction, laser resonators and X-ray interactions with matter. On this basis, upgrades to the laser system including the development of a new laser optic, X-ray beam stabilisation and two techniques for fast X-ray energy switching of inverse Compton sources are presented. On the application side, the beamline, designed and developed for the inverse Compton X-ray source at the MuCLS, is described before various techniques and applications are demonstrated at this laboratory-scale synchrotron X-ray facility. Among them are K-edge subtraction imaging, X-ray phase contrast imaging and X-ray absorption spectroscopy. Additionally, a new X-ray microscopy technique, called full-field structured-illumination super-resolution X-ray transmission microscopy, is presented. Apart from research conducted at the MuCLS, this thesis contains an in-depth overview on the state of the art of the various types of inverse Compton X-ray sources that have been realised so far. Accordingly, this thesis may serve as a guide and reference work for researchers working with inverse Compton X-ray sources as well as future users of such devices.
Author: United States. Department of Energy. Office of Health and Environmental Research
Publisher:
ISBN:
Category : Atmospheric physics
Languages : en
Pages : 436
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Book Description
