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![Determination of the Optical Constants and Thickness of Amorphous V O Thin Films. [Authors] PDF](https://books.google.com/books/content/images/frontcover/tJvrsgEACAAJ?fife=w80-h100)
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Languages : en
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Category :
Languages : en
Pages : 5
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Author: O. S. Heavens
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Category : Electron optics
Languages : en
Pages : 284
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Category :
Languages : en
Pages :
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Author: Elio Passaglia
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Category : Ellipsometry
Languages : en
Pages : 366
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Author: Olaf Stenzel
Publisher: Springer
ISBN: 3319753258
Category : Science
Languages : en
Pages : 474
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This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Author: K. F. Palmer
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Category :
Languages : en
Pages : 60
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In this report, a new subtractive Kramers-Kronig computer program is described which can obtain accurate optical constants of a uniform thin film on a thick substrate using only the transmittance measurements of a single-film thickness. Preliminary results from existing data show that the optical properties of a dielectric film may depend, to a small degree, upon the thickness of the film. This effect seems to be more noticeable in films containing molecules, such as H2O and NH3, which readily form hydrogen bonds. Also described are two methods for extracting the optical constants of a dielectric thin film from measurements of the reflectance of a beam incident in a vacuum upon a film layer on a metal substrate. In one method, the dependence is observed of the reflectances of several thicknesses of the same film material upon its thickness. This method contains the assumption that the optical properties of a film material do not vary with changes in film thickness. The second method does not depend on this assumption. It uses the reflectance spectrum of a single-film thickness to compute the optical constants of the film from a dispersion relation.
Author: Ahmad Nurdin Mohd. Amin
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ISBN:
Category :
Languages : en
Pages : 59
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Category : Optical coatings
Languages : en
Pages : 328
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Author: K. Vedam
Publisher: Academic Press
ISBN: 1483288935
Category : Science
Languages : en
Pages : 345
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This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
