Determination of the Optical Constants of Transparent Thin Films from Transmittance Measurements Alone PDF Download
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Author: Thomas L. Gougeon
Publisher:
ISBN:
Category : Thin films
Languages : en
Pages : 176
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Author: Thomas L. Gougeon
Publisher:
ISBN:
Category : Thin films
Languages : en
Pages : 176
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Author: K. F. Palmer
Publisher:
ISBN:
Category :
Languages : en
Pages : 60
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In this report, a new subtractive Kramers-Kronig computer program is described which can obtain accurate optical constants of a uniform thin film on a thick substrate using only the transmittance measurements of a single-film thickness. Preliminary results from existing data show that the optical properties of a dielectric film may depend, to a small degree, upon the thickness of the film. This effect seems to be more noticeable in films containing molecules, such as H2O and NH3, which readily form hydrogen bonds. Also described are two methods for extracting the optical constants of a dielectric thin film from measurements of the reflectance of a beam incident in a vacuum upon a film layer on a metal substrate. In one method, the dependence is observed of the reflectances of several thicknesses of the same film material upon its thickness. This method contains the assumption that the optical properties of a film material do not vary with changes in film thickness. The second method does not depend on this assumption. It uses the reflectance spectrum of a single-film thickness to compute the optical constants of the film from a dispersion relation.
Author:
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Category :
Languages : en
Pages : 5
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Author: O. S. Heavens
Publisher: Courier Corporation
ISBN: 0486669246
Category : Science
Languages : en
Pages : 276
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Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 figures. 19 tables. 1955 edition.
Author: Thompson Andrew McMath
Publisher:
ISBN:
Category : Thin films
Languages : en
Pages : 204
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Author: Max Spencer Oldham
Publisher:
ISBN:
Category :
Languages : en
Pages : 158
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This report describes a method for the determination of the optical constants of semitransparent films. A table expressing the optical constants in terms of reflectance, transmittance, and film thickness is presented. The report has been submitted to the Graduate Faculty of the Iowa State College of Agriculture and Mechanic Arts as a dissertation in partial fulfillment of the requirements for a degree of Doctor of Philosophy. Since the research work described was performed at the Naval Ordnance Laboratory, the dissertation is reproduced with minor changes as an official Laboratory report. (Author).
Author: Wayne J. Anderson
Publisher:
ISBN:
Category : Metallic films
Languages : en
Pages : 112
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Author:
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Category :
Languages : en
Pages : 11
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The investigation was concerned with the optical excitation of plasma radiation in a metal film and the detection of this radiation. The experiment was unsuccessful -- that is, with the available sources and detection equipment no radiation was observed in silver films of approximate thickness 300A, deposited on quartz and lithium fluoride substrates. While no radiation has as yet been detected, an indication of plasma oscillation has been observed in an absorption experiment. The absorption experiment made use of the Beckman DK-2A spectroreflectometer. The transmission of silver films of approximately 300A thickness was measured at several angles of incidence in the range 0 - 60 degrees, by inserting the samples on an improvised table just ahead of the integrating sphere. The effect is shown very well in the transmission curves and gives some confidence that with further improvements in the detecting system plasma emission might be seen.
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Category :
Languages : en
Pages :
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Author: E. M. Murt
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 226
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